Resistive glass structures used to shape electric fields in analytical instruments
View Patent ↗A reflectron lens for a time-of-flight mass spectrometer and a method of making same are disclosed. The reflectron lens includes a glass tube having a conductive surface along the length of the tube. The conductive surface has an electrical resistance gradient along its length. The electrical resistance gradient provides an electric field interior to the tube that varies in strength along the length of the tube when an electric potential is applied to opposing ends of the tube. A mass spectrometer incorporating the reflectron lens, a method of making the reflectron lens, and an apparatus for removing lead from the surface of a lead silicate glass tube are also disclosed.
1. A reflectron lens comprising a lead silicate glass tube having a lead oxide semiconductive surface layer formed along the length of said glass tube, said lead oxide semiconductive surface layer having an electrical resistance gradient along said length, whereby said tube provides an electric field interior to the tube that varies in strength along the length of the tube when an electric potential is applied to opposing ends of the tube.
2. The reflectron lens set forth in claim 1 wherein the semiconductive surface layer is formed such that the electrical resistance gradient changes linearly along the length of the tube.
3. The reflectron lens set forth in claim 1 wherein the semiconductive surface layer is formed such that the electrical resistance gradient changes in steps along the length of the tube.
4. The reflectron lens set forth in claim 1 wherein the semiconductive surface layer is formed such that the electrical resistance gradient changes nonlinearly along the length of the tube.
5. A mass spectrometer comprising:
a flight tube;
a source of ions positioned at a first end of said flight tube;
an ion detector positioned at the first end of said flight tube and in spaced relation to said source of ions;
a reflectron lens positioned in said flight tube at a second end thereof that is distal from said ion detector; and
a voltage supply electrically connected to opposing ends of said reflectron lens;
wherein said reflectron lens comprises a lead silicate glass tube having a lead oxide semiconductive surface layer extending along the length of the glass tube and said lead oxide semiconductive surface layer has an electrical resistance gradient along said length, whereby said reflectron lens provides an electric field interior thereto that varies in strength along the length of said lens.
6. The mass spectrometer set forth in claim 5 wherein the semiconductive surface layer is formed such that the electrical resistance gradient changes linearly along the length of the glass tube.
7. The mass spectrometer set forth in claim 5 wherein the semiconductive surface layer is formed such that the electrical resistance gradient changes in steps along the length of the glass tube.
8. The mass spectrometer set forth in claim 5 wherein the semiconductive surface layer is formed such that the electrical resistance gradient changes nonlinearly along the length of the glass tube.
9. A reflectron lens comprising a lead silicate glass tube having a semiconductive surface layer along the length of the surface of said tube, said semiconductive surface layer comprising a plurality of lead oxide semiconducting areas formed in the surface of the glass that provide an electrical resistance gradient along said length, whereby said tube provides an electric field interior to the tube that varies in strength along the length of the tube when an electric potential is applied to opposing ends of the tube.
10. The reflectron lens set forth in claim 9 wherein the plurality of lead oxide semiconducting areas are formed such that the electrical resistance gradient changes linearly along the length of the tube.
11. The reflectron lens set forth in claim 9 wherein the plurality of lead oxide semiconducting areas are formed such that the electrical resistance gradient changes in steps along the length of the tube.
12. The reflectron lens set forth in claim 9 wherein the plurality of lead oxide semiconducting areas are formed such that the electrical resistance gradient changes nonlinearly along the length of the tube.
13. A mass spectrometer comprising:
a flight tube;
a source of ions positioned at a first end of said flight tube;
an ion detector positioned at the first end of said flight tube and in spaced relation to said source of ions;
a reflectron lens positioned in said flight tube at a second end thereof that is distal from said ion detector; and
a voltage supply electrically connected to opposing ends of said reflectron lens;
wherein said reflectron lens comprises a lead silicate glass tube having a semiconductive surface layer extending along the length of the glass tube and said semiconductive surface layer comprises a plurality of lead oxide semiconducting areas formed in the surface of the glass that provide an electrical resistance gradient along said length, whereby said reflectron lens provides an electric field interior thereto that varies in strength along the length of said lens.
14. The mass spectrometer set forth in claim 13 wherein the plurality of lead oxide semiconducting areas are formed such that the electrical resistance gradient changes linearly along the length of the glass tube.
15. The mass spectrometer set forth in claim 13 wherein the plurality of lead oxide semiconducting areas are formed such that the electrical resistance gradient changes in steps along the length of the glass tube.
16. The mass spectrometer set forth in claim 13 wherein the plurality of lead oxide semiconducting areas are formed such that the electrical resistance gradient changes nonlinearly along the length of the glass tube.
17. A method of preparing a glass tube for use as a reflectron lens comprising the steps of:
providing a glass tube wherein the glass contains a lead compound;
immersing a portion of said glass tube in a solution that removes lead from the surface of the glass tube;
holding said portion of the glass tube in the solution for a time sufficient to remove lead from the surface of the immersed portion of said glass tube; and then
chemically reducing the surface of the glass tube to form an electrically resistive layer on the surface of the glass tube, whereby the electrical resistance of the portion held in the acidic solution is lower than the electrical resistance of the other portion of the glass tube;
whereby said glass tube has a conductive surface along the length of said tube, said conductive surface having an electrical resistance gradient along said length, and said tube provides an electric field interior to the tube that varies in strength along the length of the tube when an electric potential is applied to opposing ends of the tube.
18. The method set forth in claim 17 wherein the step of providing the glass tube comprises the step of providing a lead silicate glass tube.
19. The method set forth in claim 17 wherein before said chemically reducing step, performing the further steps of immersing a second portion of said glass tube in the lead-removal solution and holding said second portion in the solution for a time sufficient to remove lead from the surface of the immersed second portion of the glass tube.
20. The method set forth in claim 17 wherein the lead removal solution comprises an acidic solution.
21. The method set forth in claim 17 wherein the step of holding the portion of the glass tube in the lead removal solution comprises the step of moving the glass tube into the solution at a speed selected to provide removal of lead in a linear manner along the length of the glass tube.