IP Library Granted Patent US 8,174,015
Granted Patent B2
US 8,174,015 · App. 12/761,958 · Granted May 8, 2012

Display device and manufacturing method thereof

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Quick Facts
Patent No.
US 8,174,015
App. No.
12/761,958
Granted
May 8, 2012
Kind
B2
Abstract

A display device includes a lower panel including a lower substrate and a pixel transistor formed on the lower substrate; and an upper panel facing the lower panel, and including an upper substrate, a sensing transistor formed on the upper substrate, and a readout transistor connected to the sensing transistor and transmitting a signal. The readout transistor includes a first lower gate electrode formed on the upper substrate, a first semiconductor layer formed on the first lower gate electrode and overlaps the first gate electrode, and a first source electrode and a first drain electrode disposed on the first semiconductor layer. The sensing transistor includes a light blocking film disposed on the upper substrate, a second lower gate electrode contacting the light blocking film on the light blocking film, a second semiconductor layer overlapping the light blocking film on the second lower gate electrode, a second source electrode and a second drain electrode formed on the second semiconductor layer, and a second upper gate electrode overlapping the second semiconductor layer on the second source electrode and the second drain electrode.

Claims (24)

1. A display device, comprising:

a panel comprising an upper substrate and a lower substrate, and a pixel transistor formed on the lower substrate, wherein

the upper substrate is facing the lower substrate and an infrared ray sensing transistor and a readout transistor being connected to the infrared ray sensing transistor are provided on the upper substrate, and the readout transistor is provided to transmit a signal and wherein,

the readout transistor comprises a first lower gate electrode formed on the upper substrate, a first semiconductor layer overlapping the first lower gate electrode and formed on the first lower gate electrode, and a first source electrode and a first drain electrode formed on the first semiconductor layer and wherein,

the infrared ray sensing transistor comprises a light blocking film and a second lower gate electrode formed on the upper substrate, the second lower gate coupled to the light blocking film, a second semiconductor layer overlapping the light blocking film formed on the second lower gate electrode, a second source electrode and a second drain electrode formed on the second semiconductor layer, and a second upper gate electrode overlapping the second semiconductor layer formed on the second source electrode and the second drain electrode.

2. The display device of claim 1 , further comprising:

a first upper gate electrode overlapping the first semiconductor layer formed on the first source electrode and the first drain electrode.

3. The display device of claim 1 , further comprising

a first etching preventing layer formed between the first semiconductor layer, and the first source electrode and the first drain electrode.

4. The display device of claim 3 , wherein

the first etching preventing layer comprises one selected from Mo, Cr, MoAlMo, MoAl, IZO, or ITO.

5. The display device of claim 1 , wherein

the light blocking film is connected to the second upper gate electrode through the second lower gate electrode.

6. The display device of claim 1 , wherein

the thickness of the second semiconductor layer is in the range of about 3000 Åto 10,000 Å.

7. The display device of claim 1 , further comprising

a blocking insulating layer formed between the light blocking film and the second semiconductor layer and having a thickness of approximately 3000 Åto approximately 10,000 Å.

8. The display device of claim 1 , further comprising

a gate insulating layer formed between the second semiconductor layer and the second upper gate electrode and having a thickness of approximately 3000 Åto approximately 10,000 Å.

9. The display device of claim 1 , further comprising

a visible ray sensing transistor formed on the upper substrate and connected to the readout transistor,

wherein the visible ray sensing transistor comprises a third semiconductor layer positioned on the upper substrate and comprising amorphous silicon, a third source electrode and a third drain electrode positioned on the third semiconductor layer, and a third upper gate electrode overlapping the third semiconductor layer on the third source electrode and the third drain electrode.

10. The display device of claim 2 , further comprising:

a second etching preventing layer formed between the second semiconductor layer, and the second source electrode and the second drain electrode.

Assignments (2)
CHANGE OF NAME Recorded Aug 28, 2012
From: SAMSUNG ELECTRONICS CO., LTD.
To: SAMSUNG DISPLAY CO., LTD.
Reel/Frame 028859/0785 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 14, 2010
From: JEONG, KI-HUN; CHO, BYEONG-HOON; BANG, JUNG-SUK; HAN, SANG-YOUN; KIM, WOONG-KWON; YANG, SUNG-HOON; JUNG, SUK WON; KIM, DAE-CHEOL; JEON, KYUNG-SOOK; SEO, SEUNG MI
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 024385/0765 →