IP Library Granted Patent US 8,258,600
Granted Patent B2
US 8,258,600 · App. 12/720,132 · Granted Sep 4, 2012

Capacitor element and semiconductor device

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,258,600
App. No.
12/720,132
Granted
Sep 4, 2012
Kind
B2
Abstract

A semiconductor device includes a capacitor element including a first comb-shaped interconnection formed over a substrate and including a first comb tooth, a second comb-shaped interconnection formed over the substrate and including a second comb tooth opposed to the first comb tooth, and a first electrode and a second electrode opposed to each other with opposed surfaces of the first electrode and the second electrode intersecting a longitudinal direction of the first comb tooth and the second comb tooth, a first dielectric layer formed between the first electrode and the second electrode, the first electrode being connected to the first comb tooth, and the second electrode being connected to the second comb tooth.

Claims (101)

1. A capacitor element comprising:

a first comb-shaped interconnection formed over a substrate and including a first comb tooth;

a second comb-shaped interconnection formed over the substrate and including a second comb tooth formed in parallel with the first comb tooth;

a first electrode and a second electrode opposed to each other, a normal direction of opposed surfaces of the first electrode and the second electrode being parallel with a longitudinal direction of the first comb tooth and the second comb tooth; and

a first dielectric layer formed between the first electrode and the second electrode,

the first electrode being connected to the first comb tooth, and

the second electrode being connected to the second comb tooth.

2. The capacitor element according to claim 1 , further comprising

a third electrode and a fourth electrode opposed to each other with opposed surfaces of the third electrode and the fourth electrode intersecting the longitudinal direction of the first comb tooth and the second comb tooth,

the first comb-shaped interconnection further including a third comb tooth parallel with the first comb tooth,

the second comb-shaped interconnection further including a fourth comb tooth parallel with the second comb tooth, and

the third electrode being connected to the third comb tooth, and

the fourth electrode being connected to the fourth comb tooth.

3. The capacitor element according to claim 1 , further comprising:

a fifth electrode formed below the first electrode and including a top connected to the first comb-shaped interconnection;

a sixth electrode formed below the second electrode and including a top connected to the second comb-shaped interconnection and opposed to the fifth electrode; and

a second dielectric layer formed between the fifth electrode and the sixth electrode.

4. The capacitor element according to claim 1 , further comprising:

a third comb-shaped interconnection formed over the substrate and including a fifth comb tooth; and

a fourth comb-shaped interconnection formed over the substrate and having a sixth comb tooth opposed to the fifth comb tooth,

a top of the first electrode being connected to the fifth comb tooth, and

a top of the second electrode being connected to the sixth comb tooth.

5. The capacitor element according to claim 1 , wherein

the first electrode or the second electrode is formed of conduction layers and conductor plugs alternately stacked.

6. The capacitor element according to claim 2 , wherein

the third electrode or the fourth electrode is formed of conduction layers and conductor plugs alternately stacked.

7. The capacitor element according to claim 1 , wherein

the first electrode or the second electrode is formed of a plurality of conduction layers stacked.

8. The capacitor element according to claim 2 , wherein

the third electrode and the fourth electrode is formed of a plurality of conduction layers stacked.

9. The capacitor element according to claim 5 , wherein

one conduction layer of a plurality of the conduction layers and another conduction layer formed over said one conduction layer are connected via a plurality of the conductor plugs formed directly on said one conduction layer.

10. The capacitor element according to claim 9 , wherein

said a plurality of conductor plugs are formed on both ends of said one conduction layer.

11. The capacitor element according to claim 2 , wherein

the second comb tooth are arranged between the first comb tooth and the third comb tooth, and

the third comb tooth are arranged between the second comb tooth and the fourth comb tooth.

12. The capacitor element according to claim 1 , wherein

the first comb-shaped interconnection and the second comb-shaped interconnection are formed of polycrystalline silicon, a metal containing Cu or a metal containing Al.

