IP Library Granted Patent US 8,583,388
Granted Patent B2
US 8,583,388 · App. 12/834,059 · Granted Nov 12, 2013

Power integrity analyzer, power integrity analysis method, and program

Inventor: Takahiro Yaguchi (Tokyo, JP)
Assignee: NEC Corporation
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,583,388
App. No.
12/834,059
Granted
Nov 12, 2013
Kind
B2
Abstract

A power integrity analyzer according to an exemplary aspect of the invention includes a parameter inputting unit that inputs parameters to a power-supply current waveform which indicates a variation of a power-supply current value on a time axis of an element, a conversion unit that converts the power-supply current waveform which indicates a variation on the time axis determined by the parameter to a power-supply current spectrum which indicates a variation of the power-supply current value on a frequency axis, an allowable value information storage unit that stores an allowable power-supply voltage fluctuation value of the element, and an impedance calculating unit that calculates a target impedance spectrum on the device indicating the variation of impedance value on the frequency axis based on the power-supply current spectrum and the allowable power-supply voltage fluctuation value.

Claims (67)

1. A power integrity analyzer comprising:

a parameter inputting unit that inputs parameters to corresponding a power-supply current waveform which indicates a variation of a power-supply current value on a time axis of an element;

a conversion unit that converts the power-supply current waveform which indicates a variation of the power-supply current value on the time axis determined by the parameter to a power-supply current spectrum which indicates a variation of the power-supply current value on a frequency axis;

an allowable value information storage unit that stores an allowable power-supply voltage fluctuation value of the element; and

an impedance calculating unit that calculates a target impedance spectrum of the element which indicates the variation of impedance value on the frequency axis based on the power-supply current spectrum and the allowable power-supply voltage fluctuation value, wherein the parameter inputting unit comprising:

a waveform display unit that displays the predetermined current waveform which indicates a variation of the power-supply current value on the time axis;

a maximal current value designation unit that inputs a maximal value of the power-supply current in the current waveform as the parameter;

a current value variation time designation unit that inputs a variation time necessary for a variation from a steady-state value of the power-supply current in the current waveform to the maximal value; and

a periodic designation unit that inputs cycle corresponding to an operation clock of the element as the parameter.

2. The power integrity analyzer according to claim 1 , wherein

the maximal current value designation unit inputs a plurality of the maximal value of the power-supply current and the current value variation time designation unit inputs the variation time corresponding to the maximal values; and

comprising a time relation designation unit that inputs the relation between the occurrence times of a plurality of the maximal value of the power-supply current in the current waveform as the parameter from the operation entry screen.

3. The power integrity analyzer according to claim 1 , comprising:

plural sets of the current value variation time designation unit corresponding to the maximal current value designation unit and the maximal current value designation unit; and

a time relation designation unit that inputs the relation of the occurrence time of a plurality of the maximal values of the power-supply current in the current waveform.

4. The power integrity analyzer according to claim 1 , wherein

the impedance calculation unit calculates the value of the allowable power-supply voltage variation value divided by the power-supply current spectrum and calculates the result as the target impedance spectrum.

5. The power integrity analyzer according to claim 1 , wherein

the allowable power-supply voltage fluctuation value is an allowable power-supply voltage variation spectrum; and

the impedance calculation unit calculates a voltage value of each frequency in the allowable power-supply voltage variation spectrum divided by a current value of each frequency in the allowable power-supply current spectrum and calculates the result as an impedance value of the corresponding each frequency in the target impedance spectrum.

6. The power integrity analyzer according to claim 1 , comprising:

an analysis unit, based on circuit information of a circuit including the element, that analyzes the circuit, and calculates impedance characteristics of the circuit; and

a result display unit that displays the impedance characteristics and the target impedance.

7. A power integrity analysis method using a power integrity analyzer, said method comprising:

inputting a parameter corresponding to a power-supply current waveform which indicates a variation of a power-supply current value on a time axis of an element from an input unit;

converting the power-supply current waveform which indicates a variation of the power-supply current value on the time axis determined by the parameter to a power-supply current spectrum indicating a variation of the power-supply current value on a frequency axis;

storing an allowable power-supply voltage fluctuation value of the element in a storage unit in advance; and

calculating a target impedance spectrum of the element which indicates the variation on impedance value on the frequency axis based on the power-supply current spectrum and the allowable power-supply voltage fluctuation value, wherein said inputting the parameter comprising:

displaying the predetermined current waveform which indicates a variation of the power-supply current value on the time axis on an operation entry screen;

inputting a maximal value of the power-supply current in the current waveform as the parameter;

inputting a variation time necessary for variation from a steady-state value of the power-supply current in the current waveform to the maximal value as the parameter; and

inputting a cycle corresponding to an operation clock of the element as the parameter.

