IP Library Granted Patent US 8,659,041
Granted Patent B2
US 8,659,041 · App. 12/755,926 · Granted Feb 25, 2014

Nitride semiconductor light emitting diode

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Quick Facts
Patent No.
US 8,659,041
App. No.
12/755,926
Granted
Feb 25, 2014
Kind
B2
Abstract

A nitride semiconductor light emitting diode includes at least an n-type nitride semiconductor layer, an active layer, and a p-type nitride semiconductor layer. The active layer is formed of one first nitride semiconductor layer having a highest In ratio in the light emitting diode. The light emitting diode further includes at least one of a second nitride semiconductor layer located between the active layer and the n-type nitride semiconductor layer and including an InGaN layer, and a third nitride semiconductor layer located between the active layer and the p-type nitride semiconductor layer and including an InGaN layer. Respective In (Indium) ratios of the InGaN layers included in the second nitride semiconductor layer and the InGaN layers included in the third nitride semiconductor layer are lower than the In ratio of the first nitride semiconductor layer forming the active layer. The LED with high luminous efficiency can thus be provided.

Claims (23)

1. A nitride semiconductor light emitting diode comprising at least an n-type nitride semiconductor layer, an active layer, and a p-type nitride semiconductor layer, wherein

said active layer is formed of one first nitride semiconductor layer having a highest In (Indium) ratio in said nitride semiconductor light emitting diode,

said nitride semiconductor light emitting diode further comprises at least one of a second nitride semiconductor layer located between said active layer and said n-type nitride semiconductor layer and including an InGaN layer, and a third nitride semiconductor layer located between said active layer and said p-type nitride semiconductor layer and including an InGaN layer,

respective In ratios of the InGaN layer included in said second nitride semiconductor layer and the InGaN layer included in said third nitride semiconductor layer are lower than the In ratio of the first nitride semiconductor layer forming said active layer,

in each of said second nitride semiconductor layer and said third nitride semiconductor layer, not less than two nitride semiconductor layers form a periodic structure,

respective In ratios of said not less than two nitride semiconductor layers are lower than the In ratio of the first nitride semiconductor layer forming said active layer,

each of said not less than two nitride semiconductor layers forming said periodic structure includes a GaN layer and an InGaN layer, and

the GaN layer or the InGaN layer forming the periodic structure of said second nitride semiconductor layer is doped with at least one of Si and Ge.

2. The nitride semiconductor light emitting diode according to claim 1 , wherein

said second nitride semiconductor layer and said third nitride semiconductor layer each include an InGaN layer having a lower In ratio than the first nitride semiconductor layer forming the active layer.

3. The nitride semiconductor light emitting diode according to claim 1 , wherein

each of said not less than two nitride semiconductor layers includes an InGaN layer having a lower In ratio than the first nitride semiconductor layer forming said active layer.

4. The nitride semiconductor light emitting diode according to claim 1 , wherein

the In ratio of the InGaN layer lower than the In ratio of the first nitride semiconductor layer forming said active layer is not less than 5%.

5. The nitride semiconductor light emitting diode according to claim 1 , wherein

the InGaN layer included in said second nitride semiconductor layer and the InGaN layer included in said third nitride semiconductor layer that have a lower In ratio than the first nitride semiconductor layer forming said active layer are undoped.

6. The nitride semiconductor light emitting diode according to claim 1 , wherein

the InGaN layer included in said second nitride semiconductor layer and having a lower In ratio than the first nitride semiconductor layer forming said active layer is doped with Si and Ge.

7. The nitride semiconductor light emitting diode according to claim 1 , wherein the GaN layer or the InGaN layer forming the periodic structure of said third nitride semiconductor layer is undoped.

8. The nitride semiconductor light emitting diode according to claim 1 , wherein

a layer included in said second nitride semiconductor layer and abutting on said active layer is a GaN layer.

9. The nitride semiconductor light emitting diode according to claim 1 , wherein

a layer included in said third nitride semiconductor layer and abutting on said p-type nitride semiconductor layer is a GaN layer.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 10, 2022
From: SHARP KABUSHIKI KAISHA
To: SHARP FUKUYAMA LASER CO., LTD.
Reel/Frame 059039/0927 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 20, 2010
From: KOMADA, SATOSHI
To: SHARP KABUSHIKI KAISHA
Reel/Frame 024258/0289 →