IP Library Granted Patent US 8,043,955
Granted Patent B1
US 8,043,955 · App. 12/750,136 · Granted Oct 25, 2011

Methods of forming a conductive transparent oxide film layer for use in a cadmium telluride based thin film photovoltaic device

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,043,955
App. No.
12/750,136
Granted
Oct 25, 2011
Kind
B1
Abstract

Methods are generally provided for forming a conductive oxide layer on a substrate. In one particular embodiment, the method can include sputtering a transparent conductive oxide layer (e.g., including cadmium stannate) on a substrate from a target in a sputtering atmosphere comprising cadmium. The transparent conductive oxide layer can be sputtered at a sputtering temperature greater of about 100° C. to about 600° C. Methods are also generally provided for manufacturing a cadmium telluride based thin film photovoltaic device.

Claims (40)

1. A method for forming a conductive oxide layer on a substrate, the method comprising:

sputtering a ceramic target to deposit a transparent conductive oxide layer on a substrate, the ceramic target comprising cadmium, tin, and oxygen, wherein cadmium is present in the ceramic target in a stoichiometric amount that is greater than a standard stoichiometric amount of cadmium stannate, wherein the transparent conductive oxide layer is deposited at a sputtering temperature of about 100° C. to about 600° C.

2. The method as in claim 1 , wherein the ceramic target comprises:

Cd 2 SnO 4 +x CdO+ y CdS

where x is 0 to about 10, y is 0 to about 10, and (x+y) is greater than 0 to about 10.

3. The method as in claim 2 , wherein x is 0 to about 8, y is 0 to about 8, and (x+y) is about 2 to about 8.

4. The method as in claim 2 , wherein the transparent conductive oxide layer is deposited in a sputtering atmosphere comprising an inert gas.

5. The method as in claim 4 , wherein the sputtering atmosphere further comprises oxygen.

6. The method as in claim 1 , wherein the ceramic target comprises:

Cd 2 SnO 4 +x CdO

where x is greater than 0 to about 10.

7. The method as in claim 6 , wherein x is about 2 to about 8.

8. The method as in claim 1 , wherein the ceramic target comprises:

Cd 2 SnO 4 +y CdS

where y is greater than 0 to about 10.

9. The method as in claim 8 , wherein y is about 2 to about 8.

10. The method as in claim 1 , wherein the sputtering atmosphere has a pressure from about 1 mTorr to about 100 mTorr.

11. The method as in claim 1 , wherein the sputtering temperature is from about 150° C. to about 500° C.

12. A method for forming a conductive oxide layer on a substrate, the method comprising:

sputtering a metal target to deposit a transparent conductive oxide layer on a substrate, wherein the transparent conductive oxide layer is deposited at a sputtering temperature of about 100° C. to about 600° C., wherein the metal target consists essentially of cadmium and tin according to the formula: Cd x Sn, wherein x is 4 to 10.

13. The method as in claim 12 , wherein the transparent conductive oxide layer is deposited in a sputtering atmosphere comprising oxygen.

14. The method as in claim 12 , wherein the sputtering temperature is from about 150° C. to about 500° C.

15. The method as in claim 12 , further comprising:

forming a resistive transparent buffer layer over the transparent conductive oxide layer;

forming a cadmium sulfide layer over the resistive transparent layer; and,

forming a cadmium telluride layer over the cadmium sulfide layer.

16. A method for manufacturing a cadmium telluride based thin film photovoltaic device, the method comprising:

sputtering a ceramic target to deposit a transparent conductive oxide layer on a substrate, the ceramic target comprising cadmium, tin, and oxygen, wherein cadmium is present in the ceramic target in a stoichiometric amount that is greater than a standard stoichiometric amount of cadmium stannate, wherein the transparent conductive oxide layer is deposited at a sputtering temperature of about 100° C. to about 600° C.;

forming a resistive transparent buffer layer over the transparent conductive oxide layer;

forming a cadmium sulfide layer over the resistive transparent layer; and,

forming a cadmium telluride layer over the cadmium sulfide layer.

17. The method as in claim 16 , wherein the target is a ceramic target comprises:

Cd 2 SnO 4 +x CdO+ y CdS

where x is 0 to about 10, y is 0 to about 10, and (x+y) is greater than 0 to about 10.

18. The method as in claim 16 , wherein the target is a ceramic target comprising:

Cd 2 SnO 4 +x CdO

where x is greater than 0 to about 10.

19. The method as iii claim 16 , wherein the target is a ceramic target comprising:

Cd 2 SnO 4 +y CdS

where y is greater than 0 to about 10.

Assignments (4)
CORRECTIVE ASSIGNMENT TO CORRECT THE APPLICATION NUMBER FROM '13/301162' PREVIOUSLY RECORDED ON REEL 032045 FRAME 0657. ASSIGNOR(S) HEREBY CONFIRMS THE CORRECT APPLICATION NUMBER SHOULD BE '13/601162'. Recorded Feb 10, 2014
From: FIRST SOLAR MALAYSIA SDN. BHD.
To: FIRST SOLAR, INC.
Reel/Frame 032239/0005 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 14, 2014
From: FIRST SOLAR MALAYSIA SDN. BHD.
To: FIRST SOLAR, INC.
Reel/Frame 032045/0657 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 5, 2013
From: PRIMESTAR SOLAR, INC.
To: FIRST SOLAR MALAYSIA SDN. BHD.
Reel/Frame 031581/0891 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 30, 2010
From: FELDMAN-PEABODY, SCOTT DANIEL
To: PRIMESTAR SOLAR, INC.
Reel/Frame 024162/0046 →