IP Library Granted Patent US 7,977,999
Granted Patent B2
US 7,977,999 · App. 12/653,536 · Granted Jul 12, 2011

Temperature detection circuit

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,977,999
App. No.
12/653,536
Granted
Jul 12, 2011
Kind
B2
Abstract

Provided is a temperature detection circuit capable of preventing malfunction, which may occur when power is turned on. A switch circuit for giving such a potential that a comparator detects a low temperature is provided at an output terminal of a temperature sensor circuit. A switch circuit for giving such a potential that the comparator detects a low temperature is provided at an output terminal of a reference voltage circuit. When the power is turned on, each of the switch circuits is set by a switch control circuit such that the comparator detects a low temperature.

Claims (10)

1. A temperature detection circuit comprising:

a temperature sensor circuit for producing a temperature voltage based on a temperature;

a reference voltage circuit for producing a reference voltage for setting a set temperature;

a comparator for comparing the temperature voltage with the reference voltage, thereby detecting that the temperature reaches the set temperature to enter a detection state; and

at least one of: a first switch circuit which operates so that, when power is turned on, the temperature voltage is not applied to the comparator but a first power supply voltage is applied to the comparator, thereby compulsorily fixing the comparator in a non-detection state; and a second switch circuit which operates so that, when the power is turned on, the reference voltage is not applied to the comparator but a second power supply voltage is applied to the comparator, thereby compulsorily fixing the comparator in the non-detection state.

2. A temperature detection circuit according to claim 1 , further comprising at least one of:

one of a resistor and a current source provided in a current path through which a current passes when the first switch circuit is turned on; and

one of a resistor and a current source provided in a current path through which a current passes when the second switch circuit is turned on.

3. A temperature detection circuit according to claim 1 , further comprising a switch control circuit for controlling, when the power is turned on, at least one of the first switch circuit and the second switch circuit and operating so that at least one of the first power supply voltage and the second power supply voltage is applied to the comparator.

4. A temperature detection circuit according to claim 1 , further comprising a reference voltage control circuit for monitoring an output voltage of the comparator and operating so that, when the comparator changes one of from the non-detection state to the detection state and from the detection state to the non-detection state, the reference voltage changes one of from a second reference voltage to a first reference voltage and from the first reference voltage to the second reference voltage.

Assignments (3)
CHANGE OF NAME Recorded Mar 12, 2018
From: SII SEMICONDUCTOR CORPORATION
To: ABLIC INC.
Reel/Frame 045567/0927 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 10, 2016
From: SEIKO INSTRUMENTS INC.
To: SII SEMICONDUCTOR CORPORATION
Reel/Frame 038058/0892 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 12, 2010
From: IGARASHI, ATSUSHI; SUGIURA, MASAKAZU
To: SEIKO INSTRUMENTS INC.
Reel/Frame 023951/0795 →