13. A semiconductor device comprising a capacitor element formed over a semiconductor substrate,

the capacitor element including

a first comb-shaped interconnection formed over the substrate and including a first comb tooth;

a second comb-shaped interconnection formed over the substrate and including a second comb tooth formed in parallel with the first comb tooth;

a first electrode and a second electrode opposed to each other, a normal direction of opposed surfaces of the first electrode and the second electrode being parallel with a longitudinal direction of the first comb tooth and the second comb tooth; and

a first dielectric layer formed between the first electrode and the second electrode, the first electrode being connected to the first comb tooth, and the second electrode being connected to the second comb tooth.

14. The semiconductor device according to claim 13 , wherein

the capacitor element further includes a third electrode formed below the first electrode and including a top connected to the first comb-shaped interconnection; a fourth electrode formed below the second electrode and including a top connected to the second comb-shaped interconnection and opposed to the third electrode; and a second dielectric layer formed between the third electrode and the fourth electrode.

15. The semiconductor device according to claim 13 , wherein

the capacitor element further includes a third comb-shaped interconnection formed over the substrate and having a fifth comb tooth; and a fourth comb-shaped interconnection formed over the substrate and including a sixth comb tooth opposed to the fifth comb tooth, a top of the first electrode connected to the fifth comb tooth, and a top of the second electrode being connected to the sixth comb tooth.

16. A capacitor element comprising:

a first conductive layer formed above a substrate, the first conductive layer includes a first conductive pattern extending to a first direction and connected to a plurality of second conductive patterns extending to a second direction different from the first direction, and a third conductive pattern extending to the first direction and connected to a plurality of fourth conductive patterns extending to the second direction, the second conductive patterns and the fourth conductive patterns are arranged alternately each other;

a first insulation film formed above the first conductive layer;

a plurality of first conductive plugs formed in the first insulation film and connected to the second conductive patterns;

a plurality of second conductive plugs formed in the first insulation film and connected to the fourth conductive patterns;

a second conductive layer formed above the first insulation film, the second conductive layer includes a plurality of fifth conductive pattern extending to the first direction and connected to the first conductive plugs, and a plurality of sixth conductive patterns extending to the first direction and connected to the second conductive plugs;

a second insulation film formed above the first insulation film;

a plurality of third conductive plugs formed in the second insulation film and on the fifth conductive patterns;

a plurality of fourth conductive plugs formed in the second insulation film and on the sixth conductive patterns; and

a third conductive layer formed above the second insulation film, the third conductive layer includes a plurality of seventh conductive patterns extending to the first direction and formed on the third conductive plugs, and a plurality of eighth conductive patterns extending to the first direction and formed on the fourth conductive plugs.

17. The capacitor element according to claim 16 , wherein

the fifth conductive patterns and the sixth conductive patterns are arranged alternately.

18. The capacitor element according to claim 17 , wherein

the fifth conductive patterns locates above one of the fourth conductive patterns; and

the sixth conductive patterns locates above one of the second conductive patterns.

19. The capacitor element according to claim 18 , wherein

each of the fifth conductive patterns is connected to at least two plugs included in plurality of the third conductive plugs; and

each of the sixth conductive patterns is connected to at least two plugs included in plurality of the fourth conductive plugs.

20. The capacitor element according to claim 19 , wherein

each of the seventh conductive patterns are connected to at least two plugs included in plurality of the third conductive plugs, and

each of the eighth conductive patterns are connected to at least two plugs included in plurality of the fourth conductive plugs.

21. The capacitor element according to claim 16 , wherein;

in a first region, a first plug included in plurality of the first conductive plugs is connected to a first pattern included in plurality of the second conductive patterns;

in a second region, a second plug included in plurality of the second conductive plugs is connected to a second pattern included the fourth conductive patterns;

the first plug is located nearest to the first conductive pattern among plurality of the first conductive plugs connected to the first pattern;

the second plug is located nearest to the first conductive pattern among plurality of the second conductive plugs connected to the second pattern; and

a first distance between the first region and the first conductive pattern is different from a second distance between the second region and the first conductive pattern.

