IP Library Granted Patent US 8,184,297
Granted Patent B2
US 8,184,297 · App. 12/640,797 · Granted May 22, 2012

Gas mixture measurement system and methods therefor

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Quick Facts
Patent No.
US 8,184,297
App. No.
12/640,797
Granted
May 22, 2012
Kind
B2
Abstract

A system including at least one laser device extending a beam through an in-situ non-restrictive flow path of the gas mixture; and a measurer coupled to each laser device for obtaining a plurality of dynamic measurements over time of at least one species in the gas mixture.

Claims (26)

1. A system, comprising:

at least one laser device extending a beam through an in-situ non-restrictive flow path of the gas mixture;

a measurer coupled to each laser device for obtaining a plurality of dynamic measurements of at least one species in the gas mixture over time, wherein each dynamic measurement includes a concentration and a time of measurement of the concentration; and

a gas mixture analysis system, wherein the gas mixture analysis system includes a concentration trend calculator, wherein the concentration trend calculator monitors a rate of change of a concentration of the at least one species in the gas mixture.

2. The system of claim 1 , wherein the at least one laser device is one of, a tunable diode laser, a vertical cavity surface emitting laser, and an interband cascade laser.

3. The system of claim 1 , wherein each dynamic measurement includes a concentration and a time of measurement.

4. The system of claim 1 , further comprising: at least one transmission device for transmitting the obtained dynamic measurements to a receiver.

5. The system of claim 4 , wherein the at least one transmission device is a radio-frequency identification tag.

6. The system of claim 4 , further comprising: at least one receiver for receiving the dynamic measurements.

7. The system of claim 1 , wherein the gas mixture analysis system includes a concentration comparison system.

8. The system of claim 1 , wherein the gas mixture analysis system includes a concentration trend comparison system.

9. The system of claim 1 , further comprising: a plurality of laser devices.

10. The system of claim 9 , wherein each of the plurality of laser devices obtains a simultaneous dynamic measurement of the at least one species in the gas mixture.

11. The system of claim 9 , wherein at least one of the plurality of laser devices is calibrated to obtain dynamic measurements of a different species than the at least one species in the gas mixture.

12. The system of claim 1 , wherein the at least one laser device is a quantum cascade laser.

13. The system of claim 1 , wherein the at least one laser device is placed within the in-situ non-restrictive flow path of the gas mixture.

14. The system of claim 1 , wherein the concentration trend comparison system compares the rate of change of the concentration of the at least one species in the gas mixture with a reference rate of change of the concentration of the at least one species in the gas mixture.

15. A method, comprising:

extending a beam with at least one laser device through an in-situ non-restrictive flow path of a gas mixture;

measuring a plurality of dynamic measurements of at least one species in the gas mixture over time, wherein each dynamic measurement includes a concentration and a time of measurement of the concentration; and

monitoring a rate of change of a concentration of the at least one species in the gas mixture.

16. The method of claim 15 , wherein the at least one laser device is one of a tunable diode laser, a vertical cavity surface emitting laser, and an interband cascade laser.

17. The method of claim 15 , further comprising transmitting the obtained dynamic measurements to a receiver.

18. The method of claim 15 , further comprising receiving the dynamic measurements and analyzing the measurements.

19. The method of claim 15 , wherein the analyzing includes calculating a trend of concentration of at least one species.

20. The method of claim 15 , wherein the at least one laser device is a quantum cascade laser.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 3, 2014
From: GENERAL ELECTRIC COMPANY; BHA GROUP, INC.; ALTAIR FILTER TECHNOLOGY LIMITED
To: BHA ALTAIR, LLC
Reel/Frame 031911/0797 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 21, 2009
From: TAYLOR, ROBERT WARREN; MALY, PETER MARTIN; PHELAN, BRIAN ROBERT
To: GENERAL ELECTRIC COMPANY
Reel/Frame 023682/0273 →