System and method to measure the transit time position(s) of pulses in time domain data
View Patent ↗A system and method to measure, with increased precision, the transit time position(s) of pulses in a time domain data. An example data set would be the transit time of pulses in Time-Domain Terahertz (TD-THz) data. The precision of the pulse timing directly affects the precision of determined sample properties measurements (e.g., thickness). Additionally, an internal calibration etalon structure and algorithm method provides for continuous system precision/accuracy check method to increase sample measurement integrity. The etalon structure can improve the precision of sample property measurements (e.g., absolute thickness). Various hardware and system implementations of the above are described.
1. A system for interpreting a terahertz waveform, the system comprising:
a terahertz transmitter configured to output a pulse of terahertz radiation;
a terahertz receiver configured to receive at least a portion of the pulse of terahertz radiation;
a first optical interface providing optical interference to the pulse of terahertz radiation, wherein the first optical interface will reflect a first optical interface reflected portion of the pulse of terahertz radiation to the terahertz receiver;
a second optical interface providing optical interference to the pulse of terahertz radiation, wherein the second optical interface will reflect a second optical interface reflected portion of the pulse of terahertz radiation to the terahertz receiver;
an etalon spacing being defined between the first optical interface and the second optical interface, the etalon spacing being configured to receive a sample to be irradiated by the pulse of terahertz radiation; and
wherein the sample will reflect a first sample reflected portion of the pulse of terahertz radiation to the terahertz receiver and a second sample reflected portion of the pulse of terahertz radiation to the terahertz receiver.
2. The system of claim 1 , wherein the etalon spacing is fixed.
3. The system of claim 1 , wherein the etalon spacing is a measurable distance.
4. The system of claim 1 , wherein the terahertz receiver is configured to electronically output to a data acquisition system time domain terahertz waveforms, the time domain terahertz waveforms comprising the first optical interface reflected portion, the second optical interface reflected portion, the first sample reflected portion, and the second sample reflected portion.
5. The system of claim 4 , wherein the data acquisition system comprises a processor configured to
select either a peak to peak analysis method, an edge midpoint analysis method, deconvolution analysis method, a model fitting analysis method or a combination of the deconvolution analysis method and a model fitting analysis method for interpreting the at least one time domain terahertz waveform.
6. The system of claim 5 , wherein during the peak to peak analysis method, the processor is configured to:
find a maximum amplitude of at least one time domain terahertz waveform;
find a minimum amplitude of the at least one time domain terahertz waveform;
determine a difference between the a maximum amplitude of the at least one time domain terahertz waveform and the minimum amplitude of the at least one time domain terahertz waveform;
wherein the amplitude difference correlates to a time delay as the pulse of terahertz radiation travels though the sample; and
wherein the time delay correlates to the thickness of the sample.
7. The system of claim 5 , wherein during the edge midpoint analysis method, the processor is configured to:
find a maximum amplitude point of at least one time domain terahertz waveform;
find a minimum amplitude point of the at least one time domain terahertz waveform;
determine which of the maximum amplitude point and minimum amplitude point occurred first with respect to time;
when the minimum amplitude point occurred first with respect to time, finding the minimum amplitude point of the at least one time domain terahertz waveform by stepping back with respect to time along the at least one time domain terahertz waveform from the maximum amplitude point;
when the maximum amplitude point occurred first with respect to time, finding the maximum amplitude point of the at least one time domain terahertz waveform by stepping back with respect to time along the at least one time domain terahertz waveform from the minimum amplitude point;
utilizing linear regression between the minimum amplitude point and the maximum amplitude point to calculate a best fit line between the minimum amplitude point and the maximum amplitude point; and
wherein a pulse time of the at least one time domain terahertz waveform is the midpoint of best fit line between the minimum amplitude point and the maximum amplitude point.
8. The system of claim 5 , wherein during the deconvolution analysis the processor is configured to deconvolve and filter at least one time domain terahertz waveform using a reference waveform to create a deconvolved time domain terahertz waveform.
9. The system of claim 8 , wherein the reference waveform comprises a waveform reflected from a single interference.
10. The system of claim 9 , wherein the reference waveform is modified to account for other factors such as optical interference.
11. The system of claim 8 , wherein the processor is further configured to:
identify the maxima and the minima of the deconvolved filtered waveform;
provide a reference deconvolved filtered waveform; and
best fit the reference deconvolved filtered waveform to at least one feature of the deconvolved filtered waveform to output a time and amplitude of a peak in the deconvolved filtered waveform.
