IP Library Granted Patent US 8,245,562
Granted Patent B2
US 8,245,562 · App. 12/533,644 · Granted Aug 21, 2012

Circuit and method for pressure sensor testing

Assignee: Freescale Semiconductor, Inc.
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Quick Facts
Patent No.
US 8,245,562
App. No.
12/533,644
Granted
Aug 21, 2012
Kind
B2
Abstract

A method for testing a pressure sensor having a first node and a second node includes coupling the first node to a first input of an amplifier and coupling a reference voltage to a second input of the amplifier; applying a transfer function to an output of the amplifier to provide a first output voltage that is based on a difference in voltage between the first node and the reference voltage; coupling the reference voltage to the first input and coupling the second node to the second input; obtaining a second output voltage at the output of the amplifier; and determining, based on the first and second output voltages, whether the pressure sensor passed or failed. During normal operation, the first node is coupled to the first input and the second node to the second input, and a second transfer function is applied to the output of the amplifier.

Claims (40)

1. A method for testing a pressure sensor having a first node and a second node, the method comprising:

coupling the first node to a first input of an amplifier and coupling a reference voltage to a second input of the amplifier;

applying a transfer function to an output of the amplifier to provide a first output voltage that is based on a difference in voltage between the first node and the reference voltage;

coupling the reference voltage to the first input of the amplifier and coupling the second node to the second input of the amplifier;

obtaining a second output voltage at the output of the amplifier; and

determining, based on the first output voltage and the second output voltage, whether the pressure sensor passed or failed.

2. The method of claim 1 , wherein the step of determining comprises:

comparing the first output voltage with the second output voltage to determine whether the pressure sensor passed or failed.

3. The method of claim 1 , wherein the step of determining comprises:

determining an error between the first output voltage and the second output voltage; and

determining whether the pressure sensor passed or failed based on the error.

4. The method of claim 1 , wherein, during normal operation, the method further comprises:

coupling the first node to a first input of an amplifier and the second node to a second input of the amplifier; and

applying a second transfer function to the output of the amplifier to provide a third output voltage that is based on a difference in voltage between the first node and the second node of the pressure sensor.

5. The method of claim 1 , further comprising:

characterizing the first node of the pressure sensor by coupling the first node to the first input of an amplifier and coupling the reference voltage to a second input of the amplifier and obtaining a first plurality of data points under different conditions;

characterizing the second node of the pressure sensor by coupling the reference voltage to the first input of the amplifier and coupling the second node to the second input of the amplifier and obtaining a second plurality of data points under different conditions;

determining the transfer function based on the first and second plurality of data points; and

storing the transfer function.

6. The method of claim 1 , wherein the steps of coupling the first node, applying, coupling the reference voltage, obtaining, and determining are performed in response to a signal which indicates entry into a test mode of the pressure sensor.

7. A method for testing a pressure sensor having a first node and a second node, the method comprising:

during normal operation, coupling the first node to a first input of an amplifier, the second node to a second input of the amplifier and applying a first transfer function to an output of the amplifier to provide a first output voltage that is based on a difference in voltage between the first node and the second node of the pressure sensor; and

during a test mode:

coupling the first node to the first input of the amplifier and coupling a reference voltage to the second input of the amplifier;

applying a second transfer function to the output of the amplifier to provide a second output voltage that is based on a difference in voltage between the first node and the reference voltage;

coupling the reference voltage to the first input of the amplifier and coupling the second node to the second input of the amplifier;

obtaining a third output voltage at the output of the amplifier;

determining an error between the second output voltage and the third output voltage; and

determining whether the pressure sensor passed or failed based on the error.

8. The method of claim 7 , further comprising:

receiving a test mode indicator to indicate when to enter the test mode.

9. The method of claim 7 , further comprising:

characterizing the first node of the pressure sensor by coupling the first node to the first input of an amplifier and coupling the reference voltage to a second input of the amplifier and obtaining a first plurality of data points under different conditions;

characterizing the second node of the pressure sensor by coupling the reference voltage to the first input of the amplifier and coupling the second node to the second input of the amplifier and obtaining a second plurality of data points under different conditions;

determining the second transfer function based on the first and second plurality of data points; and

storing the second transfer function.

10. The method of claim 9 , further comprising:

characterizing the pressure sensor by coupling the first node to the first input of an amplifier and coupling the second node to the second input of the amplifier and obtaining a third plurality of data points under different conditions;

determining the first transfer function based on the third plurality of data points; and

storing the first transfer function.

Assignments (19)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 12, 2026
From: NXP USA, INC.
To: STMICROELECTRONICS INTERNATIONAL N.V.
Reel/Frame 075045/0066 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE PREVIOUSLY RECORDED AT REEL: 040652 FRAME: 0241. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Jan 5, 2017
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 041260/0850 →
MERGER Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 040652/0241 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037518/0292 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037486/0517 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037354/0854 →
SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031591/0266 →
SECURITY AGREEMENT Recorded Jun 18, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 030633/0424 →
SECURITY AGREEMENT Recorded Feb 3, 2010
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A.
Reel/Frame 023882/0834 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 31, 2009
From: DAWSON, CHAD S.
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 023038/0404 →
Continuity (1)
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