IP Library Granted Patent US 8,301,408
Granted Patent B2
US 8,301,408 · App. 12/720,355 · Granted Oct 30, 2012

Temperature prediction transmitter

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Quick Facts
Patent No.
US 8,301,408
App. No.
12/720,355
Granted
Oct 30, 2012
Kind
B2
Abstract

A system and method is pro vided for predicting a physical quality such as temperature, the measurement of which tends to be hindered by a time-related impediment. A single sensor is configured to detect, in real time, the physical quality Q detect , and one or more infinite impulse response filters are configured with time constants correlated to the time-related impediment. The infinite impulse filter(a) are configured to filter Q detect to output a filtered quality measurement (Q filtered ). A processor is configured to calculate, in real time, the estimated or predicted quality Q estimate using Q detect and Q filtered .

Claims (75)

1. A system for predicting a physical quality with an impediment to accurate measurement, comprising:

a sensor configured to detect, in real time, the physical quality (Q detect ), wherein measurement of the physical quality is subject to a time-related impediment;

a first infinite impulse response filter configured to filter Q detect and to output a first filtered quality measurement (Q filtered1 );

a processor configured to calculate, in real time, the estimated quality Q estimate using Q detect and Q filtered1 ; a second infinite impulse response filter configured to filter Q filtered1 and to output a second filtered quality measurement (Q filtered2 );

wherein said processor is configured to calculate the estimated quality Q estimate using Q filtered1 and Q filtered2 ; an additional infinite impulse response filter configured to filter Q filtered1 and to output an additional filtered quality measurement (Q filteredadd );

wherein said processor is configured to calculate the estimated quality Q estimate using Q filteredadd ; and wherein said processor is configured to calculate the estimated quality Q estimate using the formula Q estimate =Q detect +(Q detect −Q filtered2 )+(Q detect −Q filteredadd ).

2. The system of claim 1 , wherein the quality comprises temperature of a material and the impediment comprises a barrier disposed between the sensor and the material.

3. The system of claim 2 , wherein the material comprises a process fluid and the barrier comprises a casing disposed about the temperature sensor, wherein the casing is configured for extension into process fluid flow.

4. The system of claim 3 , comprising:

a second infinite impulse response filter configured to filter Q filtered1 and to output a second filtered quality measurement (Q filtered2 ); and

wherein said processor is configured to calculate the estimated quality Q estimate using Q filtered1 and Q filtered2 .

5. The system of claim 4 , comprising no more than one temperature sensor.

6. The system of claim 4 , comprising an additional infinite impulse response filter.

7. The system of claim 4 , wherein said first infinite impulse response filter is configured to employ a first time constant (τ 1 ) correlated to the time-related impediment.

8. The system of claim 7 , wherein said second infinite impulse response filter is configured to employ a second time constant (τ 2 ) correlated to the time-related impediment.

9. The system of claim 8 , wherein τ 2 is greater than or substantially equal to τ 1 .

10. The system of claim 1 , wherein said processor is configured for calculation of Q estimate by subtracting the value of Q filtered2 from twice the value of Q filtered1 .

11. The system of claim 1 , wherein said processor is configured for calculation of Q estimate by calculating the difference between Q filtered1 and Q filtered2 , and adding the difference to Q filtered1 .

12. The system of claim 1 , wherein said processor is configured for recording of a plurality of data points of Q detected over time.

13. The system of claim 12 , wherein said processor is configured for determining the slope of Q detected at the plurality of data points.

14. The system of claim 13 , wherein said processor is configured for determining Q estimate using the slope of Q detected at said plurality of data points.

15. The system of claim 14 , wherein said processor is configured for determining a final value for Q estimate , denoted as Q estimatefinal , by the formula Q estimatefinal =(SlopeQ detected ×K)+(Q estimate ), wherein K is a constant having a value correlated to the time-related impediment.

16. A method for transforming physical quality data into an estimated measured quality, comprising:

a) obtaining, with a sensor in real time, data representing a physical quality (Q detect ), wherein an impediment exists to the detection of the physical quality;

b) filtering Q detect through a first IIR filter (IIR 1 ), wherein the IIR outputs Q filtered1 ;

c) calculating, with a processor in real time, the estimated measured quality (Q estimate ) using (Q filterd1 and Q detect ; and

d) filtering Q filtered1 through another infinite impulse response filter configured to output another filtered quality measurement (Q filtered2 ); and

wherein said calculating (c) includes calculating the estimated quality Q estimate using Q filtered1 and Q filtered2 .

17. The method of claim 16 , wherein said obtaining (a) comprises obtaining, with a temperature sensor, data representing a physical quality (Q detect ) in the form of temperature, wherein the impediment comprises a barrier disposed between the temperature sensor and the material; and said filtering (b) and calculating (c) is effected by a temperature compensation transmitter.

18. The method of claim 17 , wherein the material comprises a process fluid and the barrier comprises a casing disposed about the temperature sensor, wherein the casing is configured for extension into process fluid flow.

19. The method of claim 18 , further comprising:

e) disposing the temperature sensor within the casing; and

f) inserting the casing into the process fluid flow.

20. The method of claim 16 , wherein said calculating (c) comprises calculating, with the processor, Q estimate by subtracting the value of Q filtered2 from twice the value of Q filtered1 .

21. The method of claim 16 , wherein said calculating (c) comprises calculating, with the processor, Q estimate by calculating the difference between Q filtered1 and Q filtered2 , and adding the difference to Q filtered1 .

