IP Library Granted Patent US 8,503,247
Granted Patent B2
US 8,503,247 · App. 12/826,054 · Granted Aug 6, 2013

Semiconductor storage apparatus, and method and system for boosting word lines

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Quick Facts
Patent No.
US 8,503,247
App. No.
12/826,054
Granted
Aug 6, 2013
Kind
B2
Abstract

A semiconductor storage apparatus includes: a word line coupled to a cell transistor; a first capacitor having a first end coupled to the word line; a boost driver coupled to a second end of the first capacitor; a voltage-drop circuit configured to generate a given voltage drop between a first voltage and a second voltage; and a boost-drive circuit configured to boost a voltage at the second end from the second voltage to the first voltage.

Claims (63)

1. A semiconductor storage apparatus comprising:

a word line coupled to a cell transistor;

a first capacitor having a first end coupled to the word line;

a boost driver coupled to a second end of the first capacitor;

a voltage-drop circuit configured to generate a given voltage drop between a first voltage and a second voltage; and

a boost-drive circuit, coupled to a second end of the first capacitor, configured to boost a voltage at the second end from the second voltage to the first voltage,

wherein the boost-drive circuit is provided between a first voltage supply that supplies the first voltage and a second voltage supply that supplies the second voltage, and the voltage-drop circuit generates the given voltage drop at a node between the boost-drive circuit and the second voltage supply,

wherein the voltage-drop circuit is disposed between the first supply voltage and the second supply voltage and includes a diode-coupled transistor,

wherein the diode-coupled transistor generates a voltage drop, and

wherein the voltage-drop circuit includes a second capacitor coupled to the diode-coupled transistor.

2. A semiconductor storage apparatus comprising:

a word line coupled to a cell transistor;

a first capacitor having a first end coupled to the word line;

a voltage-drop circuit configured to generate a given voltage drop between a first voltage and a second voltage; and

a boost-drive circuit, coupled to a second end of the first capacitor, configured to boost a voltage at the second end from the second voltage to the first voltage,

wherein the voltage-drop circuit is disposed between a first voltage supply and a second voltage supply and includes a diode-coupled transistor, and wherein the diode-coupled transistor generates a voltage drop,

wherein the voltage-drop circuit includes a second capacitor coupled to the diode-coupled transistor.

3. The semiconductor storage apparatus according to claim 2 , further comprising:

a switch circuit configured to discharge an electric charge of the second capacitor.

4. The semiconductor storage apparatus according to claim 1 , wherein the voltage-drop circuit includes a resistor coupled to the diode-coupled transistor.

5. A semiconductor storage apparatus comprising:

a word line coupled to a cell transistor;

a first capacitor having a first end coupled to the word line;

a boost driver coupled to a second end of the first capacitor;

a voltage-drop circuit configured to generate a given voltage drop between a first voltage and a second voltage; and

a boost-drive circuit, coupled to a second end of the first capacitor, configured to boost a voltage at the second end from the second voltage to the first voltage,

wherein the boost-drive circuit is provided between a first voltage supply that supplies the first voltage and a second voltage supply that supplies the second voltage, and the voltage-drop circuit generates the given voltage drop at a node between the boost-drive circuit and the second voltage supply;

wherein the voltage-drop circuit is disposed between the first supply voltage and the second supply voltage and includes a diode-coupled transistor;

wherein the diode-coupled transistor generates a voltage drop;

wherein the voltage-drop circuit includes a second capacitor coupled to the diode-coupled transistor;

wherein the voltage-drop circuit includes a resistor coupled to the diode-coupled transistor, and

wherein the voltage-drop circuit includes a third capacitor coupled to the diode-coupled transistor.

6. The semiconductor storage apparatus according to claim 1 ,

wherein the boost-drive circuit includes a PMOS transistor and an NMOS transistor that are coupled between the first voltage and the second voltage, and

wherein a coupling point between the PMOS transistor and the NMOS transistor is coupled to the second end.

7. A boost method of a word line comprising:

setting a word line to a first voltage which is supplied from a first voltage supply, the word line coupled to a first end of a capacitor;

generating, at node between one end of a boost-drive circuit and a second voltage supply which supplies a second voltage, a given voltage drop between a first voltage and a second voltage by a voltage drop circuit, the voltage drop circuit being disposed between the first supply voltage and the second supply voltage and including a diode-coupled transistor which generates a voltage drop and a second capacitor coupled to the diode-coupled transistor;

setting a word line to a given voltage; and

raising, by the boost-drive circuit, a voltage at a second end of the capacitor having a first end coupled to the word line from the second voltage to the first voltage after the word line is set to the first given voltage.

8. A system comprising:

a memory; and

a controller configured to control the memory,

wherein the memory includes:

a word line coupled to a cell transistor;

a first capacitor having a first end coupled to the word line;

a boost driver coupled to a second end of the first capacitor;

a voltage-drop circuit configured to generate a given voltage drop between a first voltage and a second voltage; and

a boost-drive circuit, coupled to a second end of the first capacitor, configured to boost a voltage at the second end from the second voltage to the first voltage,

wherein the boost-drive circuit is provided between a first voltage supply that supplies the first voltage and a second voltage supply that supplies the second voltage, and the voltage-drop circuit generates the given voltage drop at a node between the boost-drive circuit and the second voltage supply,

wherein the voltage-drop circuit is disposed between a first voltage supply and a second voltage supply and includes a diode-coupled transistor, and wherein the diode-coupled transistor generates a voltage drop,

wherein the voltage-drop circuit includes a second capacitor coupled to the diode-coupled transistor.

9. A semiconductor storage apparatus comprising:

a word line coupled to a cell transistor;

a first capacitor having a first end coupled to the word line;

a voltage-drop circuit configured to generate a given voltage drop between a first voltage and a second voltage; and

a boost-drive circuit configured to boost a voltage at a second end of the first capacitor from the second voltage to the first voltage,

wherein the boost-drive circuit includes a first transistor and a second transistor that are coupled between the first voltage and the second voltage,

wherein a coupling point between the first transistor and one end of the second transistor is coupled to the second end, and

wherein the voltage-drop circuit couples to the other end of the second transistor,

wherein the voltage-drop circuit is disposed between a first voltage supply and a second voltage supply and includes a diode-coupled transistor, and wherein the diode-coupled transistor generates a voltage drop,

wherein the voltage-drop circuit includes a second capacitor coupled to the diode-coupled transistor.

10. The semiconductor storage apparatus according to claim 9 , wherein the first transistor is a PMOS transistor and the second transistor is an NMOS transistor.

Assignments (4)
CHANGE OF NAME Recorded Jan 29, 2025
From: FUJITSU SEMICONDUCTOR MEMORY SOLUTION LIMITED
To: RAMXEED LIMITED
Reel/Frame 070054/0242 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 13, 2020
From: FUJITSU SEMICONDUCTOR LIMITED
To: FUJITSU SEMICONDUCTOR MEMORY SOLUTION LIMITED
Reel/Frame 053195/0249 →
CHANGE OF ADDRESS Recorded Dec 23, 2016
From: FUJITSU SEMICONDUCTOR LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 041188/0401 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 30, 2010
From: YOSHIOKA, HIROSHI
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 024617/0116 →