Scintillator operation and control
A method and system for reducing scintillator afterglow. Methods for reducing afterglow include conditioning a scintillator by exposing it to high flux densities of ionizing radiation. One technique includes operating an x-ray tube at elevated amperage.
1. A method of conditioning a scintillator comprising:
applying current to an ionizing radiation source during a conditioning period at a first amperage that is greater than a second amperage applied to the radiation source during imaging operation; and
irradiating the scintillator during the conditioning period.
2. The method of claim 1 wherein the first amperage is more than two times the second amperage.
3. The method of claim 1 wherein the scintillator comprises an alkali halide.
4. The method of claim 1 wherein the scintillator comprises cesium iodide and a thallium activator.
5. The method of claim 1 wherein the radiation source comprises an x-ray tube.
6. The method of claim 1 comprising reducing resulting afterglow of the scintillator by at least 30 percent.
7. The method of claim 1 comprising repeating the method after a period of 8hours of non-use.
8. A method of reducing the afterglow of a scintillator in an analytical instrument including an x-ray source, the method comprising:
irradiating the scintillator at a first flux density for a first time period;
irradiating the scintillator at a second flux density for a second time period during which images are produced, wherein the first flux density is at least twice that of the second flux density; and
reducing by a factor of at least two the afterglow of the scintillator during the second time period when compared to the afterglow of the scintillator when the first time period is not practiced.
9. The method of claim 8 wherein the scintillator comprises a portion of an instrument selected from the group consisting of CT scanners, PET scanners, SPECT scanners, luggage scanners and diagnostic x-ray scanners.
10. The method of claim 8 wherein the first flux density is at least five times that of the second flux density.
11. The method of claim 8 wherein the flux density is controlled by varying the amperage provided to the x-ray source.
12. The method of claim 8 wherein the first time period is greater than or equal to one minute.
13. The method of claim 8 wherein the first time period is greater than five minutes.
14. The method of claim 8 wherein the first time period is greater than 30 minutes.
15. The method of claim 8 comprising reducing the afterglow of the scintillator by a factor of at least three.
16. The method of claim 8 comprising repeating the method after the analytical instrument has been powered down for more than 8 hours.