22. The capacitor element according to claim 16 , further comprising:

a third insulation film formed above the second insulation film;

a plurality of fifth conductive plugs formed in the third insulation film and connected to the seventh conductive patterns;

a plurality of sixth conductive plugs formed in the third insulation film and connected to the eighth conductive patterns; and

a fourth conductive layer formed above the third insulation film, the fourth conductive layer includes ninth conductive pattern extending to the first direction and connected to a plurality of tenth conductive patterns extending to the second direction, and a eleventh conductive pattern extending to the first direction and connected to a plurality of twelfth conductive patterns extending to the second direction, the tenth conductive patterns and the twelfth conductive patterns are arranged alternately each other;

wherein the tenth conductive patterns are connected to the fifth conductive plugs, and the twelfth conductive patterns are connected to the sixth conductive plugs.

23. The capacitor element according to claim 16 , further comprising:

a fourth insulation film formed under the first conductive layer;

a plurality of seventh conductive plugs formed in the fourth insulation film and connected to the second conductive patterns;

a plurality of eighth conductive plugs formed in the fourth insulation film and connected to the fourth conductive patterns;

a fifth conductive layer formed under the fourth insulation film, the fifth conductive layer includes a plurality of thirteenth conductive patterns extending to the first direction and connected to the seventh conductive plugs, and a plurality of fourteenth conductive patterns extending to the first direction and connected to the eighth conductive plugs.

24. A method of manufacturing a capacitor element comprising:

forming a first conductive layer above a substrate, the first conductive layer includes a first conductive pattern extending to a first direction and connected to a plurality of second conductive patterns extending to a second direction different from the first direction, and a third conductive pattern extending to the first direction and connected to a plurality of fourth conductive patterns extending to the second direction, the second conductive patterns and the fourth conductive patterns are arranged alternately each other;

forming a first insulation film above the first conductive layer;

etching the first insulation film to form a plurality of first tranches and a plurality of first contact holes reaching the second conductive patterns, and to form a plurality of second tranches and a plurality of second contact holes reaching the fourth conductive patterns;

forming a first conductive film over the first insulation film, in the first contact holes, in the second contact holes, in the first trenches and in the second tranches;

polishing the first conductive film over the first insulation film to form a plurality of first conductive plugs, a plurality of second conductive plugs, a plurality of fifth conductive patterns and a plurality of sixth conductive patterns, wherein the fifth conductive patterns and the sixth conductive patterns extends to the first direction;

forming a second insulation film above the first insulation film;

etching the second insulation film to form a plurality of third tranches and a plurality of third contact holes reaching the fifth conductive patterns, and to form a plurality of fourth tranches and a plurality of fourth contact holes reaching the sixth conductive patterns;

forming a second conductive film over the second insulation film, in the third contact holes, in the fourth contact holes, in the third trenches and in the fourth tranches;

polishing the second conductive film over the second insulation film to form a plurality of third conductive plugs, a plurality of fourth conductive plugs, a plurality of seventh conductive patterns and a plurality of eighth conductive patterns, wherein the seventh conductive patterns and the eighth conductive patterns extends to the first direction.

25. The method of manufacturing the capacitor element according to claim 24 , further comprising:

forming a barrier metal in the first contact holes, in the second contact holes, in the first trenches, and in the second tranches before forming the first conductive film.

26. The method of manufacturing the capacitor element according to claim 25 , wherein;

the first conductive film includes Cu.

Assignments (8)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 17, 2025
From: FUJITSU LIMITED
To: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
Reel/Frame 073964/0516 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 27, 2024
From: FUJITSU LIMITED
To: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
Reel/Frame 069454/0333 →
MERGER Recorded May 24, 2023
From: FUJITSU SEMICONDUCTOR LIMITED
To: FUJITSU LIMITED
Reel/Frame 064221/0545 →
CHANGE OF NAME AND CHANGE OF ADDRESS Recorded Jul 16, 2020
From: AIZU FUJITSU SEMICONDUCTOR LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 053481/0962 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 14, 2020
From: FUJITSU SEMICONDUCTOR LIMITED
To: AIZU FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 053209/0468 →
CHANGE OF ADDRESS Recorded Dec 23, 2016
From: FUJITSU SEMICONDUCTOR LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 041188/0401 →
CHANGE OF NAME Recorded Jul 9, 2010
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 024651/0744 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 11, 2010
From: SUGISAKI, TSUYOSHI; KURATA, HAJIME
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 024062/0532 →