Time-to-digital converter with built-in self test
View Patent ↗Apparatuses and methods related to time-to-digital converters (TDCs) are herein described. Generally, a time-to-digital converter is a device which measures a time period or time interval and outputs a digital value representing the measured time period. In an implementation, an apparatus is provided comprising a time-to-digital converter circuit, which further comprises a built-in self test (BIST). The built-in self test may be implemented using one or more oscillators coupled to the time-to-digital converter via one or more multiplexer devices.
1. An apparatus, comprising:
a first input;
a second input;
a time-to-digital converter, said time-to-digital converter comprising a first time-to-digital converter input, a second time-to-digital converter input, a first oscillator, and a second oscillator;
a first multiplexer, a first input of said first multiplexer being coupled with said first input, a second input of said first multiplexer being coupled with an output of said first oscillator, and an output of said first multiplexer being coupled with said first time-to-digital converter input; and
a second multiplexer, a first input of said second multiplexer being coupled with said second input, a second input of said second multiplexer being coupled with an output of said second oscillator, and an output of said second multiplexer being coupled with said second time-to-digital converter input.
2. The apparatus of claim 1 , wherein said first oscillator and said second oscillator are free running oscillators.
3. The apparatus of claim 1 , wherein said first oscillator is configured to output a signal with a first frequency and said second oscillator is configured to output a signal with a second frequency different from said first frequency.
4. The apparatus of claim 3 , wherein said second frequency differs from said first frequency by at most 20%.
5. The apparatus of claim 1 , further comprising an evaluation logic portion coupled to an output of said time-to-digital converter.
6. The apparatus of claim 5 , wherein said evaluation logic portion is configured to evaluate a histogram of output values of said time-to-digital converter.
7. The apparatus of claim 1 , wherein at least one oscillator from the group consisting of said first oscillator and said second oscillator is a frequency variable oscillator.
8. The apparatus of claim 1 , further comprising a control, said control being coupled to at least one element from the group consisting of said first oscillator, said second oscillator, said first multiplexer, and said second multiplexer.
9. The time-to-digital converter of claim 1 , further comprising an alignment detector coupled to an output of said first oscillator and an output of said second oscillator, and being configured to detect a predetermined phase difference between signals output by said first and second oscillators.
10. An apparatus, comprising:
a time-to-digital converter;
a first oscillator configured to generate a first signal with a first frequency;
a second oscillator configured to generate a second signal with a second frequency;
at least one multiplexer configured to selectively couple said first signal to a start input of said time-to-digital converter and said second signal to a stop input of said time-to-digital converter; and
an evaluation logic portion coupled to an output of said time-to-digital converter, and being configured to perform a test of the time-to-digital converter based on output signals responsive to the first and second signal being fed to said time-to-digital converter.
11. The apparatus of claim 10 , wherein said first oscillator and said second oscillator are free running oscillators.
12. The apparatus of claim 10 , wherein said evaluation logic is configured to evaluate a histogram of output values of said time-to-digital converters.
13. The apparatus of claim 12 , wherein said evaluation logic portion is configured to detect in said histogram at least one event selected from the group consisting of a value occurring more often than average, a value occurring less often than average, and a missing value.
14. The apparatus of claim 10 , wherein said evaluation logic is configured to check whether each expected value occurs at said output of said time-to-digital converter.
15. The apparatus of claim 10 , wherein said evaluation logic portion is configured to monitor the occurrence of at least one predetermined value at said output of said time-to-digital converter.
16. The apparatus of claim 10 , wherein said evaluation logic is configured to measure an output value of said time-to-digital converter a predetermined number of periods of said first and second signal after said first and second signals are aligned.
17. The apparatus of claim 10 , wherein said evaluation logic portion is configured to measure a plurality of output values at a predetermined time from an alignment of said first signal and said second signal.
18. The apparatus of claim 10 , further comprising selection circuitry coupled between said first and second oscillators and said time-to-digital converter, and being configured to forward only every Lth event of said first signal, triggering a start of a time period measured by said time-to-digital converter, and only every Lth event of said second signal, triggering a stop of said time period measured to said time-to-digital converter, L being an integer number.
19. An apparatus comprising:
a time-to-digital converter;
a first free running oscillator coupled to a start input of said time-to-digital converter; and
a second free running oscillator coupled to a stop input of said time-to-digital converter.
20. The apparatus of claim 19 ,
wherein said first free running oscillator is coupled with said start input via a first multiplexer, and wherein said second free running oscillator is coupled with said stop input via a second multiplexer.
21. The apparatus of claim 19 , further comprising a state machine configured to control said first oscillator and said second oscillator.
22. A method, comprising:
generating a first oscillation with a first frequency;
generating a second oscillation with a second frequency different from said first frequency;
coupling said first oscillation and said second oscillation to a time-to-digital converter; and
evaluating a distribution of output values output by said time-to-digital converter.
23. The method of claim 22 , wherein said coupling comprises controlling multiplexers.
24. The method of claim 22 , wherein said evaluating comprises evaluating a histogram for at least one of missing values, values that occur more often than average, and values that occur less often than average.
25. The method of claim 22 , further comprising varying a frequency of at least one oscillation of the group consisting of said first oscillation and said second oscillation.