System and method for testing a characteristic impedance of a signal path routing of a printed circuit board

1. A computer system for testing a characteristic impedance of a signal path routing of a printed circuit board (PCB), the computer system comprising:

a storage;

at least one processor; and

one or more programs stored in the storage and being executable by the at least one processor, the one or more programs comprising:

a receiving module operable to receive test information;

an initialization module operable to initialize a test device connected to the computer system;

an obtaining module operable to obtain status parameters of the test device, obtain test parameters of the signal path routing of the PCB according to the test information if the status parameters of the test device are valid, and store the test parameters of the signal path routing of the PCB in the storage;

a test module operable to control the test device to test a characteristic impedance of the signal path routing of the PCB according to the test parameters, obtain test data of the signal path routing of the PCB from the test device, and store the test data of the signal path routing of the PCB in the storage;

an analysis module operable to compare the test data of the signal path routing of the PCB with a corresponding standard characteristic impedance in the test parameters, and determine if the test data of the signal path routing of the PCB is acceptable;

a generation module operable to generate a test report to store the test data of each signal path routing of the PCB and corresponding comparison result if all signal path routings of the PCB have been tested, and store the test report in the storage.

2. The computer system according to claim 1 , wherein the test information comprises an Internet Protocol address of the test device, a preset storage path for storing the test parameters in the storage, and a preset storage path for storing the test data in the storage.

3. The computer system according to claim 1 , wherein the status parameters of the test device comprise a temperature of the test device and a probe parameter that determines whether probes of the test device are available probes.

4. The computer system according to claim 1 , wherein the test parameters of the signal path routing comprises a name, a type, a length, and the standard characteristic impedance of the signal path routing.

5. The computer system according to claim 1 , wherein the analysis module determines that the test data of a signal path routing is acceptable if the test data of the signal path routing is within range of the standard characteristic impedance of the signal path routing, or determines that the test data of a signal path routing is not acceptable if the test data of the signal path routing is not within range of the standard characteristic impedance of the signal path routing.

6. A computer-implemented method for testing a characteristic impedance of a signal path routing of a printed circuit board (PCB), the method comprising:

receiving test information;

initializing a test device connected to a computer;

obtaining status parameters of the test device;

obtaining test parameters of the signal path routing of the PCB according to the test information if the status parameters of the test device are valid, and storing the test parameters of the signal path routing of the PCB in a storage of the computer;

controlling the test device to test a characteristic impedance of the signal path routing of the PCB according to test parameters;

obtaining test data of the signal path routing of the PCB from the test device, and storing the test data of the signal path routing of the PCB in the storage;

comparing the test data of the signal path routing of the PCB with a corresponding standard characteristic impedance in the test parameters, and determine if the test data of the signal path routing of the PCB is acceptable;

generating a test report to store the test data of each signal path routing of the PCB and corresponding comparison result if all signal path routings of the PCB have been tested, and storing the test report in the storage.

7. The method according to claim 6 , wherein the test information comprises an Internet Protocol address of the test device, a preset storage path for storing the test parameters in the storage, and a preset storage path for storing the test data in the storage.

8. The method according to claim 6 , wherein the status parameters of the test device comprise a temperature of the test device and a probe parameter that determines whether probes of the test device are available probes.

9. The method according to claim 6 , wherein the test parameters of the signal path routing comprises a name, a type, a length, and the standard characteristic impedance of the signal path routing.

10. The method according to claim 6 , wherein the test data of a signal path routing is acceptable if the test data of the signal path routing is within range of the standard characteristic impedance of the signal path routing, or the test data of a signal path routing is not acceptable if the test data of the signal path routing is not within range of the standard characteristic impedance of the signal path routing.

11. A storage medium having stored thereon instructions that, when executed by a processor, cause the processor to perform a method for testing a characteristic impedance of a signal path routing of a printed circuit board (PCB), the method comprising:

receiving test information;

initializing a test device connected to a computer;

obtaining status parameters of the test device;

obtaining test parameters of the signal path routing of the PCB according to the test information if the status parameters of the test device are valid, and storing the test parameters of the signal path routing of the PCB in a storage of the computer;

controlling the test device to test a characteristic impedance of the signal path routing of the PCB according to test parameters;

obtaining test data of the signal path routing of the PCB from the test device, and storing the test data of the signal path routing of the PCB in the storage;

comparing the test data of the signal path routing of the PCB with a corresponding standard characteristic impedance in the test parameters, and determine if the test data of the signal path routing of the PCB is acceptable;

generating a test report to store the test data of each signal path routing of the PCB and corresponding comparison result if all signal path routings of the PCB have been tested, and storing the test report in the storage.

12. The storage medium according to claim 11 , wherein the test information comprises an Internet Protocol address of the test device, a preset storage path for storing the test parameters in the storage, and a preset storage path for storing the test data in the storage.

13. The storage medium according to claim 11 , wherein the status parameters of the test device comprise a temperature of the test device and a probe parameter that determines whether probes of the test device are available probes.

14. The storage medium according to claim 11 , wherein test parameters of the signal path routing comprises a name, a type, a length, and the standard characteristic impedance of the signal path routing.

15. The storage medium according to claim 11 , wherein the test data of a signal path routing is acceptable if the test data of the signal path routing is within range of the standard characteristic impedance of the signal path routing, or the test data of a signal path routing is not acceptable if the test data of the signal path routing is not within range of the standard characteristic impedance of the signal path routing.