Surface deformation measuring system with a retro-reflective surface treatment
View Patent ↗A system for measuring deformation of at least one surface of an object including an interferometer for receiving illumination reflected from the surface of the object, and a surface treatment disposed on the surface of the object for providing a retro-reflective patina. The retro-reflective patina is configured to reflect the illumination from the surface of the object. The retro-reflective patina is attached to the surface of the object and may include a plurality of cube corners, or a plurality of dielectric spheres, or a combination of cube corners and dielectric spheres. Impinging light onto the object is provided by an optical source that may be separate from or integral to the interferometer. The impinging light may be directed toward the object through an objective lens, which is also used for receiving the illumination from the object. Alternatively, the impinging light may be directed toward the object by first bypassing the objective lens.
1. A system for testing a surface of an object comprising:
an interferometer for receiving illumination reflected from the surface of the object,
a surface treatment disposed on the surface of the object for providing a retro-reflective patina, and
an objective lens disposed between the interferometer and the surface treatment for producing a speckle image of at least a portion of the surface of the object,
wherein the retro-reflective patina is configured to substantially retro-reflect the illumination from the surface of the object, and
the retro-reflective patina is attached to the surface of the object by an electroplating technique.
2. The system in claim 1 wherein
the retro-reflective patina includes a plurality of cube corners.
3. The system in claim 1 wherein
the retro-reflective patina includes a plurality of dielectric spheres.
4. The system in claim 1 wherein
the retro-reflective patina includes a combination of cube corners and dielectric spheres.
5. The system in claim 1 including
an illumination source for impinging illumination onto the surface of the object,
wherein the retro-reflective patina reflects light from the surface of the object within 4 degrees of a line parallel to the impinging illumination.
6. The system in claim 1 including
an illumination source for impinging illumination onto the surface of the object,
wherein the retro-reflective patina reflects light from the surface of the object within 20 degrees of a line parallel to the impinging illumination.
7. The system in claim 1 including
an illumination source for impinging illumination onto the surface of the object, and
the objective lens configured to receive the illumination from the surface of the object and pass the illumination toward the interferometer.
8. The system in claim 7 wherein
the illumination source and the objective lens are not co-axial.
9. The system in claim 1 including
an absolute distance measuring device for monitoring a location of the object relative to the interferometer.
10. A method for measuring a topology of an object using speckle interferometry comprising the steps of:
disposing retro-reflective elements (RREs) on at least one surface of the object,
impinging light onto the at least one surface of the object,
measuring, using a speckle interferometer, returned light from the at least one surface of the object to determine the topology of the object, and
monitoring the location of the object relative to the interferometer by using an absolute distance measuring device.
11. The method of claim 10 wherein the step of disposing RREs includes:
fastening dielectric beads to the at least one surface of the object.
12. The method of claim 10 wherein the step of disposing RREs includes:
adhering a retro-reflective tape to the at least one surface of the object.
13. The method of claim 10 wherein the step of disposing RREs includes:
fastening optical cube corners to the at least one surface of the object.
14. The method of claim 10 wherein the step of disposing RREs includes:
spatially distributing the RREs in a random manner.
15. The method of claim 10 wherein the step of disposing RREs includes:
spatially distributing the RREs in a structured manner.
16. The method of claim 10 wherein the step of measuring the returned light includes:
using a camera to record images of the returned light from the RREs disposed on the at least one surface of the object.
17. A system for testing a surface of an object comprising:
an interferometer for receiving illumination reflected from the surface of the object,
a surface treatment disposed on the surface of the object for providing a retro-reflective patina, and
an objective lens disposed between the interferometer and the surface treatment for producing a speckle image of at least a portion of the surface of the object,
wherein the retro-reflective patina is configured to substantially retro-reflect the illumination from the surface of the object, and
an absolute distance measuring device for monitoring a location of the object relative to the interferometer.
18. The system in claim 17 wherein
the retro-reflective patina is adhered to the surface of the object.
19. The system in claim 17 wherein
the retro-reflective patina includes a plurality of cube corners.
20. The system in claim 17 wherein
the retro-reflective patina includes a plurality of dielectric spheres.