IP Library Patent Application 12787852
Patent Application
App. No. 12/787,852

Interface Adapter For Connecting With A Test Probe

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Quick Facts
Patent No.
US None
App. No.
12/787,852
Abstract

A interface adapter comprising a connecting board having the first ports and the second ports, the first ports being electrically connected with the second ports; a pin header having the first pins and the second pins, the first pins passing through the first ports, the second pins being connected with the second ports; a female header having openings for receiving the first pins, the connecting board being located between the pin header and the female header. The second pin is designed to O-shape or U-shape for providing enough position to connecting the test probe, preventing from disengagement of the chip from the test card.

Claims (17)

1 . An interface adapter for connecting with a test probe, comprising:

a connecting board having first ports and second ports, the first ports being electrically connected with the second ports;

a pin header having first pins and second pins, the first pins passing through the first ports, the second pins being connected with the second ports; and

a female header having openings for receiving the first pins, the connecting board being located between the pin header and the female header.

2 . The interface adapter as claimed in claim 1 , wherein the second pins are located at both sides and mounted on the connecting board.

3 . The interface adapter as claimed in claim 1 , wherein the second pins are bent to O-shape or U-shape and bonded to one of the second ports of the connecting board.

4 . The interface adapter as claimed in claim 1 , wherein the number of the second pins is twenty, the number of the openings is twenty, and the number of the first pins is twenty.

5 . The interface adapter as claimed in claim 1 , wherein the connecting board is a printed circuit board.

6 . The interface adapter as claimed in claim 1 , wherein the first ports are electrically connected with the second ports through copper lines formed in the connecting board.

7 . An interface adapter for connecting with a test probe, comprising:

a connecting board having first ports;

a pin header having first pins, the first pins passing through the first ports of the connecting board;

a female header having openings, the opening receiving the first pins, the connecting board being located between the pin header and the female header;

means for electrical connection with the test probe and the first pins.

8 . The interface adapter as claimed in claim 7 , wherein means for electrical connection with the test probe and the first pins comprises second pins formed on the pin header, the connecting board further having second ports electrically connected with the first ports, the second pins being electrically connected with the second ports.

9 . The interface adapter as claimed in claim 7 , wherein means for electrical connection with test probe and first pins comprises connecting arms formed on the connecting board.

10 . The interface adapter as claimed in claim 9 , wherein the connecting arms is O-shape or U-shape.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 19, 2012
From: SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION
To: SEMICONDUCTOR MANUFACTURING INTERNATIONAL (BEIJING) CORPORATION
Reel/Frame 029158/0666 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 26, 2010
From: XIONG, BEAR; CUI, SUPER
To: SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION
Reel/Frame 024444/0119 →