Formation of longitudinal bipolar transistor with base region in trenches having emitter and collector regions disposed along portions of side surfaces of base region
View Patent ↗Provided is a semiconductor device including: a silicon substrate; at least two trenches spaced apart from each other, being in parallel with each other, and being formed by vertically etching the silicon substrate from a surface thereof; an electrically insulating film for burying therein at least bottom surfaces of the trenches; a base region formed in a region of the silicon substrate located between the two trenches; and an emitter region and a collector region formed on portions of side surfaces of the trenches, respectively, the portions of the sides located above the insulating film and formed in the base region.
1. A method of manufacturing a semiconductor device, comprising:
forming a base region on a side of a surface of a silicon substrate;
forming at least two trenches below the surface of the silicon substrate on portions of a border between the base region and the silicon substrate seen from the side of the surface by vertically etching the silicon substrate from the surface thereof so that the trenches face each other with the base region interposed therebetween;
forming an electrically insulating film on at least bottom surfaces of the trenches; and
forming an emitter region and a collector region in the trenches along portions of side surfaces of the base region.
2. A method of manufacturing a semiconductor device having a longitudinal bipolar transistor and a plurality of MOS transistors mounted thereon comprising:
forming a separating trench for separating elements of the plurality of MOS transistors, simultaneously with the trench forming step of claim 1 .
3. A method of manufacturing a semiconductor device, comprising:
forming a base region on a side of a surface of a silicon substrate;
forming a substantially ring-shaped first trench in a plan view below the surface of the silicon substrate and on an entire border between the base region and the silicon substrate seen from the side of the surface by vertically etching the silicon substrate from the surface thereof, and forming a second trench below the surface of the silicon substrate and inside the first trench with the base region interposed between the first trench and the second trench by vertically etching the silicon substrate from the surface thereof;
forming an electrically insulating film on at least bottom surfaces of the first trench and the second trench; and
forming one of an emitter region and a collector region in the first trench on portions of side surfaces of the base region, and forming the other of the emitter region and the collector region in the second trench on portions of side surfaces of the base region.
4. A method of manufacturing a semiconductor device having a longitudinal bipolar transistor and a plurality of MOS transistors mounted thereon comprising:
forming a separating trench for separating elements of the plurality of MOS transistors, simultaneously with the trench forming step of claim 3 .