IP Library Granted Patent US 8,664,020
Granted Patent B2
US 8,664,020 · App. 12/620,928 · Granted Mar 4, 2014

Semiconductor light emitting device and method of manufacturing the same

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Quick Facts
Patent No.
US 8,664,020
App. No.
12/620,928
Granted
Mar 4, 2014
Kind
B2
Abstract

Disclosed is a semiconductor light emitting device, and a method of manufacturing the same. The semiconductor light emitting device includes a first conductivity type semiconductor layer, an active layer disposed on the top of the first conductivity type semiconductor layer, and a second conductivity type semiconductor layer disposed on the top of the active layer and comprising light extraction patterns in the top thereof, the light extraction patterns each having a columnar portion and a hemispherical top portion.

Claims (21)

1. A method of manufacturing a semiconductor light emitting device, the method comprising:

stacking a first conductivity-type semiconductor layer, an active layer and a second conductivity-type semiconductor layer on a substrate;

stacking a mask layer on a top surface of the second conductivity-type semiconductor layer, the mask layer being an oxide layer formed of SiO 2 ;

annealing the mask layer to be agglomerated and to form a plurality of mask patterns having the form of droplets; and

dry etching the second conductivity-type semiconductor layer on which the mask patterns are formed, to form light extraction patterns in a top portion of the second conductivity-type semiconductor layer, the light extraction patterns each having a columnar portion and a hemispherical top portion,

wherein the mask patterns are not removed after the step of dry etching the second conductivity-type semiconductor layer on which the mask patterns are formed.

2. The method of claim 1 , wherein the mask layer is deposited to a thickness of 1000 Å to 2000 Å.

3. The method of claim 1 , wherein the annealing is performed at a temperature ranging from 500° C. to 800° C.

4. The method of claim 1 , wherein the plurality of mask patterns in the form of droplets are spaced apart from each other at a distance ranging from about 0.05 μm to 0.15 μm.

5. The method of claim 1 , further comprising, after the forming of the light extraction patterns:

etching respective portions of the second conductivity-type semiconductor layer and the active layer to expose a portion of the first conductivity-type semiconductor layer;

forming a first electrode on the exposed portion of the first conductivity-type semiconductor layer; and

forming a second electrode on the top of the second conductivity-type semiconductor layer.

6. The method of claim 1 , wherein the stacking of the first conductivity-type semiconductor layer, the active layer and the second conductivity-type semiconductor layer comprises:

sequentially growing the second conductivity-type semiconductor layer, the active layer, and the first conductivity-type semiconductor layer on an insulating substrate;

stacking a conductive substrate on the first conductivity-type semiconductor layer; and

removing the insulating substrate.

7. The method of claim 6 , further comprising forming a second conductivity-type electrode on the top of the second conductivity-type semiconductor layer after the forming of the light extraction patterns.

8. The method of claim 1 , wherein

the columnar portion of each of the light extraction patterns has a predetermined depth, and

a respective top portion of the columnar portion of each light extraction pattern has a hemispherical shape.

Assignments (1)
MERGER Recorded Aug 7, 2012
From: SAMSUNG LED CO., LTD.
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 028744/0272 →