IP Library Granted Patent US 8,233,851
Granted Patent B2
US 8,233,851 · App. 12/699,112 · Granted Jul 31, 2012

Method and apparatus for providing impedance matching for high-frequency signal transmitter

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Quick Facts
Patent No.
US 8,233,851
App. No.
12/699,112
Granted
Jul 31, 2012
Kind
B2
Abstract

In accordance with another representative embodiment, a high-frequency signal transmitter a power amplifier configured to supply a high-frequency signal; an antenna configured to transmit the high-frequency signal; a transmission line configured to transfer the high-frequency signal from the power amplifier to the antenna; and an impedance matching circuit connected to the transmission line. The high-frequency signal transmitter also comprises a mismatch detector. The mismatch detector is configured to designate a comparatively poor linearity region and a comparatively good linearity region by dividing a Smith chart into the two regions based on Adjacent Channel Power Ratio (ACPR) contours drawn on the Smith chart at a point on the transmission line where the impedance matching circuit is connected, to measure a time-dependent reflection coefficient of the high-frequency signal transmitter in terms of a phase and a magnitude, to determine whether the reflection coefficient is located in the comparatively poor linearity region or the comparatively good linearity region, and based on a result of the determination, to improve the linearity of the high-frequency signal transmitter.

Claims (38)

1. A method for improving a linearity of a high-frequency signal transmitter including a power amplifier, an antenna, a transmission line for transferring a high-frequency signal from the power amplifier to the antenna, and an impedance matching circuit connected to the transmission line, the method comprising:

designating a comparatively poor linearity region and a comparatively good linearity region by dividing a Smith chart into the two regions based on Adjacent Channel Power Ratio (ACPR) contours drawn on the Smith chart at a point on the transmission line where the impedance matching circuit is connected;

measuring a time-dependent reflection coefficient of the high-frequency signal transmitter in terms of a phase and a magnitude;

determining whether the reflection coefficient is located in the comparatively poor linearity region or the comparatively good linearity region; and

based on a result of the determining, improving the linearity of the high-frequency signal transmitter.

2. The method of claim 1 , wherein the designating a comparatively poor and a comparatively good linearity regions comprises:

determining a reference ACPR contour among the ACPR contours, a first reference phase and a second reference phase, which is greater than the first reference phase;

designating a region on the Smith chart having magnitudes which lie outside the reference ACPR contour and having phases which lie between the first and the second reference phases as the comparatively poor linearity region; and

designating a remaining region on the Smith chart as the comparatively good linearity region.

3. The method of claim 2 , wherein the measuring a reflection coefficient comprises:

sampling the high-frequency signal transferred from the power amplifier to the antenna to obtain a sampled incident signal;

sampling a reflection signal reflected from the antenna and proceeding to the power amplifier to obtain a sampled reflection signal;

subtracting the sampled reflection signal from the sampled incident signal;

rectifying the subtraction result to obtain a phase comparison voltage;

rectifying the sampled incident signal to obtain a phase reference voltage; and

comparing the phase comparison voltage with the phase reference voltage, and, when the phase comparison voltage is higher than the phase reference voltage, generating a phase signal indicating that the reflection coefficient has a phase lying between the first and the second reference phases.

4. The method of claim 3 , wherein the measuring a reflection coefficient further comprises:

inputting the sampled reflection signal to a gate terminal of a first transistor to obtain a magnitude comparison voltage;

inputting the sampled incident signal to a gate terminal of a second transistor to obtain a magnitude reference voltage; and

comparing the magnitude comparison voltage with the magnitude reference voltage, and, when the magnitude comparison voltage is higher than the magnitude reference voltage, generating a magnitude signal indicating that the reflection coefficient has a magnitude lying outside the reference ACPR contour.

5. The method of claim 4 , wherein the improving a linearity of the high-frequency signal transmitter comprises:

when both the phase signal and the magnitude signal are generated to indicate that the reflection coefficient is located in the comparatively poor linearity region, generating and transmitting a feedback control signal to the impedance matching circuit; and

moving the reflection coefficient from the comparatively poor linearity region to the comparatively good linearity region in response to the feedback control signal to improve the linearity of the high-frequency signal transmitter.

6. The method of claim 4 , wherein the improving a linearity of the high-frequency signal transmitter comprises:

when at least one of the phase signal and the magnitude signal is not generated to indicate that the reflection coefficient is located in the comparatively good linearity region, returning to the step of measuring a reflection coefficient, configured to vary with time, so as to ensure the linearity of the high-frequency signal transmitter.

