IP Library Granted Patent US 8,062,915
Granted Patent B2
US 8,062,915 · App. 12/732,799 · Granted Nov 22, 2011

Anti-reflective film and production method thereof, and stamper for producing anti-reflective film and production method thereof

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,062,915
App. No.
12/732,799
Granted
Nov 22, 2011
Kind
B2
Abstract

In this method for producing an anti-reflective film, pores are formed on a surface of a polymer molding material to continuously change a refractive index and then reduce reflectance, in which anodic oxidized porous alumina, in which pores having a tapered shape and whose pore diameter continuously changes, are formed by repeating anodic oxidation at about the same formation voltage and pore diameter enlargement treatment, is used as a mold, or a stamper, which is produced by using the anodic oxidized porous aluminum as a mold, is used as a mold.

Claims (25)

1. A method of manufacturing a mold composed of anodic oxidized porous alumina, comprising:

a first step of carrying out anodic oxidation to an aluminum substrate to form an alumina layer;

a second step of removing the alumina layer;

a third step of carrying out anodic oxidation to the aluminum substrate to form pores after the second step; and

a fourth step of carrying out pore diameter enlargement treatment to the pores.

2. The method of manufacturing a mold composed of anodic oxidized porous alumina according to claim 1 , further comprising:

a fifth step of carrying out anodic oxidation after the fourth step; and

a sixth step of repeating the fourth and fifth steps alternately.

3. The method of manufacturing a mold composed of anodic oxidized porous alumina according to claim 1 , wherein the anodic oxidation of the first step and the third step are carried out at about the same formation voltage.

4. The method of manufacturing a mold composed of anodic oxidized porous alumina according to claim 2 , wherein the anodic oxidation of the first step, the third step, and the fifth step are carried out at about the same formation voltage.

5. The method of manufacturing a mold composed of anodic oxidized porous alumina according to claim 1 , wherein anodic oxidation of the first step and the third step is carried out with oxalic acid as an electrolyte and at a formation voltage of 30 to 60 V.

6. The method of manufacturing a mold composed of anodic oxidized porous alumina according to claim 1 , wherein the anodic oxidation of the first step and the third step is carried out with sulfuric acid as an electrolyte and at a formation voltage of 20 to 30 V.

7. A mold composed of anodic oxidized porous alumina manufactured by the method according to claim 1 .

8. The mold composed of anodic oxidized porous alumina according to claim 7 , wherein the mold has a pore period of 50 to 600 nm and a pore depth of 100 nm or more.

9. A method for producing an anti-reflective film having a refractive index continuously changed and then reducing reflectance, comprising:

forming unevenness on a surface of a polymer molding material by molding shape with the mold according to claim 7 .

10. An anti-reflective film having a refractive index continuously changed and then reducing reflectance produced with the mold according to claim 7 .

11. The method of manufacturing a mold composed of anodic oxidized porous alumina according to claim 1 , wherein the alumina layer formed in the first step is completely removed in the second step.

12. The method of manufacturing a mold composed of anodic oxidized porous alumina according to claim 2 , wherein the sixth step is finished at the pore diameter enlargement treatment.

13. The method of manufacturing a mold composed of anodic oxidized porous alumina according to claim 11 , wherein the anodic oxidation of the first step and the third step are carried out at about the same formation voltage.

14. The method of manufacturing a mold composed of anodic oxidized porous alumina according to claim 2 , wherein the anodic oxidation of the first step, the third step and the fifth step is carried out with oxalic acid as an electrolyte and at a formation voltage of 30 to 60 V.

15. The method of manufacturing a mold composed of anodic oxidized porous alumina according to claim 14 , wherein the anodic oxidation of the first step, the third step, and the fifth step is carried out at about the same formation voltage.

16. The method of manufacturing a mold composed of anodic oxidized porous alumina according to claim 6 , wherein the anodic oxidation of the first step and the third step are carried out at about the same formation voltage.

17. The method of manufacturing a mold composed of anodic oxidized porous alumina according to claim 2 , wherein the anodic oxidation of the first step, the third step and the fifth step is carried out with sulfuric acid as an electrolyte and at a formation voltage of 20 to 30 V.

18. The method of manufacturing a mold composed of anodic oxidized porous alumina according to claim 17 , wherein the anodic oxidation of the first step, the third step, and the fifth step is carried out at about the same formation voltage.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 18, 2017
From: KANAGAWA ACADEMY OF SCIENCE AND TECHNOLOGY
To: KANAGAWA INSTITUTE OF INDUSTRIAL SCIENCE AND TECHNOLOGY
Reel/Frame 043331/0301 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 26, 2010
From: MASUDA, HIDEKI; YASUI, KENJI; KAWAMOTO, YASUSHI
To: KANAGAWA ACADEMY OF SCIENCE AND TECHNOLOGY
Reel/Frame 024146/0963 →