Liquid crystal display device with data switching thin film transistor for inspection and inspection method thereof

1. An inspection method of a liquid crystal display device, the method comprising:

forming a pixel matrix in which a plurality of gate lines and a plurality of data lines cross each other and a plurality of liquid crystal cells are arranged, first data switching thin film transistors respectively connected to a first group of the data lines, second data switching thin film transistors respectively connected to a second group of the data lines, a first external wire line connected to data input terminals of the first data switching thin film transistors, a second external wire line connected to data input terminals of the second data switching thin film transistors, a third external wire line connected to control terminals of the first and second data switching thin film transistors, a first external pad for supplying first data to the first external wire line, a second external pad for supplying second data to the second external wire line, and a third external pad for supplying control data to the third external wire line;

connecting a gate drive circuit for supplying a scan pulse to the gate lines; and

supplying the first and second data to the external pads to display a window pattern on the pixel matrix and judging whether there is a cross-talk defect,

wherein the first group of data lines comprises a bunch of adjacent data lines in the middle of the pixel matrix, and

wherein the second group of data lines comprises two bunches of adjacent data lines on either sides of the first group of data lines.

2. The inspection method according to claim 1 , further comprising forming:

gate line driving thin film transistors respectively connected to the gate lines on the liquid crystal display panel;

a fourth external wire line connected to a gate voltage input terminal of the gate line driving thin film transistors;

a fifth external wire line connected to a control terminal of the gate driving thin film transistors;

a fourth external pad for supplying a gate voltage to the fourth external wire line; and

a fifth external pad for supplying a control signal to the fifth external wire line.

3. The inspection method according to claim 2 , wherein the data switching thin film transistors, the gate line driving thin film transistors, the external wire lines and the external pads are formed on the same substrate.

4. The inspection method according to claim 1 , wherein:

the first group of data lines are connected together for receiving a first data; and

the second group of data lines are connected together for receiving a second data.