Method for introducing impurities and apparatus for introducing impurities
A method for introducing impurities includes a step for forming an amorphous layer at a surface of a semiconductor substrate, and a step for forming a shallow impurity-introducing layer at the semiconductor substrate which has been made amorphous, and an apparatus used therefore. Particularly, the step for forming the amorphous layer is a step for irradiating plasma to the surface of the semiconductor substrate, and the step for forming the shallow impurity-introducing layer is a step for introducing impurities into the surface which has been made amorphous.
1. A method for introducing impurities, comprising:
a first step for irradiating a plasma containing He to a surface of a substrate so as to form an amorphous layer at the surface of the substrate, wherein an irradiating time regarding the plasma is not shorter than 5 second (inclusive) and shorter than 70 second (inclusive), and
the substrate is a single crystalline silicon substrate,
a second step for introducing impurities into the surface of the substrate, wherein the second step is a step for plasma-doping the impurities, and
an annealing step after the second step,
wherein the first step is performed at the same time as the second step,
the annealing step is a step for activating the impurities, and
a bias voltage in time of irradiating the plasma is more than 30V (inclusive) and less than 310V (inclusive).
2. The method for introducing impurities of claim 1 , wherein the plasma is primarily comprised of He.
3. The method for introducing impurities of claim 1 , wherein the plasma is comprised of only He.
4. The method for introducing impurities of claim 1 , wherein the first step comprises a step for controlling a thickness of the amorphous layer by changing at least one condition of bias voltage, irradiating time, bias power, ionic species and sheath voltage related to the plasma for irradiating the surface of the substrate.
5. A method for introducing impurities, comprising:
a first step for irradiating plasma containing He to a surface of a film so as to form an amorphous layer at the surface of the film, wherein an irradiating time regarding the plasma is not shorter than 5 second (inclusive) and shorter than 70 second (inclusive), and
the substrate is a single crystalline silicon substrate,
a second step for introducing impurities into the surface of the film, wherein the second step is a step for plasma-doping the impurities, and
an annealing step after the second step,
wherein the first step is performed at the same time as the second step,
the annealing step is a step for activating the impurities, and
a bias voltage in time of irradiating the plasma is more than 30V (inclusive) and less than 310V (inclusive).
6. The method for introducing impurities of claim 5 , wherein the plasma is primarily comprised of He.
7. The method for introducing impurities of claim 5 , wherein the plasma is comprised of only He.
8. The method for introducing impurities of claim 5 , wherein the first step comprises a step for controlling a thickness of the amorphous layer by changing at least one condition of bias voltage, irradiating time, bias power, ionic species and sheath voltage related to the plasma for irradiating the surface of the film.