12. The system of claim 11 , wherein the best fit step utilizes a simplex method.
13. The system of claim 5 , wherein during the model fitting analysis, the processor is configured to:
identify the maxima and the minima of at least one time domain terahertz waveform;
provide a reference time domain terahertz waveform; and
best fit the reference time domain terahertz waveform to at least one feature of the at least one time domain terahertz waveform to output a time and amplitude of a peak in the time domain terahertz waveform.
14. The system of claim 13 , wherein the best fit step utilizes a simplex method.
15. The system of claim 1 , wherein a portion of the pulse of terahertz radiation passes more than once through the sample.
16. A system for interpreting a terahertz waveform, the system comprising:
a terahertz transmitter configured to output a pulse of terahertz radiation;
a terahertz receiver configured to receive at least a portion of the pulse of terahertz radiation;
an optical interface providing optical interference to the pulse of terahertz radiation, wherein the optical interface will reflect an optical interface reflected portion of the pulse of terahertz radiation to the terahertz receiver;
wherein the sample will reflect a first sample reflected portion of the pulse of terahertz radiation to the terahertz receiver and a second sample reflected portion of the pulse of terahertz radiation to the terahertz receiver; and
wherein the optical interface is located between the terahertz transmitter and the sample.
17. The system of claim 16 , wherein the terahertz receiver is configured to electronically output to a data acquisition system time domain terahertz waveforms, the time domain terahertz waveforms comprising the optical interface reflected portion, the first sample reflected portion, and the second sample reflected portion.
18. The system of claim 17 , wherein the data acquisition system comprises a processor configured to select either a peak to peak analysis method, an edge midpoint analysis method, deconvolution analysis method, a model fitting analysis method or a combination of the deconvolution analysis method and a model fitting analysis method for interpreting the at least one time domain terahertz waveform.
19. The system of claim 18 , wherein during the peak to peak analysis method, the processor is configured to:
find a maximum amplitude of at least one time domain terahertz waveform;
find a minimum amplitude of the at least one time domain terahertz waveform;
determine a difference between the a maximum amplitude of the at least one time domain terahertz waveform and the minimum amplitude of the at least one time domain terahertz waveform;
wherein the amplitude difference correlates to a time delay as the pulse of terahertz radiation travels though the sample; and
wherein the time delay correlates to the thickness of the sample.
20. The system of claim 18 , wherein during the edge midpoint analysis method, the processor is configured to:
find a maximum amplitude point of at least one time domain terahertz waveform;
find a minimum amplitude point of the at least one time domain terahertz waveform;
determine which of the maximum amplitude point and minimum amplitude point occurred first with respect to time;
when the minimum amplitude point occurred first with respect to time, finding the minimum amplitude point of the at least one time domain terahertz waveform by stepping back with respect to time along the at least one time domain terahertz waveform from the maximum amplitude point;
when the maximum amplitude point occurred first with respect to time, finding the maximum amplitude point of the at least one time domain terahertz waveform by stepping back with respect to time along the at least one time domain terahertz waveform from the minimum amplitude point;
utilizing linear regression between the minimum amplitude point and the maximum amplitude point to calculate a best fit line between the minimum amplitude point and the maximum amplitude point; and
wherein a pulse time of the at least one time domain terahertz waveform is the midpoint of best fit line between the minimum amplitude point and the maximum amplitude point.
21. The system of claim 18 , wherein during the deconvolution analysis the processor is configured to deconvolve and filter at least one time domain terahertz waveform using a reference waveform to create a deconvolved time domain terahertz waveform.
22. The system of claim 21 , wherein the reference waveform comprises a waveform reflected from a single interference.
23. The system of claim 22 , wherein the reference waveform is modified to account for other factors such as optical interference.
24. The system of claim 22 , wherein the processor is further configured to:
identify the maxima and the minima of the deconvolved filtered waveform;
provide a reference deconvolved filtered waveform; and
best fit the reference deconvolved filtered waveform to at least one feature of the deconvolved filtered waveform to output a time and amplitude of a peak in the deconvolved filtered waveform.
25. The system of claim 24 , wherein the best fit step utilizes a simplex method.
26. The system of claim 18 , wherein during the model fitting analysis, the processor is configured to:
identify the maxima and the minima of at least one time domain terahertz waveform;
provide a reference time domain terahertz waveform; and
best fit the reference time domain terahertz waveform to at least one feature of the at least one time domain terahertz waveform to output a time and amplitude of a peak in the time domain terahertz waveform.
27. The system of claim 16 , wherein a portion of the pulse of terahertz radiation passes more than once thought the sample.