Transient pixel defect detection and correction
View Patent ↗A method of processing images produced by an imaging system includes detecting transient defects by comparing the value of a selected pixel with values of a plurality of the neighboring pixels, excluding known defective pixels. The value of the selected pixel may be compared with the maximal or minimal value of the neighboring pixels, and if the comparison shows that the value of the selected pixel exceeds the maximal or minimal value by a predetermined value, then the pixel may be identified as producing transient defect. Alternatively, the value of the selected pixel may be compared with the median value of the neighboring pixels, and if the comparison shows that the value of the selected pixel deviates the median value by a predetermined value, then the pixel may be identified as producing transient defect.
1. A method of processing images produced by an imaging system comprising the step of detecting transient defects in an image, said detecting step comprising comparing a value of a selected pixel with values of a plurality of neighboring pixels excluding known defective pixels.
2. The method of claim 1 wherein said comparing step comprising determining a maximal or minimal value of the neighboring pixels excluding known defective pixels, and comparing the value of the selected pixel with the maximal or minimal value.
3. The method of claim 2 further comprising the steps of identifying the selected pixel as producing transient defect if the value of the selected pixel is equal to or greater than a predetermined value above the maximal value or equal to or smaller than a predetermined value below the minimal value.
4. The method of claim 3 further comprising the step of correcting the value of the identified pixel using values of the neighboring pixels excluding known defective pixels.
5. The method of claim 2 wherein the maximal or minimal value of the neighboring pixels is determined based on a 3×3 array excluding known defective pixel or pixels.
6. The method of claim 1 wherein said comparing step comprising determining a median value of the neighboring pixels excluding known defective pixels, and comparing the value of the selected pixel with the median value.
7. The method of claim 6 further comprising identifying the selected pixel as producing transient defect if the value of the selected pixel deviates from the median value by a predetermined value.
8. The method of claim 7 further comprising the step of correcting the value of the identified pixel by using values of neighboring pixels excluding known defective pixels.
9. The method of claim 7 wherein the median value of neighboring pixels is determined based on a 3×3 array excluding known defective pixel or pixels.
10. A method of processing images produced by an imaging system comprising the steps of:
receiving an image data set acquired by a detector assembly, said detector assembly comprising a detector array including a plurality of pixels with one or more pixels being defective;
detecting transient defects in the image data set;
correcting the detected transient defects;
correcting values of the defective pixels;
recording the transient defects detected; and
identifying a pixel as a defective pixel if the pixel produces transient defects with some frequency.
11. A method of processing images produced by an imaging system comprising the steps of:
receiving an image data set acquired by a detector assembly, said detector assembly comprising a detector array including a plurality of pixels with one or more pixels being defective;
detecting transient defects in the image data set;
correcting the detected transient defects; and
correcting values of the defective pixels;
wherein the step of detecting transient defects comprising comparing a value of a selected pixel with values of a plurality of neighboring pixels excluding known defective pixels.
12. The method of claim 11 wherein said comparing step comprising determining a maximal or minimal value of neighboring pixels excluding known defective pixels, and comparing the value of the selected pixel with the maximal or minimal value.
13. The method of claim 12 further comprising the steps of identifying the selected pixel as causing transient defect if the value of the selected pixel is equal to or greater than a predetermined value above the maximal value or equal to or smaller than a predetermined value below the minimal value.
14. The method of claim 13 further comprising the step of correcting the value of the identified pixel using values of the neighboring pixels excluding known defective pixels.
15. The method of claim 12 wherein said comparing step comprising determining a median value of the neighboring pixels excluding known defective pixels, and comparing the value of the selected pixel with the median value.
16. The method of claim 15 further comprising identifying the selected pixel as producing transient defect if the value of the selected pixel deviates from the median value by a predetermined value.
17. The method of claim 16 further comprising the step of correcting the value of the identified pixel by using values of the neighboring pixels excluding known defective pixels.