Non-volatile semiconductor memory device and method of manufacturing the same
View Patent ↗The charge retention characteristics of a non-volatile memory, particularly, a MONOS-type non-volatile memory is improved. In a non-volatile memory cell including a tunnel silicon oxide film ( 107 ), a silicon nitride film ( 104 ) serving as a charge storage film, a silicon oxide film ( 105 ), and a gate electrode ( 108 ) which are sequentially formed on a semiconductor substrate, the tunnel silicon oxide film ( 107 ) has a stacked structure of a silicon oxynitride film ( 102 ) and a silicon oxide film ( 103 ). Herein, it is configured such that a density of nitrogen atoms contained in the silicon oxynitride film ( 102 ) decreases as a distance from an interface with the semiconductor substrate increases in a film-thickness direction of the silicon oxynitride film ( 102 ).
1. A method of manufacturing a non-volatile semiconductor memory device comprising the steps of:
(a) forming a tunnel silicon oxide film on a semiconductor substrate;
(b) converting a part of the tunnel silicon oxide film in contact with the semiconductor substrate to a silicon oxynitride film after the step (a);
(c) forming a charge storage film on the tunnel silicon oxide film;
(d) forming a gate insulating film on the charge storage film;
(e) forming a conductive film on the gate insulating film;
(f) forming a gate electrode by patterning the conductive film and processing the gate insulating film, the charge storage film, the tunnel silicon oxide film, and the silicon oxynitride film in conformity with the gate electrode; and
(g) forming a source region and a drain region of the non-volatile semiconductor memory device,
wherein the step (b) includes the steps of:
(b1) introducing nitrogen atoms into an interface of the semiconductor substrate and the tunnel silicon oxide film by a first thermal treatment in an atmosphere containing nitrogen monoxide; and
(b2) diffusing the nitrogen atoms in a film-thickness direction of the tunnel silicon oxide film to form the silicon oxynitride film after the step (b1) by a second thermal treatment in an atmosphere containing oxygen.
2. The method of manufacturing the non-volatile semiconductor memory device according to claim 1 ,
wherein a density of nitrogen atoms contained in the silicon oxynitride film decreases as a distance from an interface of the semiconductor substrate increases in a film-thickness direction of the silicon oxynitride film.
3. The method of manufacturing the non-volatile semiconductor memory device according to claim 1 ,
wherein the first thermal treatment carried out at the step (b1) is a thermal treatment in an atmosphere having a nitrogen monoxide concentration of 100%.
4. The method of manufacturing the non-volatile semiconductor memory device according to claim 1 ,
wherein the first thermal treatment carried out at the step (b1) is a thermal treatment carried out at a temperature of the second thermal treatment is 900° C. or more and 1100° C. or less.
5. The method of manufacturing the non-volatile semiconductor memory device according to claim 1 ,
wherein the second thermal treatment carried out at the step (b2) is a thermal treatment in an atmosphere having an oxygen concentration of 50% or more and 100% or less, and a temperature of the second thermal treatment is 900° C. or more and 1100° C. or less.
6. The method of manufacturing the non-volatile semiconductor memory device according to claim 1 ,
wherein a part of the tunnel silicon oxide film to be converted to the silicon oxynitride film is an oxygen-deficient film in which oxygen is stoichiometrically deficient, the oxygen deficient film being formed at the interface of the semiconductor substrate when the tunnel silicon oxide film is formed at the step (a).