Noise tolerant measurement
View Patent ↗The invention relates to statistical methods for fitting a mathematical model of the interaction of signals, such as optical signals, with tissue to detected signals or data related to the interaction. In particular it relates to statistical methods for fitting a mathematical model of the interaction of optical signals with tissue to actual signals, such as interferometric signals related to data optical scattering in tissue and their relationship to glucose concentration. It also relates to statistical methods for fitting a mathematical model of the interaction of optical signals with tissue to data such as the spectral distribution values of optical signals absorbed or scattered by tissue and their relationship to glucose concentration. The invention provides a practical non-invasive glucose measurement method and system. The invention also provides a measurement method and system that performs well in low signal-to-noise environments.
1. A non-invasive analysis system comprising:
an OCT analysis system, said OCT analysis system outputting measurement signals containing information obtained from a target of interest;
a system model processor configured for generating and outputting theoretical signals consistent with an idealized OCT analysis system;
a noise model processor configured for generating and outputting noise statistics related to measurements obtained by the OCT analysis system;
a parametric estimation processor configured to receive said measurement signals, said theoretical signals and said noise statistics and where said parametric estimation processor is configured to use at least one fitness criterion to estimate at least one model parameter used by said system model processor to optimize the fit of said theoretical signals with said measurement signals with consideration of said noise statistics; and
an output, where said output provides information about said target of interest based on said at least one estimated model parameter.
2. The system as in claim 1 , wherein the system model processor is responsive to iterative outputs of the parametric estimation processor.
3. The system as in claim 2 , wherein the iterative outputs include outputs which incorporate signals from multiple targets.
4. The system as in claim 1 , wherein the system model processor uses a model empirically generated by analyzing data sets and is configured to dynamically find a pattern without being predicated on the operative physics.
5. A multiple reference OCT system, said system comprising:
a multiple reference OCT system, outputting measurement signals containing information obtained from a target of interest;
a system model processor configured for generating and outputting theoretical signals consistent with an idealized multiple reference OCT analysis system;
a noise model processor configured for generating and outputting noise statistics related to measurements obtained by the OCT analysis system;
a parametric estimation processor configured to receive said measurement signals, said theoretical signals and said noise statistics and where said parametric estimation processor is configured to use at least one fitness criterion to estimate at least one model parameter used by said system model processor to optimize the fit of said theoretical signals with said measurement signals with consideration of said noise statistics; and
an output, where said output provides information about said target of interest based on said at least one estimated model parameter.