IP Library Granted Patent US 7,816,914
Granted Patent B1
US 7,816,914 · App. 12/709,478 · Granted Oct 19, 2010

Built-in testing and transient avoidance for magnetic sensors

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,816,914
App. No.
12/709,478
Granted
Oct 19, 2010
Kind
B1
Abstract

A magnetic sensor assembly ( 100 ) uses printed circuit boards (PCB) ( 102 ) having a first surface ( 130 ) and an opposite, complementary second surface ( 132 ) to fabricate the sensor devices ( 104 ) and their associated processing circuitry. A trace or conductive element ( 106 ), or pair ( 108 a , 108 b ) of complementary printed traces or conductor elements, on or within the board ( 102 ) are run beneath the magnetic sensor element ( 104 ), with the return trace or traces routed more remotely from the sensor ( 104 ).

Claims (17)

1. A magnetic sensor assembly having a built-in testing capability comprising:

at least one magnetic sensor module for detecting changes in a magnetic field; the magnetic sensor module being mounted essentially external to a first surface of a printed circuit board (PCB) member with the first surface of the PCB being positioned between the magnetic sensor and a second surface of the PCB that is opposite to the first surface of the PCB;

at least one conductive path formed between the magnetic sensor module and the second surface of the PCB for conveying an electronic signal beneath the magnetic sensor module; and

control circuitry means associated with the conductive path for controllably providing the electronic signal to the conductive path to enable testing of the magnetic sensor module.

2. The invention of claim 1 wherein a single conductive path is oriented at approximately a 45 degree angle from a single sensitive axis of the magnetic sensor module.

3. The invention of claim 1 wherein dual conductive paths are oriented at approximately a 90 degree angle from sensitive axes of the magnetic sensor module.

4. The invention of claim 1 wherein the magnetic sensor module is a dual axis sensor.

5. The invention of claim 1 wherein the conductive path is formed within the PCB between the first and second surfaces.

6. The invention of claim 1 wherein a pair or orthogonally oriented conductive paths are formed such that each orthogonal conductive path is able to controllably excite a corresponding sensitive axis of the magnetic sensor module.

7. A method for testing a magnetic sensor assembly of the type including at least one magnetic sensor module for detecting changes in a magnetic field;

the magnetic sensor module being mounted essentially external to a first surface of a printed circuit board (PCB) member with the first surface of the PCB being positioned between the magnetic sensor and a second surface of the PCB that is opposite to the first surface of the PCB, comprising the steps of:

controllably electrically activating at least one conductive path formed between the magnetic sensor module and the second surface of the PCB with an electronic signal beneath the magnetic sensor module for testing the operation of the magnetic sensor; and,

controllably deactivating the conductive path formed between the magnetic sensor module and the second surface of the PCB to restore the magnetic sensor module to normal operation.

8. The method of claim 7 wherein a single conductive path is oriented at approximately a 90 degree angle from a sensitive axis of the magnetic sensor module.

9. The method of claim 7 wherein dual conductive paths are oriented at approximately a 45 degree angle from sensitive axes of the magnetic sensor module.

10. The method of claim 7 wherein the magnetic sensor module is a dual axis sensor.

11. The method of claim 7 wherein the conductive path is formed within the PCB between the first and second surfaces.