Semiconductor memory device
A memory may includes: word lines; bit lines; memory array blocks including memory cells, each memory array block being a unit of a data read operation or a data write operation; a row decoder configured to selectively drive the word lines; sense amplifiers configured to detect data; and an access counter provided for each memory cell block, the access counter counting the number of times of accessing the memory array blocks in order to read data or write data, and activating a refresh request signal when the number of times of access reaches a predetermined number of times, wherein during an activation period of the refresh request signal of the access counter, the row decoder periodically and sequentially activates the word lines of the memory array blocks corresponding to the access counter, and the sense amplifier performs a refresh operation of the memory cells connected to the activated word lines.
1. A semiconductor memory device comprising:
a plurality of word lines;
a plurality of bit lines;
memory array blocks including memory cells provided corresponding to intersections between the word lines and the bit lines, each memory array block being a unit of a data read operation or a data write operation;
a row decoder configured to selectively drive the word lines;
sense amplifiers configured to detect data from the memory cells or to write data into the memory cells via the bit lines; and
an access counter provided for each memory cell block, the access counter being configured to count the number of times of accessing the memory array blocks in order to read data or write data, and being configured to activate a refresh request signal when the number of times of access reaches a predetermined number of times, wherein
during an activation period of the refresh request signal of the access counter, the row decoder periodically and sequentially activates the word lines of the memory array blocks corresponding to the access counter, and the sense amplifier performs a refresh operation of recovering data from degraded data of the memory cells connected to the activated word lines.
2. The device of claim 1 , wherein the number of times of accessing the memory array blocks is the number of times of activating a word line within the memory cell block.
3. The device of claim 1 , further comprising a feedback circuit configured to reset the number of times of access according to activation of the refresh request signal.
4. The device of claim 2 , further comprising a feedback circuit configured to reset the number of times of access according to activation of the refresh request signal.
5. The device of claim 1 , further comprising a refresh counter configured to count the number of times of refresh cycles performed for each of the word lines in the refresh operation of a certain memory array block, wherein
when the number of times of the refresh cycles reaches a predetermined value, the refresh counter inactivates the refresh request signal in order to end the refresh operation.
6. The device of claim 2 , further comprising a refresh counter configured to count the number of times of refresh cycles performed for each of the word lines in the refresh operation of a certain memory array block, wherein
when the number of times of the refresh cycles reaches a predetermined value, the refresh counter inactivates the refresh request signal in order to end the refresh operation.
7. The device of claim 3 , further comprising a refresh counter configured to count the number of times of refresh cycles performed for each of the word lines in the refresh operation of a certain memory array block, wherein
when the number of times of the refresh cycles reaches a predetermined value, the refresh counter inactivates the refresh request signal in order to end the refresh operation.
8. The device of claim 1 , further comprising a refresh counter configured to count the number of the word lines refreshed in the refresh operation of a certain memory array block, wherein
when the number of the word lines refreshed in the certain memory array block reaches a predetermined value, the refresh counter inactivates the refresh request signal in order to end the refresh operation.
9. The device of claim 2 , further comprising a refresh counter configured to count the number of the word lines refreshed in the refresh operation of a certain memory array block, wherein
when the number of the word lines refreshed in the certain memory array block reaches a predetermined value, the refresh counter inactivates the refresh request signal in order to end the refresh operation.
10. The device of claim 1 , further comprising a gate circuit provided corresponding to the memory array blocks, the gate circuit being configured to receive a refresh instruction activated when the refresh operation is performed for each of the word lines, and to output a busy signal prohibiting access to the memory cells to the outside of the device when the refresh instruction is in an active state.
11. The device of claim 2 , further comprising a gate circuit provided corresponding to the memory array blocks, the gate circuit being configured to receive a refresh instruction activated when the refresh operation is performed for each of the word lines, and to output a busy signal prohibiting access to the memory cells to the outside of the device when the refresh instruction is in an active state.
12. The device of claim 3 , further comprising a gate circuit provided corresponding to the memory array blocks, the gate circuit being configured to receive a refresh instruction activated when the refresh operation is performed for each of the word lines, and to output a busy signal prohibiting access to the memory cells to the outside of the device when the refresh instruction is in an active state.
13. The device of claim 1 , further comprising a gate circuit configured to receive the refresh request signal and a cycle signal prescribing a refresh cycle performed for each of the word lines, and to output a refresh instruction activated for each refresh cycle in order to perform the refresh operation to each of the word lines.
14. The device of claim 2 , further comprising a gate circuit configured to receive the refresh request signal and a cycle signal prescribing a refresh cycle performed for each of the word lines, and to output a refresh instruction activated for each refresh cycle in order to perform the refresh operation to each of the word lines.
15. The device of claim 1 , wherein when the refresh request signal is activated, the row decoder continuously activates the word lines of the memory array blocks corresponding to the access counter, and the sense amplifier performs the refresh operation to the activated word lines.
16. The device of claim 1 , wherein the sense amplifier is shared by a plurality of adjacent memory array blocks, and
the refresh operation is alternately performed to even-order memory array blocks and odd-order memory array blocks.
17. The device of claim 2 , wherein the sense amplifier is shared by a plurality of adjacent memory array blocks, and
the refresh operation is alternately performed to even-order memory array blocks and odd-order memory array blocks.
18. The device of claim 8 , wherein the sense amplifier is shared by a plurality of adjacent memory array blocks, and
the refresh operation is alternately performed to even-order memory array blocks and odd-order memory array blocks.
19. The device of claim 16 , wherein the refresh operation of each of the word lines of the even-order memory array blocks is performed by shifting a half cycle of a refresh cycle performed to each of the word lines from the refresh operation of each of the word lines of the odd-order memory array blocks.