IP Library Granted Patent US 8,451,571
Granted Patent B2
US 8,451,571 · App. 12/790,070 · Granted May 28, 2013

Overheat protection circuit and power supply integrated circuit

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Quick Facts
Patent No.
US 8,451,571
App. No.
12/790,070
Granted
May 28, 2013
Kind
B2
Abstract

Provided is a power supply integrated circuit including an overheat protection circuit with high detection accuracy. The overheat protection circuit includes: a current generation circuit including: a first metal oxide semiconductor (MOS) transistor including a gate terminal and a drain terminal that are connected to each other, the first MOS transistor operating in a weak inversion region; a second MOS transistor including a gate terminal connected to the gate terminal of the first MOS transistor, the second MOS transistor having the same conductivity type as the first MOS transistor and operating in a weak inversion region; and a first resistive element connected to a source terminal of the second MOS transistor; and a comparator for comparing a reference voltage having positive temperature characteristics and a temperature voltage having negative temperature characteristics, which are obtained based on a current generated by the current generation circuit.

Claims (16)

1. An overheat protection circuit for detecting an increase in temperature to protect a circuit from overheating, comprising:

a p-n junction element for outputting a forward voltage that is proportional to temperature;

a reference voltage circuit that comprises transistors, each transistor operating in a weak inversion region; and

a voltage comparator circuit for comparing the forward voltage of the p-n junction element with an output voltage of the reference voltage circuit;

wherein the reference voltage circuit comprises:

a current generation circuit comprising:

a first MOS transistor including a source terminal connected to a ground terminal;

a second MOS transistor including a source terminal connected to the ground terminal, and a gate terminal connected to a drain terminal of the first MOS transistor, the second MOS transistor having the same conductivity type as the first MOS transistor; and

a first resistive element connected between a gate terminal and the drain terminal of the first MOS transistor;

a current mirror circuit connected to the current generation circuit; and

a second resistive element including one terminal connected to the current mirror circuit and another terminal connected to the ground terminal, the second resistive element having the same temperature coefficient as the first resistive element, the one terminal serving as a first temperature voltage output terminal, and

wherein the first MOS transistor and the second MOS transistor each operate in a weak inversion region.

2. An overheat protection circuit according to claim 1 , wherein the p-n junction element comprises a diode that includes an anode terminal connected to the current mirror circuit and a cathode terminal connected to the ground terminal, the anode terminal serving as a second temperature voltage output terminal.

3. An overheat protection circuit according to claim 1 , wherein the p-n junction element comprises a diode that includes an anode terminal connected to the current mirror circuit and a cathode terminal connected to the ground terminal, the anode terminal serving as a second temperature voltage output terminal.

4. An overheat protection circuit according to claim 1 , wherein the voltage comparator circuit has hysteresis characteristics between a temperature at which an output voltage of the voltage comparator circuit is inverted when temperature increases and a temperature at which the output voltage of the voltage comparator circuit is inverted when the temperature decreases.

5. A power supply integrated circuit, comprising the overheat protection circuit according to claim 1 .

Assignments (4)
CHANGE OF ADDRESS Recorded Jun 8, 2023
From: ABLIC INC.
To: ABLIC INC.
Reel/Frame 064021/0575 →
CHANGE OF NAME Recorded Mar 12, 2018
From: SII SEMICONDUCTOR CORPORATION
To: ABLIC INC.
Reel/Frame 045567/0927 →
CORRECTIVE ASSIGNMENT TO CORRECT THE EXECUTION DATE PREVIOUSLY RECORDED AT REEL: 037783 FRAME: 0166. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Feb 23, 2016
From: SEIKO INSTRUMENTS INC
To: SII SEMICONDUCTOR CORPORATION
Reel/Frame 037903/0928 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 11, 2016
From: SEIKO INSTRUMENTS INC
To: SII SEMICONDUCTOR CORPORATION .
Reel/Frame 037783/0166 →