Methods and systems for non-destructively testing a polycrystalline diamond element
View Patent ↗Embodiments of the invention relate to electrical impedance tomography testing systems and methods for non-destructively testing a polycrystalline diamond element (e.g., a polycrystalline diamond table of a polycrystalline diamond compact or a freestanding polycrystalline diamond table) using electrical impedance tomography to locate one or more high-electrical-conductivity regions (e.g., one or more regions of poorly sintered diamond crystals and/or high-metal-solvent catalyst content) and/or one or more low-electrical-conductivity regions (e.g., porosity and/or cracks) in the tested polycrystalline diamond element. Further embodiments relate to a rotary drill bit including at least one polycrystalline diamond compact that has been selectively positioned so that one or more high-electrical-conductivity regions of a polycrystalline diamond table thereof identified using the non-destructive testing systems and methods disclosed herein are not positioned to engage a subterranean formation during drilling.
1. A method of non-destructively testing a polycrystalline diamond compact (“PDC”) including a polycrystalline diamond table bonded to a substrate, the method comprising:
with an electrical impedance tomography system, measuring electrical resistance at a plurality of locations of the PDC, wherein measuring the electrical resistance at the plurality of location of the PDC includes:
contacting an upper surface of the polycrystalline diamond table of the PDC with a first plurality of probes; and
contacting a surface of the substrate of the PDC with a second plurality of probes, wherein the number of probes in the first plurality of probes exceeds the number of probes in the second plurality of probes; and
with one or more processors, calculating an electrical conductivity distribution for the polycrystalline diamond table at least partially based on the measured electrical resistance.
2. The method of claim 1 wherein measuring electrical resistance at a plurality of locations of the PDC comprises with the electrical impedance tomography system, measuring the electrical resistance of a plurality of surface locations on the upper surface of the polycrystalline diamond table.
3. The method of claim 1 wherein calculating an electrical conductivity distribution for the polycrystalline diamond table at least partially based on the measured electrical resistance comprises employing an electrical impedance tomography technique to calculate the electrical conductivity distribution.
4. The method of claim 1 , further comprising analyzing the electrical conductivity distribution to locate one or more defects in the polycrystalline diamond table.
5. The method of claim 4 wherein the one or more defects comprise one or more high-electrical-conductivity regions, the one or more high-electrical-conductivity regions exhibit an electrical conductivity greater than an average electrical conductivity of the polycrystalline diamond table and a maximum linear cross-sectional dimension of at least about 0.25 mm.
6. The method of claim 4 , further comprising identifying the one or more defects as one or more high-electrical conductivity regions, one or more low-electrical-conductivity regions, or combinations thereof.
7. The method of claim 4 , further comprising identifying the one or more defects as one or more poorly sintered regions, cracks, porosity, or combinations thereof.
8. The method of claim 1 , further comprising accepting or rejecting the PDC at least partially based on the electrical conductivity distribution.
9. The method of claim 1 , further comprising determining one or more of a type of, a number of, a size of, or a position of the one or more defects in the polycrystalline diamond table at least partially based on the electrical conductivity distribution.
10. The method of claim 9 wherein the type of the one or more defects comprises one or more poorly sintered regions, porosity, cracks, or combinations thereof.
11. A method of non-destructively testing a polycrystalline diamond element, the method comprising:
with an electrical impedance tomography system, measuring electrical resistance at a plurality of locations of the polycrystalline diamond elements;
with one or more processors, calculating an electrical conductivity distribution for the polycrystalline diamond element at least partially based on the measured electrical resistance; and
analyzing the electrical conductivity distribution to locate one or more defects in the polycrystalline diamond element, the one or more defects including one or more high-electrical-conductivity regions.