Voltage regulator and cooling control integrated circuit
View Patent ↗According to an embodiment of the invention, an apparatus is provided which includes a microprocessor, and a built-in temperature sensor configured to measure a temperature of the microprocessor as a reference temperature. The apparatus further includes external temperature sensors, where at least one of the external temperature sensors is configured to measure the temperature of the microprocessor. The microprocessor is configured to make an external temperature calibration using the reference temperature measured by the built-in temperature monitor. Each of the external temperature sensors is configured to monitor temperature information of a component and provide the temperature information to the microprocessor.
1. A method, comprising:
measuring a temperature;
determining whether the measured temperature is higher than a first threshold;
when the measured temperature is higher than the first threshold,
determining whether a speed of a cooling fan is less than a maximum speed of the cooling fan;
when the speed of the cooling fan is less than the maximum speed of the cooling fan,
increasing the speed of the cooling fan;
when the speed of the cooling fan is equal to the maximum speed of the cooling fan,
determining whether a voltage generated by a voltage regulator can be decreased; and
when the voltage generated by the voltage regulator can be decreased, decreasing the voltage generated by the voltage regulator.
2. The method of claim 1 , further comprising:
determining whether the measured temperature is lower than a second threshold;
when the measured temperature is lower than the second threshold, decreasing the speed of the cooling fan.
3. The method of claim 1 , further comprising:
when the voltage generated by the voltage regulator cannot be decreased, issuing a warning.
4. The method of claim 1 , wherein the decreasing the voltage generated by the voltage regulator further comprises decreasing the voltage by a step.
5. The method of claim 1 , wherein the method is performed at a microprocessor-based control integrated circuit.