IP Library Granted Patent US 8,456,623
Granted Patent B2
US 8,456,623 · App. 12/604,253 · Granted Jun 4, 2013

Optical component focus testing apparatus and method

Inventors: Colin McGarry (Broxburn, GB); Gilles Dufaure De Lajarte (Munich, DE)
Assignee: STMicroelectronics (Research & Development) Ltd.
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Quick Facts
Patent No.
US 8,456,623
App. No.
12/604,253
Granted
Jun 4, 2013
Kind
B2
Abstract

An optical component focus testing apparatus includes a plurality of test pattern displays. One or more illuminators are configured to selectively illuminate different test pattern displays at different times. Light directors are provided to direct light from at least one of the illuminated test pattern displays towards an optical component under test. The light directors and test pattern displays are arranged such that, in use, light directed from different illuminated test pattern displays travel different distances to reach the optical component under test.

Claims (58)

1. An optical component focus testing apparatus, comprising:

a first test pattern chart;

a second test pattern chart;

a first light source configured to selectively illuminate the first test pattern chart at a first time;

a second light source configured to selectively illuminate the second test pattern chart at a second time; and

a first beamsplitter positioned such that a first surface of the first beamsplitter directs light from the illuminated first test pattern chart to an optical component under test and a second surface of the first beamsplitter directs light from the illuminated second test pattern chart to the optical component under test;

wherein the first beamsplitter and first and second test pattern charts are arranged such that light directed from different illuminated test pattern charts travels different distances to reach the optical component under test.

2. The optical component focus testing apparatus of claim 1 , further comprising:

a third test pattern chart;

a third light source configured to selectively illuminate the third test pattern chart at a third time; and

a second beamsplitter positioned such that a first surface of the second beamsplitter directs light from the illuminated first test pattern chart to the optical component under test and a second surface of the second beamsplitter directs light from the illuminated third test pattern chart to the optical component under test.

3. The optical component focus testing apparatus of claim 2 , wherein a distance light travels from the test pattern charts to the optical component under test is different for each of the first, second and third test pattern charts.

4. The optical component focus testing apparatus of claim 2 , wherein the first and second beamsplitters have different transmission characteristics.

5. The optical component focus testing apparatus of claim 2 , wherein the first and second beamsplitters have different reflection characteristics.

6. The optical component focus testing apparatus of claim 1 , wherein at least one of the distances light travels is a nominal design focus distance for the optical component under test.

7. The optical component focus testing apparatus of claim 1 , wherein at least one of the distances light travels is substantially less than a nominal design focus distance for the optical component under test.

8. The optical component focus testing apparatus of claim 1 , wherein at least one of the distances light travels is substantially more than a nominal design focus distance for the optical component under test.

9. The optical component focus testing apparatus of claim 1 , wherein the first beamsplitter is spectrally neutral.

10. The optical component focus testing apparatus of claim 1 , further including a controller operable to switchably activate the first and second light sources.

11. The optical component focus testing apparatus of claim 1 , wherein the optical component under test is a camera having a fixed focal length.

12. An optical component focus testing apparatus, comprising:

a first test pattern chart;

a second test pattern chart;

a light illuminator configured to selectively and solely illuminate the first test pattern chart at a first time and selectively and solely illuminate the second test pattern chart at a second time; and

a first beamsplitter positioned such that a first surface of the first beamsplitter directs light from the illuminated first test pattern chart to an optical component under test and a second surface of the first beamsplitter directs light from the illuminated second test pattern chart to the optical component under test;

wherein the first beamsplitter and first and second test pattern charts are arranged such that light directed from different illuminated test pattern charts travels different distances to reach the optical component under test.

13. The optical component focus testing apparatus of claim 12 , where the light illuminator comprises: a light source and a rotatable light director configured to direct light from said light source to different ones of the first and second test pattern charts at the first and second times.

14. The optical component focus testing apparatus of claim 12 , where the light illuminator comprises:

a first light source;

a second light source; and

a controller operable to switchably activate the first and second light sources to direct light to different ones of the first and second test pattern charts at the first and second times.

15. The optical component focus testing apparatus of claim 12 , further comprising:

a third test pattern chart, wherein the light illuminator is further configured to selectively illuminate the third test pattern chart at a third time; and

a second beamsplitter positioned such that a first surface of the second beamsplitter directs light from the illuminated first test pattern chart to the optical component under test and a second surface of the second beamsplitter directs light from the illuminated third test pattern chart to the optical component under test.

16. The optical component focus testing apparatus of claim 15 , wherein a distance light travels from the test pattern charts to the optical component under test is different for each of the first, second and third test pattern charts.

17. The optical component focus testing apparatus of claim 15 , wherein the first and second beamsplitters have different transmission characteristics.

18. The optical component focus testing apparatus of claim 15 , wherein the first and second beamsplitters have different reflection characteristics.

19. The optical component focus testing apparatus of claim 15 , wherein at least one of the distances light travels is a nominal focal design distance for the optical component under test.

20. The optical component focus testing apparatus of claim 15 , wherein at least one of the distances light travels is substantially less than a nominal focal design distance for the optical component under test.

21. The optical component focus testing apparatus of claim 15 , wherein at least one of the distances light travels is substantially more than a nominal focal design distance for the optical component under test.

22. The optical component focus testing apparatus of claim 15 , wherein the first beamsplitter is spectrally neutral.

23. The optical component focus testing apparatus of claim 15 , wherein the optical component under test is a camera having a fixed focal length.

24. An optical component focus testing method, comprising:

selectively illuminating a first test pattern chart at a first time;

selectively illuminating a second test pattern chart at a second time;

directing light using a first surface of a first beamsplitter from the illuminated first test pattern chart to an optical component under test; and

directing light from a second surface of the first beamsplitter from the illuminated second test pattern chart to the optical component under test;

wherein the first beamsplitter and first and second test pattern charts are arranged such that light directed from different illuminated test pattern charts travels different distances to reach the optical component under test.

25. The optical component focus testing method of claim 24 , further comprising:

selectively illuminating a third test pattern chart at a third time;

directing light using a first surface of a second beamsplitter from the illuminated first test pattern chart to the optical component under test; and

directing light from a second surface of the second beamsplitter from the illuminated third test pattern chart to the optical component under test.

26. The optical component focus testing method of claim 25 , wherein a distance light travels from the test pattern charts to the optical component under test is different for each of the first, second and third test pattern charts.

27. The optical component focus testing method of claim 24 , wherein at least one of the distances light travels is a nominal focus design distance for the optical component under test.

28. The optical component focus testing method of claim 24 , wherein at least one of the distances light travels is substantially less than a nominal focus design distance for the optical component under test.

29. The optical component focus testing method of claim 24 , wherein at least one of the distances light travels is substantially more than a nominal focus design distance for the optical component under test.

30. The optical component focus testing method of claim 24 , wherein the optical component under test is a camera having a fixed focal length.

31. The optical component focus testing method of claim 24 , further comprising analyzing a focus of the optical component under test by determining an attribute selected from the group consisting of modulation transfer function, contrast transfer function and point spread function.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 22, 2010
From: DE LAJARTE, GILLES DUFAURE
To: STMICROELECTRONICS (RESEARCH & DEVELOPMENT) LIMITED
Reel/Frame 024574/0200 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 12, 2010
From: MCGARRY, COLIN
To: STMICROELECTRONICS (RESEARCH & DEVELOPMENT) LIMITED
Reel/Frame 024219/0540 →
Priority Claims (1)
GB 0821503.0 · Nov 25, 2008 · national
Continuity (1)
Related Publication 20100188653A1 · Jul 29, 2010