Thin film photoelectric conversion device having a stacked transparent oxide and carbon intermediate layer
View Patent ↗This invention intends to develop a technique for forming an interlayer with excellent optical characteristics and to provide a photoelectric conversion device having high conversion efficiency. To realize this purpose, a series connection through an intermediate layer is formed in the thin-film photoelectric conversion device of the invention, and the interlayer is a transparent oxide layer in its front surface and n pairs of layers stacked therebehind (n is an integer of 1 or more), wherein each of the pair of layers is a carbon layer and a transparent oxide layer stacked in this order. Film thicknesses of each layer are optimized to improve wavelength selectivity and stress resistance while keeping the series resistance.
1. A thin-film photoelectric conversion device comprising a plurality of silicon-based photoelectric conversion units connected in series through an interlayer, wherein
the interlayer is a transparent oxide layer and n pairs of layers stacked therebehind (n is an integer of 1 or more), wherein each pair of layers is a carbon layer and a transparent oxide layer stacked in this order, such that the carbon layer is connected to the photoelectric conversion units through the transparent oxide layers,
wherein one or more of the carbon layers contains hydrogen.
2. The thin-film photoelectric conversion device according to claim 1 , wherein one or more of the transparent oxide layers is formed out of zinc oxide.
3. The thin-film photoelectric conversion device according to claim 1 , wherein one or more of the transparent oxide layers is formed out of conductive oxygenated silicon.
4. The thin-film photoelectric conversion device according to claim 1 , wherein a film thickness of one or more of the transparent oxide layers is 10 Å or more and 2000 Å or less.
5. The thin-film photoelectric conversion device according to claim 1 , wherein a film thickness of one or more of the carbon layers is 100 Å or more and 2000 Å or less.
6. The thin-film photoelectric conversion device according to claim 1 , wherein a total film thickness of the transparent oxide layer is 40 Å or more and 4000 Å or less.
7. The thin-film photoelectric conversion device according to claim 1 , wherein a total film thickness of the carbon layer is 200 Å or more and 4000 Å or less.
8. The thin-film photoelectric conversion device according to claim 1 , wherein a transparent insulating substrate is located on a light incidence side, and a first transparent electrode layer, the photoelectric conversion units connected in series, a second transparent electrode layer having electrical conductivity, a hard carbon layer having electrical conductivity, and a high reflecting electrode layer are stacked in this order on an opposite surface from the light incidence side of the transparent insulating substrate.
9. The thin-film photoelectric conversion device according to claim 8 , wherein the hard carbon layer having electrical conductivity comprises diamond-like carbon.
10. The thin-film photoelectric conversion device according to claim 8 , wherein the second transparent electrode layer is made of zinc oxide.
11. The thin-film photoelectric conversion device according to claim 8 , wherein a film thickness of the second transparent electrode layer is 50 Å or more and 5000 Å or less.
12. The thin-film photoelectric conversion device according to claim 8 , wherein a film thickness of the hard carbon layer having electrical conductivity is 5 Å or more and 2000 Å or less.
13. A thin-film photoelectric conversion device comprising a plurality of silicon-based photoelectric conversion units connected in series through an interlayer, wherein
the interlayer is a transparent oxide layer and n pairs of layers stacked therebehind (n is an integer of 1 or more), wherein each pair of layers is a carbon layer and a transparent oxide layer stacked in this order, such that the carbon layer is connected to the photoelectric conversion units through the transparent oxide layers,
wherein a refractive index of one or more of the carbon layers is 1.25 or more and 1.90 or less against a light with a wavelength of 600 nm.
14. A thin-film photoelectric conversion device comprising a plurality of silicon-based photoelectric conversion units connected in series through an interlayer, wherein
the interlayer is a transparent oxide layer and n pairs of layers stacked therebehind (n is an integer of 1 or more), wherein each pair of layers is a carbon layer and a transparent oxide layer stacked in this order, such that the carbon layer is connected to the photoelectric conversion units through the transparent oxide layers,
wherein any one of the carbon layers comprises diamond-like carbon.