AND-type one time programmable memory cell
An AND-type anti-fuse memory cell, and a memory array consisting of AND-type anti-fuse memory cells. Chains of AND type anti-fuse cells are connected in series with each other, and with a bitline contact, in order to minimize the area occupied by the memory array. Each AND type anti-fuse cell includes an access transistor serially connectable to the bitline or the access transistors of other AND type anti-fuse cells, and an anti-fuse device. The channel region of the access transistor is connected to the channel region of the anti-fuse device, and both channel regions are covered by the same wordline. The wordline is driven to a programming voltage level for programming the anti-fuse device, or to a read voltage level for reading the anti-fuse device.
1. An anti-fuse memory cell comprising:
an access transistor having a first channel region having a first channel length dimension, and adjacent to a diffusion region;
an anti-fuse device having a second channel region having a second channel length dimension perpendicular to the first channel length dimension, and connected to the first channel region; and
a wordline overlying the first channel region and the second channel region.
2. The anti-fuse memory cell of claim 1 , wherein the diffusion region is connected to one of a bitline and another access transistor corresponding to an adjacent anti-use memory cell.
3. The anti-fuse memory cell of claim 1 , wherein the access transistor includes a thick gate oxide between the wordline and the first channel region.
4. The anti-fuse memory cell of claim 3 , wherein the anti-fuse device has a variable thickness gate oxide, and a thick portion of the variable thickness gate oxide is adjacent to the thick gate oxide of the access transistor.
5. The anti-fuse memory cell of claim 4 , wherein the thick portion of the variable thickness gate oxide has a thickness substantially identical to the thick gate oxide.
6. The anti-fuse memory cell of claim 1 , wherein the wordline extends in a first direction, and the first channel length of the first channel region extends perpendicular to the wordline.
7. The anti-fuse memory cell of claim 6 , wherein the second channel length of the second channel region extends parallel to the wordline and has a width extending perpendicular to the wordline.
8. The anti-fuse memory cell of claim 7 , wherein the width of the second channel region is less than the length of the first channel region.
9. The anti-fuse memory cell of claim 8 , wherein field oxide isolates the second channel region from another second channel region corresponding to an adjacent anti-fuse memory cell.
10. A memory array comprising:
a plurality of memory chains connected in parallel to a bitline, each of the memory chains including at least two one time programmable memory cells connected in series with a bitline contact corresponding to the bitline; and,
wordlines coupled to the at least two one time programmable memory cells, the wordlines being drivable during a memory operation and each of the at least two one time programmable memory cells includes
an access transistor having a first channel region, and
an anti-fuse device having a second channel region connected to the first channel region and oriented perpendicular to the first channel region.
11. The memory array of claim 10 , wherein the memory operation includes one of a read operation and a program operation.
12. The memory array of claim 10 , wherein
the first channel region and the second channel region of each of the at least two one time programmable memory cells underlies one of the wordlines.
13. The memory array of claim 12 , wherein the wordlines extend in a first direction, and the first channel region has a length extending perpendicular to the wordlines.
14. The memory array of claim 13 , wherein the second channel region has a length extending parallel to the wordlines and a width extending perpendicular to the wordlines.