Intelligently controlled spectrometer methods and apparatus
The present invention relates to improving the ability of a hyphenated instrument to analyze a sample benefiting from having the first instrument's analysis of the same sample. A fast switching machenism can be used as the interface between an ion mobility spectrometer (IMS) and a mass spectrometer (MS) such that the obtained IMS spectrum is converted into a timing diagram that controls the vacuum inlet's size dynamically during analysis of a neutral and/or charged chemical and/or biological species such that a smaller pumping system can be used.
1. A method for operating a hyphenated instrument comprising:
a. conducting a first measurement of a sample using a first instrument with a first detector;
b. generating a timing diagram based on the first measurement;
c. adjusting an vacuum inlet structure of a second instrument according to the timing diagram; and
d. conducting a second measurement of at least some part of the sample using the second instrument with a second different detector;
wherein adjusting the vacuum inlet structure includes opening and/or closing the inlet.
2. The method in claim 1 , wherein the first instrument is an ion mobility spectrometer.
3. The method in claim 1 , wherein the second instrument is a mass spectrometer.
4. The method in claim 1 , where in the timing diagram is generated based on an ion mobility spectrum measured with an ion detector outside or inside a vacuum chamber.
5. The method in claim 1 , wherein the timing diagram is generated in real time on the first measurement.
6. The method in claim 1 , wherein the timing diagram is generated based on the first measurement during a previous measurement that obtains the sample arrival time.
7. The method in claim 1 , wherein the first instrument and the second instrument is the same type of instrument.
8. The method in claim 1 , wherein adjusting an inlet structure by opening and/or closing the inlet.
9. The method in claim 8 , wherein the opening and/or closing the inlet is performed by deforming a conductive elastomer.
10. The method in claim 9 , wherein deforming a conductive elastomer by compressing, expanding, rotating and/or translating a conductive elastomer.
11. The method in claim 1 , wherein adjusting an inlet structure using a piezoelectric material.
12. The apparatus in claim 9 , wherein the first instrument is an ion mobility spectrometer.
13. The apparatus in claim 9 , wherein the second instrument is a mass spectrometer in a vacuum chamber.
14. The apparatus in claim 11 , further comprises a gas trapping material arranged in the vacuum chamber.
15. The apparatus in claim 9 , wherein the hyphenated instrument is a portable instrument.
16. The method in claim 13 , wherein the first instrument is an ion mobility spectrometer.
17. The method in claim 13 , wherein the second instrument is a mass spectrometer.
18. The method in claim 13 , where in the timing diagram is generated based on an ion mobility spectrum measured with an ion detector outside or inside a vacuum chamber.
19. The method in claim 13 , wherein the timing diagram is generated in real time based on the first measurement.
20. The method in claim 13 , wherein the timing diagram is generated based on the first measurement during a previous measurement that obtains the sample arrival time.
21. The method in claim 15 , wherein adjusting operational parameters of the second instrument involves setting a mass range for a measurement on a mass spectrometer.
22. The method in claim 21 , wherein setting the mass range is based on the measured ion mobility and mass-mobility correlation.
23. An apparatus of a hyphenated instrument comprising:
a. a first instrument that is used to conduct a first measurement of a sample with a first detector; based on which a timing diagram is generated;
b. an vacuum inlet structure that is controlled according to the timing diagram; and
c. a second instrument that is used to conduct a second measurement of at least some part of the sample with a second different detector;
wherein adjusting the vacuum inlet structure includes opening and/or closing the inlet.
24. The apparatus in claim 23 , wherein the inlet structure uses a conductive elastomer.
25. The apparatus in claim 24 , wherein the conductive elastomer is a torsion seal.
26. The apparatus in claim 23 , wherein the inlet structure is adjusted with a piezoelectric material.
27. A method for operating a hyphenated instrument comprising:
a. conducting a first measurement of a sample using a first instrument with a first detector;
b. generating a timing diagram based on the first measurement;
c. adjusting operational parameters of a second instrument according to the timing diagram to control the second instrument for the second measurement; and
d. conducting a second measurement of at least some part of the sample with the second instrument with a second different detector.