DETECTION APPARATUS FO PARICLE ON THE GLASS
The present invention relates to an apparatus for detecting particles on a flat glass, which detects particles adhered to the flat glass having both sides such as a surface A and a surface B, comprising: a surface A laser light irradiating device for irradiating laser light of a first wavelength polarized in a direction S at a first angle based on a surface A normal vector toward the surface A in an upper part of the surface A of the flat glass; a surface A photographing device for taking a picture of a point where the laser light irradiated by the surface A laser light irradiating device is irradiated on the surface A of the flat glass; a surface B laser light irradiating device for irradiating laser light of a second wavelength toward the surface A at a second angle smaller than the first angle based on the surface A normal vector in the upper part of the surface A of the flat glass, and wherein the irradiated laser light is mostly transmitted in thickness direction of the flat glass; a surface B photographing device for taking a picture of a point where the laser light irradiated by the surface B laser light irradiating device is irradiated on the surface B of the flat glass; and a detection signal processor for analyzing video images inputted from the surface A photographing device and the surface B photographing device, and deciding from which photographing device the particles are more clearly outputted, to decide on a surface to which the particles adhere.
1 . An apparatus for detecting particles on a flat glass, which detects particles adhered to the flat glass having both sides such as a surface A and a surface B, comprising:
a surface A laser light irradiating device for irradiating laser light of a first wavelength polarized in a direction S at a first angle based on a surface A normal vector toward the surface A in an upper part of the surface A of the flat glass;
a surface A photographing device for taking a picture of a point where the laser light irradiated by the surface A laser light irradiating device is irradiated on the surface A of the flat glass;
a surface B laser light irradiating device for irradiating laser light of a second wavelength toward the surface A at a second angle smaller than the first angle based on the surface A normal vector in the upper part of the surface A of the flat glass, and wherein the irradiated laser light is mostly transmitted in thickness direction of the flat glass;
a surface B photographing device for taking a picture of a point where the laser light irradiated by the surface B laser light irradiating device is irradiated on the surface B of the flat glass; and
a detection signal processor for analyzing video images inputted from the surface A photographing device and the surface B photographing device, and deciding on a surface to which the particles adhere.
2 . The apparatus for detecting particles on a flat glass of claim 1 , wherein a filter for selectively transmitting the first wavelength is comprised in the surface A photographing device, while a filter for selectively transmitting the second wavelength is comprised in the surface B photographing device.
3 . The apparatus for detecting particles on a flat glass of claim 1 , wherein the first angle is equal or more than 75 degrees.
4 . The apparatus for detecting particles on a flat glass of claim 3 , wherein the first angle is equal or more than 80 degrees.
5 . The apparatus for detecting particles on a flat glass of claim 1 , wherein the surface B laser light irradiating device is for the laser beam of the second wavelength polarized in the direction P.
6 . The apparatus for detecting particles on a flat glass of claim 5 , wherein the second angle is a Brewster angle.
7 . The apparatus for detecting particles on a flat glass of claim 5 , wherein the second angle is equal or more than 70 degrees.
8 . The apparatus for detecting particles on a flat glass of claim 1 , wherein the laser light irradiated from the surface A laser light irradiating device and the surface B laser light irradiating device has a width (φ) defined in thickness direction of the glass substrate and a thickness (T) defined in width direction of the glass substrate, and the laser light is in oblong shape where the width (φ) is larger than the thickness (T).
9 . The apparatus for detecting particles on a flat glass of claim 1 , wherein the second angle is maintained at equal or less than 40 degrees by exceeding zero degree.