IP Library Granted Patent US 8,710,666
Granted Patent B2
US 8,710,666 · App. 12/801,603 · Granted Apr 29, 2014

Semiconductor device and method for fabricating the same

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Quick Facts
Patent No.
US 8,710,666
App. No.
12/801,603
Granted
Apr 29, 2014
Kind
B2
Abstract

A semiconductor device which can prevent a deterioration in the electrical properties by preventing sputters generated by laser welding from adhering to a circuit pattern or a semiconductor chip and a method for fabricating such a semiconductor device are provided. A connection conductor is bonded to a copper foil formed over a ceramic by a solder and resin is injected to a level lower than a top of the connection conductor. Laser welding is then performed. After that, resin is injected. This prevents sputters generated by the laser welding from adhering to a circuit pattern or a semiconductor chip. As a result, a deterioration in the electrical properties can be prevented.

Claims (23)

1. A semiconductor device comprising:

a circuit pattern formed over an insulating board;

a semiconductor chip bonded to a main surface of the circuit pattern;

a connection conductor which has an Ω-type shape whose two lower ends are bonded to the main surface of the circuit pattern;

a first insulating resin which exposes an upper-end welding portion of the connection conductor through a top of the first insulating resin and which covers the circuit pattern and the semiconductor chip,

wherein the upper-end welding portion and the top of the first insulating resin are parallel to the main surface of the circuit pattern; and

an external terminal which passes a main electric current through a main electrode of the semiconductor chip and which is bonded to the upper-end welding portion of the connection conductor.

2. The semiconductor device according to claim 1 , further comprising a second upper-layer insulating resin which is over the first insulating resin and which covers the exposed portion of the connection conductor and a portion of the external terminal.

3. The semiconductor device according to claim 1 , wherein:

the semiconductor chip includes one or more signal electrodes in addition to the main electrode; and

the first insulating resin covers at least one bonding wire, each bonding wire connecting only one of the one or more signal electrodes and signal terminals.

4. A semiconductor device comprising:

a circuit pattern formed over an insulating board;

a semiconductor chip bonded to a main surface of the circuit pattern;

a first connection conductor which has an Ω-type shape whose two lower ends are bonded to the main surface of the circuit pattern;

a first insulating resin which exposes an upper-end welding portion of the first connection conductor through a top surface of the first insulating resin and which covers the circuit pattern and the semiconductor chip,

wherein the upper-end welding portion and the top of the first insulating resin are parallel to the main surface of the circuit pattern;

an external terminal which passes a main electric current through a main electrode of the semiconductor chip; and

a second external connection conductor bonded to the external terminal and the upper-end welding portion of the first connection conductor.

5. The semiconductor device according to claim 4 , further comprising a second upper-layer insulating resin which is over the first insulating resin and which covers the exposed portion of the first connection conductor, a portion of the external terminal, and the second external connection conductor.

6. The semiconductor device according to claim 4 , wherein:

the semiconductor chip includes one or more signal electrodes in addition to the main electrode; and

the first insulating resin covers at least one bonding wire, each bonding wire connecting only one of the one or more signal electrodes and signal terminals.

Assignments (2)
MERGER AND CHANGE OF NAME Recorded Aug 26, 2011
From: FUJI ELECTRIC SYSTEMS CO., LTD. (FES); FUJI TECHNOSURVEY CO., LTD. (MERGER BY ABSORPTION)
To: FUJI ELECTRIC CO., LTD.
Reel/Frame 026970/0872 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 3, 2010
From: TSURUOKA, JUNJI; AOKI, KAZUO; ONO, MASAKI; YOSHIHARA, KATSUHIKO
To: AISIN AW CO., LTD.; FUJI ELECTRIC SYSTEMS CO., LTD.
Reel/Frame 024802/0983 →