IP Library Granted Patent US 8,198,657
Granted Patent B2
US 8,198,657 · App. 12/652,379 · Granted Jun 12, 2012

Thin film transistor array panel and method for manufacturing the same

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Quick Facts
Patent No.
US 8,198,657
App. No.
12/652,379
Granted
Jun 12, 2012
Kind
B2
Abstract

A thin film transistor array panel includes an insulating substrate. A gate line is formed on the insulating substrate and has a gate electrode. A gate insulating layer is formed on the gate line. A semiconductor layer is formed on the gate insulating layer and overlaps the gate electrode. Diffusion barriers are formed on the semiconductor layer and contain nitrogen. A data line crosses the gate line and has a source electrode partially contacting the diffusion barriers and a drain electrode partially contacting the diffusion barriers and facing the source electrode. The drain electrode is on the gate electrode. A pixel electrode is electrically connected to the drain electrode.

Claims (43)

1. A thin film transistor array panel comprising:

an insulating substrate;

a gate line formed on the insulating substrate and comprising a gate electrode;

a gate insulating layer formed on the gate line;

a semiconductor layer formed on the gate insulating layer and overlapping the gate electrode;

a first ohmic contact layer formed on the semiconductor layer;

a diffusion barrier layer comprising nitrogen formed on the first ohmic contact layer;

a second ohmic contact layer formed on the diffusion barrier layer;

a data line crossing the gate line and comprising a source electrode and a drain electrode on the diffusion barrier layer;

a passivation layer on the data line; and

a pixel electrode formed on the passivation layer and electrically connected to the drain electrode.

2. The thin film transistor array panel of claim 1 , wherein the semiconductor layer has substantially the same planar pattern as the data line except for a portion of the semiconductor layer that is between the source and drain electrodes.

3. The thin film transistor array panel of claim 1 , wherein the gate line comprise copper or a copper alloy.

4. The thin film transistor array panel of claim 1 , further comprising red, green, and blue color filters under the pixel electrode on the insulating substrate.

5. The thin film transistor array panel of claim 1 , wherein the data line comprise a Cu—Mn (copper-manganese) alloy.

6. The thin film transistor array panel of claim 5 , wherein a surface of the data line comprises a Mn oxide.

7. A method for manufacturing a thin film transistor array panel, comprising:

forming a gate line comprising a gate electrode on an insulating substrate;

forming a gate insulating layer and an a-Si layer;

forming a first ohmic contact layer doped with a conductive impurity, a diffusion barrier layer and a second ohmic contact layer;

forming a data line comprising source and drain electrodes overlapping the second ohmic contact layer;

forming a passivation layer on the data line; and

forming a pixel electrode electrically connected to the drain electrode.

8. The method of claim 7 , wherein the gate line comprises copper or a copper alloy.

9. The method of claim 7 , wherein the data line comprises a Cu—Mn alloy.

10. The method of claim 7 , wherein the diffusion barrier layer comprises nitrogen and a same material as the first ohmic contact layer.

11. The method of claim 7 , wherein the diffusion barrier layer is formed through a plasma treatment.

12. The method of claim 7 , wherein the a-Si layer, the first ohmic contact layer, the diffusion barrier layer, the second ohmic contact layer and the data line having the source and drain electrode are formed through a single photo exposure process.

13. The method of claim 7 , wherein the diffusion barrier layer comprises nitrogen and a same material as the first ohmic contact layer.

14. A thin film transistor array panel comprising:

a gate line comprising a gate electrode on an insulating substrate;

a gate insulating layer;

a semiconductor layer;

a first ohmic contact layer doped with a conductive impurity, a diffusion barrier layer and a second ohmic contact layer;

a data line comprising a source electrode and a drain electrode overlapping the second ohmic contact layer;

a passivation layer on the data line; and

a pixel electrode electrically connected to the drain electrode.

15. The transistor array panel of claim 14 , wherein the semiconductor layer has substantially the same planar pattern as the data line except for a portion of the semiconductor layer that is between the source and drain electrodes.

16. The transistor array panel of claim 14 , wherein the gate line comprise copper or a copper alloy.

17. The transistor array panel of claim 14 , further comprising red, green, and blue color filters under the pixel electrode on the insulating substrate.

18. The transistor array panel of claim 14 , wherein the data line comprise a Cu—Mn (copper-manganese) alloy.

19. The transistor array panel of claim 18 , wherein a surface of the data line comprises a Mn oxide.

20. The transistor array panel of claim 14 , wherein the diffusion barrier layer comprises nitrogen and a same material as the first ohmic contact layer.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 17, 2012
From: SAMSUNG ELECTRONICS CO., LTD.
To: SAMSUNG DISPLAY CO., LTD.
Reel/Frame 029045/0860 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 5, 2010
From: LEE, DONG-HOON; KIM, DO-HYUN; JEONG, CHANG-OH; SEO, O-SUNG; LI, XIN-XING
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 023735/0487 →