Eddy current testing method and eddy current testing apparatus
View Patent ↗It is an object of the present invention to provide an eddy current testing apparatus capable of accurately detecting any flaws occurring in a columnar or cylindrical subject to be tested regardless of their extending directions, with the use of the same probe coil. The eddy current testing apparatus 100 according to the present invention comprises a spinning plate 1 and a probe coil 2 disposed on the spinning plate 1 . The probe coil is a probe coil capable of obtaining a differential output about a scanning direction of a detection signal which corresponds to a detected eddy current induced in the subject to be tested. The spinning plate is disposed in such a position that a spinning center RC of the spinning plate faces with an axial center PC of the subject to be tested. A distance R between the spinning center of the spinning plate and a center of the probe coil is set so that a difference between a maximum amplitude of a differential output at an axially extending artificial flaw provided in the subject to be tested and a maximum amplitude of a differential output at a circumferentially extending artificial flaw provided in the subject to be tested falls within a predetermined range.
1. An eddy current testing method for detecting a flaw occurring in a columnar or cylindrical subject to be tested by conducting spinning scanning of a probe coil disposed to be opposite to the subject to be tested, relative to the subject to be tested, comprising the steps of:
using a probe coil capable of obtaining a differential output about a scanning direction of a detection signal which corresponds to a detected eddy current induced in the subject to be tested as the probe coil;
positioning the probe coil so that a straight line passing a spinning center of the probe coil crosses with an axial center of the subject to be tested at right angles;
preparing a test piece made of the same material as that of the subject to be tested, which is provided with an axially extending artificial flaw and a circumferentially extending artificial flaw whose depth is equivalent to depth of the axially extending artificial flaw, and disposing the test piece opposite to the probe coil;
setting a distance between the spinning center of the probe coil and a center of the probe coil, which is located differently from the spinning center of the probe coil, so that a difference between a maximum amplitude of a differential output at the axially extending artificial flaw provided in the test piece and a maximum amplitude of a differential output at the circumferentially extending artificial flaw provided in the test piece falls within a predetermined range; and
conducting spinning scanning of the probe coil relative to the subject to be tested which is not provided with an artificial flaw at the set distance to detect a flaw occurring in the subject to be tested.
2. An eddy current testing apparatus having a spinning plate and a probe coil disposed on the spinning plate and located differently from a spinning center of the spinning plate, for detecting a flaw occurring in a columnar or cylindrical subject to be tested by spinning the spinning plate disposed to be opposite to the subject to be tested, relative to the subject to be tested, thereby conducing spinning scanning of the probe coil, wherein
the probe coil is a probe coil capable of obtaining a differential output about a scanning direction of a detection signal which corresponds to a detected eddy current induced in the subject to be tested,
the spinning plate is positioned so that a straight line passing the spinning center of the spinning plate crosses with an axial center of the subject to be tested at right angles,
relative to a test piece made of the same material as that of the subject to be tested, which is provided with an axially extending artificial flaw and a circumferentially extending artificial flaw whose depth is equivalent to depth of the axially extending artificial flaw, a distance between the spinning center of the spinning plate and a center of the probe coil is set so that a difference between a maximum amplitude of a differential output at the axially extending artificial flaw provided in the test piece and a maximum amplitude of a differential output at the circumferentially extending artificial flaw provided in the test piece falls within a predetermined range, and
spinning scanning of the probe coil is conducted relative to the subject to be tested which is not provided with an artificial flaw by spinning the spinning plate to detect a flaw occurring in the subject to be tested.