IP Library Granted Patent US 8,193,622
Granted Patent B2
US 8,193,622 · App. 12/717,012 · Granted Jun 5, 2012

Thermally enhanced thin semiconductor package

Assignee: Fairchild Semiconductor Corporation
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Quick Facts
Patent No.
US 8,193,622
App. No.
12/717,012
Granted
Jun 5, 2012
Kind
B2
Abstract

A semiconductor die package is disclosed. The semiconductor die package includes a semiconductor die comprising an input at a first top semiconductor die surface and an output at a second bottom semiconductor die surface. A leadframe having a first leadframe surface and a second leadframe surface opposite the first leadframe surface is in the semiconductor die package and is coupled to the first top semiconductor die surface. A clip having a first clip surface and a second clip surface is coupled to the second bottom semiconductor die surface. A molding material having exterior molding material surfaces covers at least a portion of the leadframe, the clip, and the semiconductor die. The first leadframe surface and the first clip surface are exposed by the molding material, and the first leadframe surface, the first clip surface, and the exterior molding material surfaces of the molding material form exterior surfaces of the semiconductor die package.

Claims (39)

1. A semiconductor die package comprising:

a mounting surface adapted to be mounted to a printed circuit board;

a semiconductor die comprising an input at a first top semiconductor die surface and an output at a second bottom semiconductor die surface, the second bottom semiconductor die surface facing toward the mounting surface and the first top semiconductor die surface facing away from the mounting surface;

a leadframe having a first leadframe surface and a second leadframe surface opposite the first leadframe surface, wherein the second leadframe surface is coupled to the first top semiconductor die surface using a reflowable solder, the leadframe further having at least one lead with a portion coplanar with the mounting surface;

a clip disposed at the mounting surface, between the semiconductor die and the mounting surface, and having a first clip surface and a second clip surface, wherein the second clip surface is coupled to the second bottom semiconductor die surface; and

a molding material having exterior molding material surfaces and covering at least a portion of the leadframe, the clip, and the semiconductor die,

wherein the first leadframe surface and the first clip surface are exposed by the molding material, and wherein the first leadframe surface, the first clip surface, and the exterior molding material surfaces of the molding material form exterior surfaces of the semiconductor die package.

2. The semiconductor die package of claim 1 wherein the semiconductor die comprises a vertical device.

3. The semiconductor die package of claim 1 wherein the first leadframe surface defines a protruding leadframe portion of the leadframe.

4. The semiconductor die package of claim 3 wherein the first clip surface defines a protruding clip portion of the clip.

5. The semiconductor die package of claim 4 wherein exterior surfaces of the molding material are substantially coplanar with the first clip surface and the first leadframe surface, and wherein the molding material covers edges of the protruding leadframe portion and the protruding clip portion.

6. The semiconductor die package of claim 1 wherein the solder comprises a high temperature solder material and a low temperature solder material.

7. The semiconductor die package of claim 1 wherein the semiconductor die comprises a trenched gate.

8. The semiconductor die package of claim 1 wherein the leadframe comprises copper or a copper alloy.

9. A system comprising the semiconductor die package of claim 1 .

10. The semiconductor die package of claim 1 , wherein the clip is flat.

11. The semiconductor die package of claim 1 , wherein the clip comprises an edge with a region removed therefrom at the first clip surface.

12. The semiconductor die package of claim 11 , wherein a portion of the molding material is disposed in the removed region.

13. The semiconductor die package of claim 1 , wherein the reflowable solder consists of an alloy of metals.

14. The semiconductor die package of claim 1 , wherein the leadframe and the clip are plated with under-bump metallurgy layers.

15. The semiconductor die package of claim 1 , wherein at least one lead of the leadframe extends out of the molding material from a first end of the semiconductor die package with its end being coplanar with the first clip surface, and

wherein a portion of the clip extends out of the molding material from a second end of the semiconductor die package which is opposite to the first end of the semiconductor die package.

16. A method for forming a semiconductor die package, the method comprising:

obtaining a semiconductor die comprising an input at a first top semiconductor die surface and an output at a second bottom semiconductor die surface;

attaching a leadframe having a first leadframe surface and a second leadframe surface opposite the first leadframe surface to the semiconductor die using reflowable solder, wherein the second leadframe surface is coupled to the first top semiconductor die surface;

attaching a clip having a first clip surface and a second clip surface, wherein the second clip surface is coupled to the second bottom semiconductor die surface; and

molding a molding material around at least a portion of the leadframe, the clip, and the semiconductor die,

wherein after molding, the first leadframe surface and the first clip surface are exposed by the molding material, wherein the first clip surface and an exterior surface of the molding material form an exterior mounting surface of the semiconductor die package, the mounting surface adapted to be mounted to a printed circuit board, wherein the first leadframe surface and another exterior surface of the molding material form another exterior surface of the package, wherein the second bottom semiconductor die surface faces toward the exterior mounting surface and the first top semiconductor die surface facing away from the exterior mounting surface, wherein at least one lead of the leadframe has a portion coplanar with the exterior mounting surface, and wherein the clip is disposed at the mounting surface, between the semiconductor die and the mounting surface.

17. The method of claim 16 wherein attaching the clip to the semiconductor die comprises using solder to attach the clip to the semiconductor die.

18. The method of claim 16 further comprising, prior to attaching the leadframe to the semiconductor die, partially etching the leadframe to form a protruding portion comprising the first leadframe surface.

19. The method of claim 18 further comprising, prior to attaching the clip to the semiconductor die, partially etching the clip to form a protruding portion comprising the first clip surface.

20. The method of claim 18 wherein molding comprises using a molding tool with molding dies that contact surfaces of the clip and the leadframe.

21. The method of claim 18 wherein the semiconductor die comprises a vertical MOSFET.

22. The method of claim 18 wherein the leadframe comprises copper.

23. The method of claim 18 wherein attaching the leadframe to the semiconductor die occurs after attaching the clip to the semiconductor die.

24. The method of claim 18 wherein the semiconductor die package is in an array of semiconductor die packages when the semiconductor die package is formed.

25. The method of claim 16 wherein the leadframe is provided by a leadframe precursor structure that has a slot;

wherein the clip further comprises a locator hook; and

wherein attaching the clip comprises fitting the locator hook in the slot.

Assignments (6)
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 058871, FRAME 0799 Recorded Jun 23, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 065653/0001 →
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 040075, FRAME 0644 Recorded Jun 22, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064070/0536 →
SECURITY INTEREST Recorded Nov 12, 2021
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 058871/0799 →
RELEASE OF SECURITY INTEREST Recorded Oct 28, 2021
From: DEUTSCHE BANK AG NEW YORK BRANCH
To: FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 057969/0206 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 3, 2021
From: FAIRCHILD SEMICONDUCTOR CORPORATION
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 057694/0374 →
PATENT SECURITY AGREEMENT Recorded Sep 19, 2016
From: FAIRCHILD SEMICONDUCTOR CORPORATION
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 040075/0644 →
Continuity (5)
Continuation 11845560 · Aug 27, 2007
Continuation In Part 12499893 · Jul 9, 2009
Division 11364399 · Feb 28, 2006
Provisional Application 60755241 · Dec 30, 2005
Related Publication 20100155913A1 · Jun 24, 2010