IP Library Granted Patent US 8,587,042
Granted Patent B2
US 8,587,042 · App. 12/719,729 · Granted Nov 19, 2013

Magnetoresistive random access memory device

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Quick Facts
Patent No.
US 8,587,042
App. No.
12/719,729
Granted
Nov 19, 2013
Kind
B2
Abstract

An aspect of the present disclosure, there is provided a magnetoresistive random access memory device, including, an active area formed on a semiconductor substrate in a first direction, a magnetoresistive effect element formed on the active area and storing data by a change in resistance value, a gate electrode of a cell transistor formed on each side of the magnetoresistive effect element on the active area in a second direction, a bit line contact formed on the active area and arranged alternately with the magnetoresistive effect element, a first bit line connected to the magnetoresistive effect, and a second bit line connected to the bit line contact.

Claims (48)

1. A magnetoresistive random access memory device, comprising:

a plurality of memory cells, each of the memory cells comprising:

a magnetoresistive effect element above an active area extending in a first direction on a semiconductor substrate, the magnetoresistive effect element configured to store data from a change in a resistance value;

a pair of cell transistors on the active area on both sides of the magnetoresistive effect element, a gate electrode of each of the cell transistors being in a second direction orthogonal to the first direction;

a pair of bit line contacts on the active area on a side of each of the gate electrodes opposite to the magnetoresistive effect element;

a first bit line in the first direction connected to the magnetoresistive effect element; and

a second bit line in the first direction connected to the bit line contacts,

wherein each of the bit line contacts is shared by each of the adjacent memory cells and a width of the active area in the second direction is substantially the same as the width of the bit line contacts.

2. The device of claim 1 , wherein

at least one of the active area, the first bit line and the second bit line comprises a curvilinear shape.

3. The device of claim 1 , wherein

the first bit line comprises a linear shape, and the second bit line comprises a first oblique linear shape with respect to the first bit line.

4. The device of claim 1 , wherein

a width of the gate electrode of the cell transistor in the first direction and a distance between the adjacent gate electrodes in the first direction are substantially the same as the width of the bit line contacts.

5. The device of claim 1 , wherein

a height of the first bit line from the semiconductor substrate and a height of the second bit line from the semiconductor substrate are different.

6. The device of claim 5 , wherein

a height of the first bit line from the semiconductor substrate is higher than a height of the second bit line from the semiconductor substrate.

7. The device of claim 1 , wherein

each of the cell transistors comprises shared source/drain regions in the active area to share each of the shared source/drain regions with a cell transistor of each of the adjacent cells.

8. The device of claim 7 , wherein

the magnetoresistive effect element is above one of the shared source/drain regions, and a bottom of a ferromagnetic material layer in a lower portion of the magnetoresistive effect element and the one of the shared source/drain regions are connected to each other through a contact, and the bit line contact is on the other of the shared source/drain region.

9. The device of claim 1 , wherein the active area is a strip shape along the first direction.

10. A magnetoresistive random access memory device, comprising:

a plurality of memory cells, each of the memory cells comprising:

a magnetoresistive effect element above an active area extending in a first direction on a semiconductor substrate, the magnetoresistive effect element configured to store data from a change in a resistance value;

a pair of cell transistors on the active area on both sides of the magnetoresistive effect element, a gate electrode of each of the cell transistors being in a second direction orthogonal to the first direction;

a pair of bit line contacts on the active area on a side of each of the gate electrodes opposite to the magnetoresistive effect element;

a first bit line in the first direction connected to the magnetoresistive effect element; and

a second bit line in the first direction connected to the bit line contacts,

wherein each of the bit line contacts is shared by each of the adjacent memory cells and a width of the active area in the second direction is substantially smaller than twice as large as a width of the bit line contact in the second direction.

11. The device of claim 10 , wherein

at least one of the active area, the first bit line and the second bit line comprises a curvilinear shape.

12. The device of claim 10 , wherein

the first bit line comprises a linear shape, and the second bit line comprises a first oblique linear shape with respect to the first bit line.

13. The device of claim 10 , wherein

a width of the gate electrode of the cell transistor in the first direction and a distance between the adjacent gate electrodes are substantially the same as the width of the bit line contacts.

14. The device of claim 10 , wherein

a height of the first bit line from the semiconductor substrate and a height of the second bit line from the semiconductor substrate are different.

15. The device of claim 14 , wherein

a height of the first bit line from the semiconductor substrate is higher than a height of the second bit line from the semiconductor substrate.

16. The device of claim 10 , wherein

the first bit line and the second bit line intersect with each other from a top view.

17. The device of claim 10 , wherein

each of the cell transistors, comprise shared source/drain regions to share each of the shared source/drain regions with a cell transistor of each of the adjacent cells.

18. The device of claim 17 , wherein

the magnetoresistive effect element is above one of the shared source/drain region, and a bottom of a ferromagnetic material layer in a lower portion of the magnetoresistive effect element and the one of the shared source/drain regions are connected to each other through a contact, and the bit line is on the other of the shared source/drain region.

19. The device of claim 10 , wherein the active area is a strip shape along the first direction.

Assignments (5)
MERGER Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: K.K. PANGEA
Reel/Frame 055659/0471 →
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 055669/0001 →
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 055669/0401 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 24, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043709/0035 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 8, 2010
From: KAJIYAMA, TAKESHI
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 024047/0119 →