IP Library Granted Patent US 8,358,127
Granted Patent B2
US 8,358,127 · App. 12/755,803 · Granted Jan 22, 2013

Apparatus for measuring magnetic field of microwave-assisted head

Inventors: Isamu Sato (Tokyo, JP); Hiroshi Ikeda (Tokyo, JP); Mikio Matsuzaki (Tokyo, JP); Tetsuya Roppongi (Tokyo, JP); Noboru Yamanaka (Tokyo, JP); Tsutomu Aoyama (Tokyo, JP)
Assignee: TDK Corporation
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Quick Facts
Patent No.
US 8,358,127
App. No.
12/755,803
Granted
Jan 22, 2013
Kind
B2
Abstract

A measuring circuit system in a magnetic field measuring apparatus of the invention has an amplifier and a band-pass filter connected in sequence on an output terminal side of the TMR element, the band-pass filter is a narrow-range band-pass filter such that a peak pass frequency of the filter that is a center is a basic frequency selected from a range of 10 to 40 GHz and a band width centered around the basic frequency is a narrow range of ±0.5 to ±4 GHz; and with the measuring circuit system, an SIN ratio (SNR) of 3 dB or greater is obtained, the SNR being defined by a ratio of an amplitude S of a high-frequency generated signal induced by the TMR element to a total noise N that is a sum of a head noise generated by the TMR element and a circuit noise generated by the amplifier. With such a configuration, an in-plane high-frequency magnetic field generated by a microwave-assisted magnetic head is reliably and precisely measured.

Claims (30)

1. A magnetic field measuring apparatus for measuring an in-plane high-frequency magnetic field intensity that is generated from a microwave generation mechanism equipped with a microwave-assisted magnetic head, the measuring apparatus comprising:

an anchoring mechanism for anchoring the microwave-assisted magnetic head that is a target of measurement;

a high-frequency current driving system for applying a high-frequency current to the microwave generation mechanism equipped with the microwave-assisted magnetic head;

a magnetic sensor having a tunneling magnetoresistive (TMR) element for measuring the in-plane high-frequency magnetic field intensity generated from the microwave generation mechanism;

a measuring circuit system connected to the magnetic sensor; and

a stage capable of moving in three dimensional directions on which the magnetic sensor is mounted, wherein

the measuring circuit system has an amplifier and a band-pass filter connected in sequence on an output terminal side of the TMR element,

the band-pass filter is a narrow-range band-pass filter such that a peak pass frequency of the filter that is a center is a basic frequency selected from a range of 10 to 40 GHz and a band width centered around the basic frequency is a narrow range of ±0.5 to ±4 GHz; and

with the measuring circuit system, an SIN ratio (SNR) of 3 dB or greater is obtained, the SNR being defined by a ratio of an amplitude S of a high-frequency generated signal induced by the TMR element to a total noise N that is a sum of a head noise generated by the TMR element and a circuit noise generated by the amplifier.

2. The magnetic field measuring apparatus of claim 1 , wherein

the amplifier in the measuring circuit system is configured with a pre-amplifier and a main amplifier connected in sequence.

3. The magnetic field measuring apparatus of claim 1 , wherein

the amplifier in the measuring circuit system is a main amplifier.

4. The magnetic field measuring apparatus of claim 1 , wherein

a comparator is connected next to the narrow range band-pass filter in the measuring circuit system.

5. The magnetic field measuring apparatus of claim 1 , wherein

a low-pass filter and a comparator are connected in sequence next to the narrow-range band-pass filter in the measuring circuit system.

6. The magnetic field measuring apparatus of claim 1 , wherein

the magnetic sensor mounted on the stage is positioned facing an air bearing surface (ABS) of the microwave-assisted magnetic head anchored by the anchoring mechanism, and

the stage is moved so that the magnetic sensor scans a predetermined region of the ABS, and that the in-plane high-frequency magnetic field intensity generated by the microwave generation mechanism equipped with the microwave-assisted magnetic head is measured by this magnetic sensor.

7. The magnetic field measuring apparatus of claim 1 , wherein

the TMR element has a lamination layer structure with a barrier layer interposed between two magnetic layers.

8. The magnetic field measuring apparatus of claim 1 , wherein

the microwave-assisted magnetic head that is the target of measurement provides a main magnetic pole and an auxiliary magnetic pole, and

a main coil for generating a perpendicular recording magnetic field is provided with the main magnetic pole, and

a supplementary coil for driving an alternating current in the microwave band is provided in a gap formed with the main magnetic pole and the auxiliary magnetic pole and/or in the vicinity thereof.

9. The magnetic field measuring apparatus of claim 8 , wherein

an in-plane alternating magnetic field is generated by driving the alternating current in the microwave band to the supplementary coil of the microwave-assisted magnetic head, and

a frequency of the alternating current is substantially the same as a ferromagnetic resonant frequency of a recording layer of a magnetic recording medium that is a target of recording, and

the frequency of the alternating current is in a range of 10 GHz to 40 GHz.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 17, 2010
From: SATO, ISAMU; IKEDA, HIROSHI; MATSUZAKI, MIKIO; ROPPONGI, TETSUYA; YAMANAKA, NOBORU; AOYAMA, TSUTOMU
To: TDK CORPORATION
Reel/Frame 024550/0824 →
Continuity (1)
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