7. A high-frequency signal transmitter, comprising:

a power amplifier configured to supply a high-frequency signal;

an antenna configured to transmit the high-frequency signal;

a transmission line configured to transfer the high-frequency signal from the power amplifier to the antenna;

an impedance matching circuit connected to the transmission line; and

a mismatch detector configured to: designate a comparatively poor linearity region and a comparatively good linearity region by dividing a Smith chart into the two regions based on Adjacent Channel Power Ratio (ACPR) contours drawn on the Smith chart at a point on the transmission line where the impedance matching circuit is connected; to measure a time-dependent reflection coefficient of the high-frequency signal transmitter in terms of a phase and a magnitude; to determine whether the reflection coefficient is located in the comparatively poor linearity region or the comparatively good linearity region; and based on a result of the determination, to improve the linearity of the high-frequency signal transmitter.

8. The high-frequency signal transmitter of claim 7 , wherein the comparatively poor and the comparatively good linearity regions are designated by determining a reference ACPR contour among the ACPR contours, a first reference phase and a second reference phase, which is greater than the first reference phase; designating a region on the Smith chart having magnitudes which lie outside the reference ACPR contour and having phases which lie between the first and the second reference phases as the comparatively poor linearity region; and designating the remaining region on the Smith chart as the comparatively good linearity region.

9. The high-frequency signal transmitter of claim 8 , wherein the mismatch detector comprises:

a directional coupler for sampling the high-frequency signal transferred from the power amplifier to the antenna to output a sampled incident signal and sampling a reflection signal reflected from the antenna and proceeding to the power amplifier to output a sampled reflection signal; and

a phase detector comprising a subtractor configured to subtract the sampled reflection signal from the sampled incident signal, a first rectifier configured to rectify the sampled incident signal and to output a phase reference voltage, a second rectifier configured to rectify an output signal of the subtractor and to output a phase comparison voltage, and a phase comparator configured to compare the phase comparison voltage with the phase reference voltage, and, when the phase comparison voltage is higher than the phase reference voltage, to generate a phase signal indicating that the reflection coefficient has a phase lying between the first and the second reference phases.

10. The high-frequency signal transmitter of claim 9 , wherein the mismatch detector further includes a magnitude detector having a first transistor comprising a gate terminal which receives the sampled reflection signal to output a magnitude comparison voltage, a second transistor comprising a gate terminal which receives the sampled incident signal to output a magnitude reference voltage, and a magnitude comparator configured to compare the magnitude comparison voltage with the magnitude reference voltage and, when the magnitude comparison voltage is higher than the magnitude reference voltage, to generate a magnitude signal indicating that the reflection coefficient has a magnitude lying outside the reference ACPR contour.

11. The high-frequency signal transmitter of claim 10 , wherein, when both the phase signal and the magnitude signal are generated to indicate that the reflection coefficient is located in the comparatively poor linearity region, the mismatch detector generates and transmits a feedback control signal to the impedance matching circuit, and the impedance matching circuit moves the reflection coefficient from the comparatively poor linearity region to the comparatively good linearity region in response to the feedback control signal so as to improve the linearity of the high-frequency signal transmitter.

12. The high-frequency signal transmitter of claim 11 , wherein the impedance matching circuit comprises a shunt capacitor, and the transmission line is grounded through the shunt capacitor in response to the feedback control signal so as to move the reflection coefficient from the comparatively poor linearity region to the comparatively good linearity region along a conductance circle on the Smith chart in a clockwise direction.

Assignments (8)
CORRECTIVE ASSIGNMENT TO CORRECT THE EFFECTIVE DATE OF MERGER TO 09/05/2018 PREVIOUSLY RECORDED AT REEL: 047230 FRAME: 0133. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER. Recorded Oct 29, 2018
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 047630/0456 →
MERGER Recorded Oct 4, 2018
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 047230/0133 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS Recorded Feb 3, 2017
From: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 041710/0001 →
PATENT SECURITY AGREEMENT Recorded Feb 11, 2016
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
Reel/Frame 037808/0001 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT RIGHTS (RELEASES RF 032851-0001) Recorded Feb 2, 2016
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 037689/0001 →
PATENT SECURITY AGREEMENT Recorded May 8, 2014
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 032851/0001 →
MERGER Recorded May 7, 2013
From: AVAGO TECHNOLOGIES WIRELESS IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 030369/0703 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 3, 2010
From: JEON, JOO YOUNG; JUNG, SANG HWA; KIM, JUNG HYUN; KWON, YOUNG
To: AVAGO TECHNOLOGIES WIRELESS IP (SINGAPORE) PTE. LTD.
Reel/Frame 023889/0800 →