22. The method of claim 16 , comprising configuring the infinite impulse response filter to employ a first time constant (τ 1 ) correlated to the time-related impediment.

23. The method of claim 22 , comprising configuring the other infinite impulse response filter to employ a second time constant (τ 2 ) correlated to the time-related impediment.

24. The method of claim 16 , comprising:

filtering Q filtered1 through an additional infinite impulse response filter configured to output an additional filtered quality measurement (Q filteredadd ); and

wherein said calculating (c) includes calculating the estimated quality Q estimate using Q filtered1 Q filtered2 and Q filteredadd .

25. The system of claim 24 , wherein said processor is configured to calculate the estimated quality Q estimate using the formula Q estimate =Q filtered1 +(Q filtered1 −Q filtered2 )+(Q filtered1 −Q filteredadd ).

26. The method of claim 16 , comprising recording, with the processor, a plurality of data points of Q detected over time.

27. The method of claim 26 , comprising determining, with the processor, in real time, the slope of Q detected at the plurality of data points.

28. The method of claim 27 , wherein said calculating (c) comprises determining Q estimate using the slope of Q detected at the plurality of data points.

29. The method of claim 28 , wherein said calculating (c) comprises calculating with the processor in real time, a final value for Q estimate , denoted as Q estimatefinal , by the formula Q estimatefinal =(SlopeQ detected ×K)+(Q estimate ), wherein K is a constant having a value correlated to the time-related impediment.

30. A system for predicting a physical quality with an impediment to accurate measurement, comprising:

a sensor configured to detect, in real time, the physical quality (Q detect ), wherein measurement of the physical quality is subject to a time-related impediment;

a first infinite impulse response filter configured to filter Q detect and to output a first filtered quality measurement (Q filtered1 );

a processor configured to calculate, in real time, the estimated quality Q estimate using Q detect and Q filtered1 ;

a second infinite impulse response filter configured to filter Q filtered1 and to output a second filtered quality measurement (Q filtered2 ); and

wherein said processor is configured to calculate the estimated quality Q estimate using Q filtered1 and Q filtered2 ;

wherein the quality comprises temperature of a material and the impediment comprises a barrier disposed between the sensor and the material;

wherein the material comprises a process fluid and the barrier comprises a casing disposed about the temperature sensor; and

wherein the casing is configured for extension into process fluid flow.

31. The system of claim 30 , comprising no more than one temperature sensor.

32. The system of claim 30 , comprising an additional infinite impulse response filter.

33. The system of claim 30 , wherein said first infinite impulse response filter is configured to employ a first time constant (τ 1 ) correlated to the time-related impediment.

34. The system of claim 33 , wherein said second infinite impulse response filter is configured to employ a second time constant (τ 2 ) correlated to the time-related impediment.

35. The system of claim 34 , wherein τ 2 is greater than or substantially equal to τ 1 .

36. The system of claim 35 , wherein said processor is configured for calculation of Q estimate by subtracting the value of Q filtered2 from twice the value of Q filtered1 .

37. The system of claim 35 , wherein said processor is configured for calculation of Q estimate by calculating the difference between Q filtered1 and Q filtered2 , and adding the difference to Q filtered1 .

38. A method for transforming physical quality data into an estimated measured quality, comprising:

a) obtaining, with a sensor in real time, data representing a physical quality Q detect ), wherein an impediment exists to the detection of the physical quality;

b) filtering Q detect through a first IIR filter (IIR 1 ), wherein the IIR 1 outputs Q filtered1 ;

c) calculating, with a processor in real time, the estimated measured quality (Q estimate ) using Q filtered1 and Q detect ; and further comprising recording, with the processor, a plurality of data points of Q detected over time and determining, with the processor, in real time, the slope of Q detected at the plurality of data points.

39. The method of claim 38 , wherein said calculating (c) comprises determining Q estimate using the slope of Q detected at the plurality of data points.

40. The method of claim 34 , wherein said calculating (c) comprises calculating with the processor in real time, a final value for Q estimate , denoted as Q estimatefinal , by the formula Q estimatefinal =(SlopeQ detected ×K)+(Q estimate ), wherein K is a constant having a value correlated to the time-related impediment.

41. A system for predicting a physical quality with an impediment to accurate measurement, comprising:

a sensor configured to detect, in real time, the physical quality (Q detect ), wherein measurement of the physical quality is subject to a time-related impediment;

a first infinite impulse response filter configured to filter Q detect and to output a first filtered quality measurement (Q filtered1 );

a processor configured to calculate, in real time, the estimated quality Q estimate using Q detect ,

wherein said processor is configured for recording of a plurality of data points of Q detected over time; and

wherein said processor is configured for determining the slope of Q detected at the plurality of data points.

42. The system of claim 41 , wherein said processor is configured for determining Q estimate using the slope of Q detected at said plurality of data points.

43. The system of claim 42 , wherein said processor is configured for determining a final value for Q estimate , denoted as Q estimatefinal , by the formula Q estimatefinal =(SlopeQ detected ×K)+(Q estimate ), wherein K is a constant having a value correlated to the time-related impediment.

Assignments (2)
CHANGE OF NAME Recorded Jul 31, 2017
From: INVENSYS SYSTEMS, INC.
To: SCHNEIDER ELECTRIC SYSTEMS USA, INC.
Reel/Frame 043379/0925 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 9, 2010
From: HOWE, SPENCER K.
To: INVENSYS SYSTEMS, INC.
Reel/Frame 024053/0112 →