IP Library Granted Patent US 8,542,041
Granted Patent B2
US 8,542,041 · App. 12/755,119 · Granted Sep 24, 2013

Semiconductor device and system

Inventors: Mitsuhiro Ogai (Yokohama, JP); Hirokazu Yamazaki (Yokohama, JP); Keizo Morita (Yokohama, JP); Kazuaki Yamane (Yokohama, JP); Yasuhiro Fujii (Yokohama, JP); Kazuaki Takai (Yokohama, JP); Shoichiro Kawashima (Yokohama, JP)
Assignee: Fujitsu Semiconductor Limited
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Quick Facts
Patent No.
US 8,542,041
App. No.
12/755,119
Granted
Sep 24, 2013
Kind
B2
Abstract

A first transistor has one end and a gate coupled to a first power supply line and other end coupled to a first node. A second transistor has a gate coupled to a second node, one end coupled to the first node, and other end coupled to a third node. A third transistor has one end coupled to a second power supply line, a gate coupled to a fourth node, and other end coupled to the third node. A first bias voltage generation circuit supplies a first bias voltage to the second node. A second bias voltage generation circuit supplies a second bias voltage to the fourth node. Accordingly, the power supply voltage at which the third node is changed from a certain level to another level is set high, and an internal node in a semiconductor device is securely initialized when the power supply voltage is decreased.

Claims (45)

1. A semiconductor device, comprising:

a first voltage detection circuit an of a power supply voltage and generates a first signal;

a second voltage detection circuit that detects a decrease of the power supply voltage and generates a second signal; and

a power supply voltage detection signal output circuit that outputs a power supply voltage detection signal based on the first signal and the second signal, wherein

the second voltage detection circuit includes:

a first transistor including one end which receives the power supply voltage from a first power supply line, a gate which receives the power supply voltage from the first power supply line, and other end coupled to a first node;

a second transistor including a gate which receives a first bias voltage via a second node, one end coupled to the first node, and other end coupled to a third node;

a third transistor including one end coupled to a second power supply line, a gate coupled to a fourth node, and other end coupled to the third node;

a first bias voltage generation circuit that supplies the first bias voltage to the second node;

a second bias voltage generation circuit that supplies a second bias voltage to the fourth node; and

a first capacitor coupled to the first node and configured to be charged from the power supply voltage through the first transistor, wherein

when the power supply voltage decreases, the first and second bias voltage generation circuits decrease the first and second bias voltages, the second transistor is turned on, the third transistor is turned off, an electric charge of the first capacitor moves to the third node, and the third node outputs the second signal.

2. The semiconductor device according to claim 1 , further comprising

at least one of fourth transistors provided between the third transistor and the second power supply line.

3. The semiconductor device according to claim 1 , wherein

the second bias voltage generation circuit includes a first dividing resistance circuit provided between the first power supply line and the second power supply line, and outputs a first divided voltage output from the first dividing resistance circuit as the second bias voltage.

4. The semiconductor device according to claim 3 , wherein

the second bias voltage generation circuit includes a second capacitor that stores the electric charge corresponding to a voltage difference between the power supply voltage supplied from the first power supply line and the first divided voltage.

5. The semiconductor device according to claim 3 , wherein

the first dividing resistance circuit includes a first resistor element and a second resistor element, and outputs the first divided voltage from a coupling node between the first resistor element and the second resistor element.

6. The semiconductor device according to claim 5 , wherein

at least one of the first resistor element and the second resistor element includes a diode coupled transistor.

7. The semiconductor device according to claim 1 , wherein

the first bias voltage generation circuit outputs the power supply voltage as the first bias voltage.

8. A system, comprising:

a semiconductor device including a power supply voltage detection circuit; and

a controller controlling the semiconductor device, wherein

the power supply voltage detection circuit includes:

a first voltage detection circuit that detects an increase of a power supply voltage and generates a first signal;

a second voltage detection circuit that detects a decrease of the power supply voltage and generates a second signal; and

a power supply voltage detection signal output circuit that outputs a power supply voltage detection signal based on the first signal and the second signal,

wherein

the second voltage detection circuit includes:

a first transistor including one end which receives a power supply voltage from a first power supply line, a gate which receives the power supply voltage from the first power supply line, and other end coupled to a first node;

a second transistor including a gate which receives a first bias voltage via a second node, one end coupled to the first node, and other end coupled to a third node;

a third transistor including one end coupled to a second power supply line, a gate coupled to a fourth node, and other end coupled to the third node;

a first bias voltage generation circuit which supplies the first bias voltage to the second node; and

a second bias voltage generation circuit which supplies a second bias voltage to the fourth node; and

a first capacitor coupled to the first node and configured to be charged from the power supply voltage through the first transistor, wherein

when the power supply voltage decreases, the first and second bias voltage generation circuits decrease the first and second bias voltages, the second transistor is turned on, the third transistor is turned off, an electric charge of the first capacitor moves to the third node, and the third node outputs the second signal.

9. The system according to claim 8 , wherein:

the controller supplies a control signal to the semiconductor device, in which the control signal activates the semiconductor device; and

the semiconductor device makes an internal circuit to operate based on the power supply voltage detection signal output from the power supply voltage detection circuit and the control signal.

10. The semiconductor device according to claim 1 , wherein

the second voltage detection circuit includes a transistor that has a gate coupled to the third node, one end coupled to a transmission node of the first signal, other end coupled to the second power supply line, and configured to be switched on based on a movement of the electric charge of the first capacitor to the third node.

Assignments (5)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 13, 2020
From: FUJITSU SEMICONDUCTOR LIMITED
To: FUJITSU SEMICONDUCTOR MEMORY SOLUTION LIMITED
Reel/Frame 053195/0249 →
CHANGE OF ADDRESS Recorded Dec 23, 2016
From: FUJITSU SEMICONDUCTOR LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 041188/0401 →
CORRECTIVE ASSIGNMENT TO CORRECT THE DOCKET NUMBER 109397.00317 TO READ 108397.00317 PREVIOUSLY RECORDED ON REEL 024206 FRAME 0322. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT OF ASSIGNOR'S INTEREST. Recorded Jan 10, 2011
From: OGAI, MITSUHIRO; YAMAZAKI, HIROKAZU; MORITA, KEIZO; YAMANE, KAZUAKI; FUJII, YASUHIRO; TAKAI, KAZUAKI; KAWASHIMA, SHOICHIRO
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 025608/0987 →
CHANGE OF NAME Recorded Jul 22, 2010
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 024748/0328 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 8, 2010
From: OGAI, MITSUHIRO; YAMAZAKI, HIROKAZU; MORITA, KEIZO; YAMANE, KAZUAKI; FUJII, YASUHIRO; TAKAI, KAZUAKI; KAWASHIMA, SHOICHIRO
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 024206/0322 →
Priority Claims (1)
JP 2009-092145 · Apr 6, 2009 · national
Continuity (1)
Related Publication 20100253419A1 · Oct 7, 2010