IP Library Patent Application 12535055
Patent Application
App. No. 12/535,055

XY STAGE APPARATUS

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Quick Facts
Patent No.
US None
App. No.
12/535,055
Abstract

An XY stage apparatus capable of reducing a measurement error due to air fluctuations is provided. The XY stage apparatus includes a stage that moves in the XY directions, a laser interferometer to measure a position of the stage, and a measuring optical path barrel mechanism having a fixed barrel that covers at least a portion of a measuring optical path between the stage and the laser interferometer, is provided on a side of the laser interferometer of the measuring optical path, and is fixed to the laser interferometer and a movable barrel that covers at least a potion of the measuring optical path, is provided on the side of the stage of the measuring optical path, and moves together with movement of the stage, wherein an end of one of the fixed barrel and the movable barrel is inserted into that of the other.

Claims (28)

1 . An XY stage apparatus, comprising:

a stage that moves in XY directions;

a laser interferometer configured to measure a position of the stage; and

a measuring optical path barrel mechanism having a fixed barrel that covers at least a portion of a measuring optical path between the stage and the laser interferometer, is provided on a side of the laser interferometer of the measuring optical path, and is fixed to the laser interferometer and a movable barrel that covers at least a potion of the measuring optical path, is provided on the side of the stage of the measuring optical path, and moves together with movement of the stage, wherein

an end of one of the fixed barrel and the movable barrel is inserted into that of the other.

2 . The apparatus according to claim 1 , wherein the end of the one and that of the other are mutually non-contact for insertion.

3 . The apparatus according to claim 1 , wherein substantially all areas of the measuring optical path are covered with the fixed barrel and the movable barrel.

4 . The apparatus according to claim 2 , wherein substantially all areas of the measuring optical path are covered with the fixed barrel and the movable barrel.

5 . The apparatus according to claim 1 , wherein the measuring optical path barrel mechanism, comprising:

a first slider mechanism allowing movement of the stage in a direction perpendicular to the measuring optical path; and

a second slider mechanism allowing movement of the stage in the direction parallel to the measuring optical path, wherein

the movable barrel is held by both the first slider mechanism and the second slider mechanism.

6 . The apparatus according to claim 2 , wherein the measuring optical path barrel mechanism, comprising:

a first slider mechanism allowing movement of the stage in a direction perpendicular to the measuring optical path; and

a second slider mechanism allowing movement of the stage in the direction parallel to the measuring optical path, wherein

the movable barrel is held by both the first slider mechanism and the second slider mechanism.

7 . The apparatus according to claim 3 , wherein the measuring optical path barrel mechanism, comprising:

a first slider mechanism allowing movement of the stage in a direction perpendicular to the measuring optical path; and

a second slider mechanism allowing movement of the stage in the direction parallel to the measuring optical path, wherein

the movable barrel is held by both the first slider mechanism and the second slider mechanism.

8 . The apparatus according to claim 4 , wherein the measuring optical path barrel mechanism, comprising:

a first slider mechanism allowing movement of the stage in a direction perpendicular to the measuring optical path; and

a second slider mechanism allowing movement of the stage in the direction parallel to the measuring optical path, wherein

the movable barrel is held by both the first slider mechanism and the second slider mechanism.

9 . The apparatus according to claim 5 , wherein the stage has a stack structure of a first stage that moves in the direction perpendicular to the measuring optical path and a second stage that moves in the direction parallel to the measuring optical path and

the first slider mechanism is fixed to the second stage and the movable barrel integrally moves with the second stage in the direction parallel to the measuring optical path.

10 . The apparatus according to claim 8 , wherein the stage has a stack structure of a first stage that moves in the direction perpendicular to the measuring optical path and a second stage that moves in the direction parallel to the measuring optical path and

the first slider mechanism is fixed to the second stage and the movable barrel integrally moves with the second stage in the direction parallel to the measuring optical path.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 20, 2010
From: ADVANCED MASK INSPECTION TECHNOLOGY INC.
To: KABUSHIKI KAISHA TOSHIBA; NEC CORPORATION
Reel/Frame 025008/0164 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 5, 2009
From: KOBAYASHI, NOBORU; KOGURE, YOSHITAKA; TAKAHARA, KENICHI; KIKUIRI, NOBUTAKA
To: ADVANCED MASK INSPECTION TECHNOLOGY, INC.
Reel/Frame 023052/0828 →