IP Library Granted Patent US 8,129,248
Granted Patent B2
US 8,129,248 · App. 12/833,573 · Granted Mar 6, 2012

Method of producing bipolar transistor structures in a semiconductor process

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Quick Facts
Patent No.
US 8,129,248
App. No.
12/833,573
Granted
Mar 6, 2012
Kind
B2
Abstract

In the method of producing bipolar transistor structures in a semiconductor process, an advanced epitaxial trisilane process can be used without the risk of poly stringers being formed. A base window is structured in a polycrystalline silicon layer covered with an oxide layer, and a further step is epitaxial growing of a silicon layer in the base window from trisilane. The window structuring is performed in a sequence of anisotropic etch and isotropic ash steps, thereby creating stepped and inwardly sloping window edges. Due to the inwardly sloping side walls of the window, the epitaxially grown silicon layer is formed without inwardly overhanging structures, and the cause of poly stringers forming is thus eliminated.

Claims (4)

1. A method of producing bipolar transistor structures in a semiconductor process, comprising the steps of:

structuring, by plasma etching, a base window in a polycrystalline silicon layer covered with an oxide layer;

epitaxial growing a silicon layer in the base window from trisilane;

wherein said plasma etching is performed in a sequence of anisotropic etch and isotropic ash steps, thereby creating stepped and inwardly sloping window edges.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 16, 2021
From: TEXAS INSTRUMENTS DEUTSCHLAND GMBH
To: TEXAS INSTRUMENTS INCORPORATED
Reel/Frame 055314/0255 →