IP Library Granted Patent US 8,294,179
Granted Patent B1
US 8,294,179 · App. 12/762,271 · Granted Oct 23, 2012

Optical device structure using GaN substrates and growth structures for laser applications

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,294,179
App. No.
12/762,271
Granted
Oct 23, 2012
Kind
B1
Abstract

An optical device has a structured active region configured for selected wavelengths of light emissions.

Claims (9)

1. An optical device consisting of:

a gallium nitride substrate member having a semipolar or nonpolar crystalline surface region;

an n-type GaN cladding layer overlying the surface region, the n-type GaN cladding layer having a thickness from 100 nm to 3000 nm with a silicon doping level of 5E17 cm-3 to 3E18 cm-3;

an n-side SCH layer overlying the n-type GaN cladding layer, the n-side SCH layer comprised of InGaN with molar fraction of indium of between 3% and 5% and having a thickness from 40 nm to 60 nm;

a multiple quantum well active region overlying the n-side SCH layer, the multiple quantum well active region comprised of seven 4.5 nm to 5.5 nm InGaN quantum wells separated by eight 4.5 nm to 5.5 nm GaN barriers;

a p-side guide layer overlying the multiple quantum well active region, the p-side guide layer comprised of GaN and having a thickness from 40 nm to 50 nm;

an electron blocking layer overlying the p-side guide layer, the electron blocking layer comprised of AlGaN with molar fraction of aluminum of between 15% and 22% and having a thickness from 10 nm to 15 nm and doped with magnesium;

a p-GaN cladding layer overlying the electronic blocking layer, the p-GaN cladding layer having a thickness from 400 nm to 1000 nm with a magnesium doping level of 5E17 cm-3 to 1E19 cm-3; and

a p++-GaN contact layer overlying the p-GaN layer, the P++-GaN contact layer having a thickness from 20 nm to 40 nm with Mg doping level of 1E20 cm-3 to 1E21 cm-3.

Assignments (4)
CHANGE OF NAME Recorded Mar 15, 2021
From: SORAA LASER DIODE, INC.
To: KYOCERA SLD LASER, INC.
Reel/Frame 056001/0313 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 23, 2014
From: SORAA, INC.
To: SORAA LASER DIODE, INC.
Reel/Frame 032743/0321 →
MERGER Recorded Aug 2, 2013
From: KAAI, INC.
To: SORAA, INC.
Reel/Frame 030930/0598 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 1, 2010
From: RARING, JAMES W.
To: KAAI, INC.
Reel/Frame 024623/0939 →