Circuit arrangement and method for testing a reset circuit

1. A circuit arrangement for testing a reset circuit, the circuit arrangement comprising:

a reset circuit, comprising,

a voltage input for feeding an input voltage, and

an output for providing a reset signal as a function of the input voltage;

a changeover switch, comprising,

a first input for feeding a test voltage,

a second input for feeding a supply voltage,

a control input for changing over between the first and the second input as a function of a test adjustment signal, and

an output that is coupled to the voltage input of the reset circuit;

an output logic circuit, comprising,

a first input, coupled to the output of the reset circuit,

a second input for feeding the test adjustment signal,

a first output for providing a system reset signal as a function of the reset signal and the test adjustment signal, and

a second output for providing a result signal as a function of the reset signal and the test adjustment signal; and

an input logic circuit, comprising,

a first input, coupled to the first output of the output logic circuit,

a second input for feeding a data signal, and

an output for providing the test adjustment signal and coupled to the control input of the changeover switch and the second input of the output logic circuit.

2. The circuit arrangement according to claim 1 , wherein the output logic circuit comprises:

a third input, which is connected to the output of the changeover switch, and

and a fourth input, which is coupled to the second input of the changeover switch.

3. The circuit arrangement according to claim 1 , wherein the input logic circuit comprises a memory circuit comprising:

a reset input connected to the first input of the input logic circuit,

a data input connected to the second input of the input logic circuit, and

a data output connected to the output of the input logic circuit.

4. The circuit arrangement according to claim 1 , wherein, the reset circuit comprises:

an output driver, connected on the output side to the output of the reset circuit, and

a series circuit comprising,

a capacitor for adjusting the time constant of the reset signal, and

a switch to which the test adjustment signal can be routed at a control input, and

wherein the series circuit of the capacitor and the switch is connected between an input of the output driver and the voltage input.

5. The circuit arrangement according to claim 1 , comprising a buffer capacitor that couples the output of the changeover switch to a reference potential terminal.

6. The circuit arrangement according to claim 1 , wherein a semiconductor substrate comprises the circuit arrangement.

7. A method for testing a reset circuit, comprising:

feeding a supply voltage as an input voltage to the reset circuit in a normal operation;

changing over from the normal operation to a test operation as a function of a test adjustment signal;

feeding a test voltage as the input voltage to the reset circuit in the test operation;

generating a reset signal by means of the reset circuit as a function of the input voltage; and

emitting a system reset signal with a logic value that corresponds to the logic value of the reset signal in normal operation, and to a value deactivating a circuit block in the test operation.

8. The method according to claim 7 , comprising emitting a result signal with a logic value that corresponds to the logic value of the reset signal in the test operation and to a constant logic value in the normal operation.

9. The method according to claim 7 , comprising providing the test adjustment signal as a function of a data signal and the system reset signal.

10. The method according to claim 7 , comprising;

feeding the test voltage to a first input of a changeover switch;

feeding the supply voltage to a second input of the changeover switch;

routing the test adjustment signal to a control input of the changeover switch; and

changing over an output of the changeover switch between the first and the second input of the changeover switch as a function of the test adjustment signal.

11. The method according to claim 10 , wherein a semiconductor substrate comprises a circuit arrangement that comprises the reset circuit and the changeover switch.