IP Library Granted Patent US 8,203,183
Granted Patent B2
US 8,203,183 · App. 12/556,957 · Granted Jun 19, 2012

Electrostatic discharge diode

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Quick Facts
Patent No.
US 8,203,183
App. No.
12/556,957
Granted
Jun 19, 2012
Kind
B2
Abstract

The present invention relates to an electrostatic discharge diode. The electrostatic discharge diode according to exemplary embodiment of the present invention includes: an N-type well formed on a substrate; an n− region formed on the N-type well; a plurality of p− regions penetrated and formed in the n− region; a plurality of n+ regions penetrated and formed in a first layer in which the n− region and a plurality of the p− regions are formed; a plurality of n+ regions penetrated and formed in a first layer in which the n− region and a plurality of the p− regions are formed; and a plurality of p+ regions penetrated and formed in the first layer, wherein a first n+ region among a plurality of the n+ regions and a first p+ region corresponding to the first n+ region are penetrated and formed in each other region of the corresponding first p− region among a plurality of the p− regions.

Claims (49)

1. An electrostatic discharge diode comprising:

an N-type well formed on a substrate;

an n− region formed in the N-type well;

a plurality of p− regions formed in the n− region;

a plurality of n+ regions formed in a first layer in which the n− region and a plurality of the p− regions are formed; and

a plurality of p+ regions formed in the first layer,

wherein a first n+ region among the plurality of n+ regions and a first p+ region among the plurality of p+ regions are formed across a boundary of a first p− region among the plurality of p− regions.

2. The electrostatic discharge diode of claim 1 , wherein each of the plurality of n+ regions is formed in the n− region and a p− region among the plurality of p− regions, and each of the plurality of p+ regions is formed in the n− region and a p− region among the plurality of p− regions.

3. The electrostatic discharge diode of claim 2 , wherein

a first diode is formed between the first p− region and the first n+ region, and a second diode is formed between the first p− region and the n− region.

4. The electrostatic discharge diode of claim 3 , wherein

a third diode is formed between a second p+ region that is near the first n+ region and the n− region, and a fourth diode is formed between a second p− region in which a portion of the second p+ region is formed and the n− region.

5. The electrostatic discharge diode of claim 4 , wherein

a trigger voltage at the first diode is higher than a trigger voltage at the third diode, which is higher than trigger voltages at the second and fourth diodes.

6. The electrostatic discharge diode of claim 4 , wherein

the first p+ region and the second p+ region are connected to each other.

7. The electrostatic discharge diode of claim 4 , wherein

a first resistor is formed between the first n+ region and the n− region, and a second resistor is formed between the first p+ region and the first p− region.

8. The electrostatic discharge diode of claim 1 , wherein

the plurality of n+ regions is formed in the n− region and a p− region among the plurality of p− regions, and p+ regions in the plurality of p+ regions are respectively formed in a p− region among the plurality of p− regions.

9. The electrostatic discharge diode of claim 8 , wherein

a first diode is formed between the first p− region and the first n+ region, and a second diode is formed between the first p− region and the n− region.

10. The electrostatic discharge diode of claim 9 , wherein

a third diode is formed between a second p− region in which a second p+ region near the first n+ region is formed and the n− region.

11. The electrostatic discharge diode of claim 10 , wherein

a trigger voltage of the first diode is higher than trigger voltages of the second and third diodes.

12. The electrostatic discharge diode of claim 10 , wherein

the first p+ region and the second p+ region are connected to each other.

13. The electrostatic discharge diode of claim 10 , wherein

a first resistor is formed between the first p+ region and the first p− region.

14. A electrostatic discharge diode comprising:

an N+ BL (Blocking Layer) formed on a substrate;

a plurality of n− regions formed on the N+ BL;

a plurality of p− regions formed on the N+ BL and alternately formed with the plurality of n− regions in a horizontal direction;

a plurality of n+ regions formed in a first layer in which the plurality of n− regions and the plurality of p− regions are formed; and

a plurality of p+ regions formed in the first layer,

wherein an n+ region among the plurality of n+ regions is formed on the N+ BL and formed across a boundary of a p− region among the plurality of p− regions.

15. The electrostatic discharge diode of claim 14 , wherein

a first n+ region among the plurality of n+ regions is formed from a first n− region among the plurality of n− regions to a first p− region that is near the first n− region.

16. The electrostatic discharge diode of claim 15 , wherein

a first diode is formed between the first p− region and the first n+ region, and a second diode is formed between the first p− region and the N+ BL.

17. The electrostatic discharge diode of claim 16 , wherein

a first p+ region, which is near the first n+ region among the plurality of p− regions, is formed from a second n− region near the first p− region to the first p− region, and a second p+ region among the plurality of p+ regions is formed from a second p− region near the first n− region to the first n− region.

18. The electrostatic discharge diode of claim 17 , wherein

a third diode is formed between the second p+ region and the first n− region, and a fourth diode is formed between the second p− region and the N+ BL.

19. The electrostatic discharge diode of claim 18 , wherein

a trigger voltage of the first diode is higher than a trigger voltage of the third diode, which is higher than trigger voltages of the second and fourth diodes.

20. The electrostatic discharge diode of claim 18 , wherein

the first p+ region and the second p+ region are connected to each other.

Assignments (5)
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 04481, FRAME 0541 Recorded Jun 22, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064072/0459 →
PATENT SECURITY AGREEMENT Recorded Nov 17, 2017
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 044481/0541 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 2, 2017
From: FAIRCHILD KOREA SEMICONDUCTOR, LTD.
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 044361/0205 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 16, 2010
From: RYU, JUN-HYEONG; KANG, TAEG-HYUN; KIM, MOON-HO
To: FAIRCHILD KOREA SEMICONDUCTOR LTD.
Reel/Frame 024546/0217 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 26, 2010
From: RYU, JUN-HYEONG; KANG, TAEG-HYUN; KIM, MOON-HO
To: FAIRCHILD KOREA SEMICONDUCTOR LTD.
Reel/Frame 024148/0398 →