IP Library Granted Patent US 8,508,101
Granted Patent B2
US 8,508,101 · App. 12/601,687 · Granted Aug 13, 2013

Elastic boundary wave substrate and elastic boundary wave functional element using the substrate

Inventors: Kazuhiko Yamanouchi (Miyagi, JP); Yusuke Satoh (Miyagi, JP)
Assignee: Panasonic Corporation
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Quick Facts
Patent No.
US 8,508,101
App. No.
12/601,687
Granted
Aug 13, 2013
Kind
B2
Abstract

The structure of the patent is a substrate wherein a metal electrode, a dielectric thin film, and a further dielectric thin film are adhered onto a piezoelectric substrate. A substrate wherein elastic wave energy is confined in the piezoelectric substrate can be obtained. In particular, when a SiO 2 thin film and an AlN thin film are used as thin films 4 and 5 , respectively, a substrate excellent in an electromechanical coupling coefficient (k 2 ) and a temperature characteristic of frequency can be yielded by making the film thicknesses of electrodes 2 and 3 and those of the thin films 4 and 5 into optimal values.

Claims (15)

1. An elastic boundary wave functional element comprising:

a LiNbO 3 substrate;

a film electrode formed above the LiNbO 3 substrate;

a SiO 2 film formed above the film electrode; and

a thin film formed above the SiO 2 film, the thin film having a transverse wave velocity larger than that of SiO 2 film,

wherein the film electrode has a ratio H 2 /λ or H 3 /λ that is 0.05 or more, symbol H 2 representing a film thickness of the film electrode, symbol λ representing the wavelength of the central frequency of the boundary wave,

wherein the SiO 2 film has a ratio H 4 /λ that is 0.4 or more and 1 or less, symbol H 4 representing a film thickness of the SiO 2 film,

wherein the thin film has a ratio H 5 /λ, symbol H 5 representing a film thickness of the thin film,

wherein the functional element is structured and arranged such that when an energy radiation exists in the thickness direction of the substrate, and

an energy exists in the surface of the thin film,

the energy radiation in the thickness direction of the substrate is ⅛ or less of the whole energy, and the energy of the surface of the thin film is ⅛ or less of the whole energy, and

wherein SV wave energy is larger than SH wave energy at a boundary between the LiNbO 3 substrate and the SiO 2 film.

2. The elastic boundary wave functional element according to claim 1 , wherein the film electrode is made from copper.

3. The elastic boundary wave functional element according to claim 1 , wherein the LiNbO 3 substrate is a 120-136° rotated Y—X propagation LiNbO 3 substrate.

4. The elastic boundary wave functional element according to claim 1 , wherein the ratio H 5 /λ is 1 or more and 2 or less.

Assignments (3)
CHANGE OF NAME Recorded Sep 19, 2016
From: SKYWORKS PANASONIC FILTER SOLUTIONS JAPAN CO., LTD.
To: SKYWORKS FILTER SOLUTIONS JAPAN CO., LTD.
Reel/Frame 040084/0571 →
ASSIGNMENT AND ACKNOWLEDGMENT Recorded May 14, 2015
From: PANASONIC CORPORATION
To: SKYWORKS PANASONIC FILTER SOLUTIONS JAPAN CO., LTD.
Reel/Frame 035664/0406 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 3, 2010
From: YAMANOUCHI, KAZUHIKO; SATOH, YUSUKE
To: PANASONIC CORPORATION
Reel/Frame 024021/0339 →
Priority Claims (2)
JP 2007-166939 · May 28, 2007 · national
JP 2008-098723 · Mar 9, 2008 · national
Continuity (1)
Related Publication 20100171389A1 · Jul 8, 2010