8. The power integrity analysis method using a power integrity analyzer according to claim 7 , said method further comprising:

inputting a plurality of the maximal value of the power-supply current in the inputting the maximal value of the current;

inputting the variation times corresponding to the maximal values in the current waveform in the inputting the variation time; and

inputting the relation between the occurrence times of a plurality of the maximal value of the power-supply current in the current in the current waveform as the parameter.

9. The power integrity analysis method using a power integrity analyzer according to claim 7 , said method further comprising:

calculating the result of dividing the allowable power-supply voltage fluctuation value by the power-supply current spectrum as the target impedance spectrum.

10. The power integrity analysis method using a power integrity analyzer according to claim 7 ,

wherein the allowable power-supply voltage fluctuation value is an allowable power-supply voltage variation spectrum, and

said method further comprising:

calculating a voltage value of each frequency in the allowable power-supply voltage variation spectrum divided by a current value of each frequency in the allowable power-supply current spectrum; and

calculating the result as an impedance value of the corresponding each frequency in the target impedance spectrum, when calculating the target impedance spectrum.

11. The power integrity analysis method using a power integrity analyzer according to claim 7 ,

wherein the output unit is a display unit, and

said method further comprising:

based on circuit information of a circuit included in the element, analyzing the circuit, and calculating impedance characteristics of the circuit; and

causing the impedance characteristics and the target impedance to be displayed by the display unit.

12. A non-transitory recording medium recording a program having the computer to implement, wherein it is a program having the computer to implement:

an input process that inputs a parameter to a power-supply current waveform which indicates variation of a power-supply current value on a time axis of an element from an input unit;

a conversion process that converts the power-supply current waveform which indicates a variation of the power-supply current value on the time axis determined by the parameter to a power-supply current spectrum which indicates a variation of the power-supply current value on a frequency axis;

a storage process that stores an allowable power-supply voltage fluctuation value of the element in a storage unit in advance; and

a calculation process that calculates a target impedance spectrum of the element which indicates the variation of impedance value on the frequency axis based on the power-supply current spectrum and the allowable power-supply voltage fluctuation value, wherein the input process includes:

a waveform display process that displays the predetermined current waveform which indicates a variation of the power-supply current value on the time axis, on an operation entry screen;

a maximal current value designation process that inputs a maximal value of the power-supply current of the current waveform as the parameter, from the operation entry screen;

a current value variation time designation process that inputs a variation time necessary for a variation from a steady-state value of the power-supply current of the current waveform to the maximal value, from the operation entry screen; and

a periodic designation process that inputs cycle corresponding to an operation clock of the element as the parameter, from the operation entry screen.

13. The non-transitory medium according to claim 12 , wherein in the input process:

a plurality of the maximal value of the power-supply current is inputted when having the maximal current value designation process, as well as the variation time corresponding to the maximal values is inputted when having the power-supply current value variation time designation process; and

the program has a computer to implement a time relation designation process that inputs the relation of an occurrence time among a plurality of the maximal value of the power-supply current in the current waveform, from the operation entry screen.

14. The non-transitory medium according to claim 12 , wherein

the result of the allowable power-supply voltage fluctuation value divided by the power-supply current spectrum is calculated as the target impedance spectrum in the calculation process.

15. The non-transitory medium according to claim 12 , wherein the allowable power-supply voltage fluctuation value is an allowable power-supply voltage fluctuation spectrum; and

in the calculation process, the result of dividing with a current value of each frequency corresponding to in the power-supply current spectrum, calculates a voltage value of each frequency in the allowable power-supply voltage variation spectrum as an impedance value of the corresponding each frequency in the target impedance spectrum.

16. The non-transitory medium according to claim 12 , wherein the output unit is a display unit; and the program have a computer to implement;

an analysis process that based on circuit information of a circuit including the element analyzes the circuit, and calculates impedance characteristics of the circuit; and

a result display process that displays the impedance characteristics and the target impedance on the display unit.

Assignments (2)
MERGER AND CHANGE OF NAME Recorded Jun 26, 2017
From: NEC INFORMATEC SYSTEMS, LTD.; NEC SOFT, LTD.
To: NEC SOLUTION INNOVATORS, LTD.
Reel/Frame 042817/0787 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 12, 2010
From: YAGUCHI, TAKAHIRO
To: NEC INFORMATEC SYSTEMS, LTD.
Reel/Frame 024664/0284 →
Priority Claims (1)
JP 167667/2009 · Jul 16, 2009 · national
Continuity (1)
Related Publication 20110015883A1 · Jan 20, 2011