Thin film transistor, display unit, and method of manufacturing thin film transistor

1. A thin film transistor comprising:

a gate electrode;

a gate insulting film formed on the gate electrode;

an oxide semiconductor thin film layer forming a channel region corresponding to the gate electrode, the oxide semiconductor thin film layer on the gate insulating film;

a channel protective layer that is formed at least in a region corresponding to the channel region on the gate insulating film and the oxide semiconductor thin film layer, the channel protective layer including a first channel protective layer on a lower layer side and a second channel protective layer on an upper layer side; and

a source/drain electrode that is formed on the channel protective layer and electrically connected to the oxide semiconductor thin film layer,

wherein,

the first channel protective layer is made of an oxide insulating material,

at least one of the first channel protective layer and the second channel protective layer is made of a low oxygen permeable material, and

an aperture penetrating to the oxide semiconductor thin film layer is provided in a vicinity of the channel region in the channel protective layer, the aperture being separate from a contact hole through which the source/drain electrode is electrically connected to the oxide semiconductor thin film layer.

2. The thin film transistor according to claim 1 , wherein the first channel protective layer is made of a material that does not make oxygen detached from the oxide semiconductor thin film layer.

3. The thin film transistor according to claim 1 , wherein the low oxygen permeable material has oxygen permeability factor of 0.1 (cc/m 2 day) or less.

4. The thin film transistor according to claim 1 , wherein the first channel protective layer is made of a material that does not supply hydrogen to the oxide semiconductor thin film layer.

5. The thin film transistor according to claim 1 , wherein at least one of the first channel protective layer and the second channel protective layer is made of a low water vapor permeable material.

6. The thin film transistor according to claim 5 , wherein the low water vapor permeable material has water vapor permeability factor of 0.1 (g/m 2 day) or less.

7. The thin film transistor according to claim 2 , wherein the first channel protective layer is composed of silicon oxide, tantalum oxide, titanium oxide, hafnium oxide, zirconium oxide, yttrium oxide, aluminum oxide, a nitrogenous material thereof, or silicon nitride.

8. A display unit comprising:

a display device; and

a thin film transistor for driving the display device, the thin film transistor including

a gate electrode,

a gate insulting film formed on the gate electrode,

an oxide semiconductor thin film layer forming a channel region corresponding to the gate electrode, the oxide semiconductor thin film layer on the gate insulating film,

a channel protective layer that is formed at least in a region corresponding to the channel region on the gate insulating film and the oxide semiconductor thin film layer, the channel protective layer including a first channel protective layer on a lower layer side and a second channel protective layer on an upper layer side, and

a source/drain electrode that is formed on the channel protective layer and is electrically connected to the oxide semiconductor thin film layer,

wherein,

the first channel protective layer is made of an oxide insulating material,

at least one of the first channel protective layer and the second channel protective layer is made of a low oxygen permeable material, and

an aperture penetrating to the oxide semiconductor thin film layer is provided in a vicinity of the channel region in the channel protective layer, the aperture being separate from a contact hole through which the source/drain electrode is electrically connected to the oxide semiconductor thin film layer.

9. The display unit according to claim 8 , wherein the display device is an organic light emitting device that has an anode, an organic layer including a light emitting layer, and a cathode.

10. A method of manufacturing a thin film transistor comprising the steps of:

forming a gate electrode and a gate insulating film in this order on a substrate;

forming an oxide semiconductor thin film layer having a channel region corresponding to the gate electrode;

forming a channel protective layer including a first channel protective layer on a lower layer side and a second channel protective layer on an upper layer side in at least a region corresponding to the channel region on the gate insulating film and the oxide semiconductor thin film layer;

forming a contact hole for obtaining electrical connection with the oxide semiconductor thin film layer by patterning the channel protective layer; and

forming a source/drain electrode on the channel protective layer and the contact hole, the source/drain electrode being electrically connected to the oxide semiconductor thin film layer,

wherein,

an oxide insulating material is used as the first channel protective layer, and a low oxygen permeable material is used as at least one of the first channel protective layer and the second channel protective layer, and

in the step of forming the contact hole, the channel protective layer is further patterned to form, in addition to the contact hole, an aperture in a vicinity of the channel region, the aperture penetrating to the oxide semiconductor thin film.

11. The method according to claim 10 , wherein in the step of forming the first channel protective layer, a composition of film-forming gas does not contain hydrogen.

12. The method according to claim 10 , wherein oxygen annealing treatment is carried out after forming the aperture, oxygen being supplied to the oxide semiconductor thin film layer through the aperture.

13. The method according to claim 10 , wherein oxygen annealing treatment is carried out (i) after forming the oxide semiconductor thin film layer and before forming the first channel protective layer, (ii) after forming the first channel protective layer and before forming the second channel protective layer, or (iii) after forming the second channel protective layer, oxygen supplied to the oxide semiconductor thin film layer during the oxygen annealing treatment.